EMV® Terminal Level 1 Type Approval - PCD Timing Measurement Accuracy Evaluation Device Test Environment

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Legal Notice

This document is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. In the absence of such a written agreement, no product provider, test laboratory or any other third party should rely on this document, and EMVCo shall not be liable for any such reliance. No product provider, test laboratory or other third party may refer to a product, service or facility as EMVCo approved, in form or in substance, nor otherwise state or imply that EMVCo (or any agent of EMVCo) has in whole or part approved a product provider, test laboratory or other third party or its products, services, or facilities, except to the extent and subject to the terms, conditions and restrictions expressly set forth in a written agreement with EMVCo, or in an approval letter, compliance certificate or similar document issued by EMVCo. All other references to EMVCo approval are strictly prohibited by EMVCo. Under no circumstances should EMVCo approvals, when granted, be construed to imply any endorsement or warranty regarding the security, functionality, quality, or performance of any particular product or service, and no party shall state or imply anything to the contrary. EMVCo specifically disclaims any and all representations and warranties with respect to products that have received evaluations or approvals, and to the evaluation process generally, including, without limitation, any implied warranties of merchantability, fitness for purpose or non- infringement. All warranties, rights and remedies relating to products and services that have undergone evaluation by EMVCo are provided solely by the parties selling or otherwise providing such products or services, and not by EMVCo, and EMVCo will have no liability whatsoever in connection with such products and services. This document is provided "AS IS" without warranties of any kind, and EMVCo neither assumes nor accepts any liability for any errors or omissions contained in this document. EMVCO DISCLAIMS ALL REPRESENTATIONS AND WARRANTIES, EXPRESS OR IMPLIED, INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, TITLE AND NON - INFRINGEMENT, AS TO THIS DOCUMENT. EMVCo makes no representations or warranties with respect to intellectual property rights of any third parties in or in relation to this document. EMVCo undertakes no responsibility to determine whether any implementation of this document may violate, infringe, or otherwise exercise the patent, copyright, trademark, trade secret, know-how, or other intellectual property rights of third parties, and thus any person who implements any part of this document should consult an intellectual property attorney before any such implementation. Without limiting the foregoing, this document may provide for the use of public key encryption and other technology, which may be the subject matter of patents in several countries. Any party seeking to implement this document is solely responsible for determining whether its activities require a license to any such technology, including for patents on public key encryption technology. EMVCo shall not be liable under any theory for any party's infringement of any intellectual property rights in connection with this document. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

countries. Revision Log – 1.0a This is the first version of this document. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

countries. 1. 1. 1. 1.3. 1. 1. 1. 3. 3. 3. 4. 4. 4. 5. 5. 5. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. 1 Using this Manual 1.1

Purpose

This document describes the requirements the Device Test Environment developed by the Vendor has to comply with, in order to allow PCD Timing Measurement Accuracy Evaluation.

1.2 Audience This manual is provided to:

• PCD Vendors
• Testing laboratories recognized to perform the PCD Level 1 Type Approval tests 1.3 Reference Documents EMV documents are available on the EMVCo web site: www.emvco.com 1.3.1 Specification Documents Document Version Issue date EMV® Level 1 Specifications for Payment Systems ― EMV Contactless Interface Specification Latest Table 1: Specification Documents 1.4

Definitions

In addition of terms already defined in the reference documentation, the following terms are used in this document: Term Definition Device Test Environment Part of the Test Environment needed to perform the PCD Type Approval Test, which the Vendor needs to develop and submit to the Testing Laboratory at the same time as the Samples. FDT Frame Delay Time. Loopback Application Test application that the vendor needs to develop and implement in the Device Test Environment. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. Term Definition PCD Type Approval Acknowledgment by EMVCo that a specified PCD within a specified Contactless Product has demonstrated sufficient conformance to the EMV Contactless Interface Specification. PCD Under Test PCD embedded in the Sample that is actually tested during Type Approval Test. Implementation Under Test Sample that is actually tested during Type Approval Test. PCD Vendor Entity that submits the PCD for PCD Type Approval. Polling Sequence during which the PCD sends alternatively WUPA and WUPB commands until a response is received. êProximity Coupling Device (PCD) A hardware device that uses inductive coupling to provide power to the PICC and exchange data with the PICC. Proximity Integrated Circuit Card (PICC) A hardware device containing an integrated circuit and capable of inductive coupling in the proximity of a coupling device. Sample A physical implementation of a PICC or a PCD delivered to the Testing Laboratory for testing. Terminal Any device used to interact with a PICC and which operates to the requirements of the EMV Level 1 Specifications for Payment Systems ― EMV Contactless Interface Specification. This includes the PCD and may also include other components and interfaces. Test Environment Environment needed to perform the Test. It is constituted of a Test Bench in combination with a Device Test Environment for PCD Type Approval Test. Testing Laboratory A facility recognized by EMVCo for performing EMV Contactless Level 1 testing. Time Taken The time between the start of the first block containing the C-APDU and the end of the last block containing the R- APDU. Transaction A sequence of logic interactions that the PICC and the Terminal shall execute as foreseen by the EMV Contactless application. The transaction starts with the first logic message from the PCD to the PICC.

1.5 Terminology and Conventions The following words are used often in this specification and have a specific meaning: Shall Defines a product or system capability which is mandatory. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. May Defines a product or system capability which is optional or a statement which is informative only and is out of scope for this specification. Should Defines a product or system capability which is recommended.

1.6 Support For support regarding EMV Contactless PCD Timing Measurement Accuracy Evaluation, refer to www.emvco.com. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. 2

Introduction

EMVCo proposes to evaluate the accuracy of PCD timing measurement. To evaluate the accuracy of the implementation, the PCDs have to be tested in a determined Test Environment, as described in Figure 2-1 below as well as in the following sections of this document. Device Test Environment PCD Under Test (Implementation Under Test) Test Bench Tested Protocol= [EMV specifications] Exchange between Level 1 & Level 2 Figure 2-1—Schematic view of the Test Environment This Test Environment is composed of two parts:

• The Test Bench provided by the Test Laboratory. This Laboratory Test Environment allows control and observation of the tested signals and protocol.
• The Device Test Environment is provided by the vendor at the same time as the Samples. This Device Test Environment allows control of the commands and observation of the responses between the PCD and the Device Test Environment. As the interface between the application layer and the PCD depends on vendor’s choices for PCD design, the Device Test Environment has to be provided by the vendor. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a of 15 countries. 3 General Requirements for Device Test Environment The Device Test Environment shall comply with the following requirements:

3.1 Test Laboratory control of the Terminal Main Loop When the PCD Under Test is activated or powered up, the polling sequence may start directly depending on the design. Note: If such implementation is not available, the Device Test Environment shall allow the Test Laboratory to switch the PCD polling on, by commanding the polling function of the PCD. When the PCD starts polling, it initiates a Terminal Main Loop, compliant with EMV Contactless Interface Specification - Figure 9.1, reported below in Figure 3-1. POLL COLLISION DETECTION COLLISION ACTIVATE PICC PROCESS PICC REMOVE PICC RESET tRESET RESET tRESET WAIT tPAUSE YES NO Figure 3-1—Terminal Main Loop

• The Device Test Environment shall implement the PCD Timing Measurement Accuracy Evaluation Loopback Application that simulates the transaction processing situated at the application layer. Requirements for this test applications are further developed in sections 5 below.
• The Device Test Environment shall allow the Test Laboratory to select, start and stop the test application. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a of 15 countries.
• In the situation of a PCD implementing the optional polling for other technologies, the Device Test Environment shall allow the Test Laboratory to enable or disable this option.
• In the situation of a PCD implementing the optional suspend of the Operating Field during polling when no other technologies than type A and type B are supported, the Device Test Environment shall allow the Test Laboratory to enable or disable this option.
• In the situation of a PCD implementing both transaction completion procedures (removal and presence check procedures), the Device Test Environment shall allow the Test Laboratory to select the transaction completion procedure to be used for testing.
• Requirements for this PCD control are further detailed in section 4.1.
• Exception processing may involve the PCD Under Test reporting an error to the Device Test Environment. During the whole Terminal Main Loop, the Device Test Environment shall ignore the error notifications from the PCD Under Test.
• The Device Test Environment shall implement a user interface.
• The Device Test Environment shall be able to log, decode and interpret the protocol that is exchanged between the PCD and the Device Test Environment, and display the APDUs exchanged on the user interface (in order to validate the PCD receptivity).
• In any state of the Device Test Environment, if a screen is available on the Implementation Under Test, it shall be turned on (i.e. activated and readable).

3.2 Device Test Environment structure and PCD integrity As stated in the PCD Type Approval administrative process, the PCD Under Test shall be identical to the one that will be sold. Therefore, the Device Test Environment structure shall not alter the PCD configuration, nor the interface between the PCD and the rest of the device (e.g. communication channel between PCD and Level 2, PCD power supply, etc.), compared to the ones that will exist in vendor’s marketed devices. This means that, regardless of the designed Device Test Environment structure, the hardware and software architecture of the Samples shall not be modified for the test. In particular, the test application shall be situated where the Level 2 will be situated once the device on the field, as described in Figure 3-2. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. Device Test Environment Sample=DUT Card Reader Terminal PCD Under Test Test Application Device Test Environment Sample=DUT Card Reader Terminal PCD Under Test Test Application Device Test Environment Sample=DUT Terminal PCD Under Test Test Application Other functionalities Other functionalities Other functionalities DUT= Fully Integrated Terminal DUT= Intelligent Card Reader DUT= Transparent Card Reader Figure 3-2—Examples of Device Test Environment structure Note: Ideally, the other functionalities of the Device Test Environment (commands, user interface, etc.) are integrated in a single Test Environment, running on a computer. However, any other Device Test Environment structure that may be integrated to the product itself is accepted, as long as the PCD and the PCD interface (with the rest of the device) are not altered.

3.3 Device Test Environment Documentation The vendor shall supply clear instructions on how to install and operate the Device Test Environment. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. 4 Requirements for PCD controls 4.1 Control of PCD optional polling for other technologies The PCD is allowed to poll for other technologies than the EMV contactless Type A and B protocols (called ‘optional polling for other technologies’). However, some of the tests require disabling this option. On the condition that the PCD Under Test supports other technologies, the Device Test Environment shall implement a command to access a PCD function that disables/enables the polling for other technologies. PCD function (Conditional) PCD Function description Other Technologies Enable/Disable The PCD enables or disables the polling for other technologies. ─ When the option is disabled, the PCD Under Test shall poll for Type A and B only (as defined in EMV Contactless Interface Specification section 9.2.1.3, 9.2.1.4 and 9.2.1.5) and shall not suspend the Operating Field before continuing with 9.2.1.3. ─ When the option is enabled, the PCD Under Test shall poll for Type A, Type B and also poll for the ‘other technologies’, i.e. the PCD shall poll as described in EMV Contactless Interface Specification sections 9.2.1.3, 9.2.1.4, 9.2.1.6 and 9.2.1.7 (with the PCD continuing with 9.2.1.3 after 9.2.1.7). Table 4-1—PCD function needed for testing

• Optional polling for other technologies 4.2 Control of PCD optional suspend in the polling loop The PCD is allowed to suspend the Operating Field (between 5 ms and 30 ms) in the polling loop when no other technologies than the EMV contactless Type A and Type B are supported. On the condition that the PCD Under Test does not supports other technologies and that the PCD Under Test supports an optional suspend, the Device Test Environment shall implement a command to access a PCD function that disables/enables the optional suspend in the polling loop. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a of 15 countries. PCD function (Conditional) PCD Function description Optional suspend Enable/Disable The PCD enables or disables the optional suspend in the polling loop. ─ When the option is disabled, the PCD Under Test shall poll for Type A and B only (as defined in EMV Contactless Interface Specification section 9.2.1.3, 9.2.1.4 and 9.2.1.5) and shall not suspend the Operating Field before continuing with 9.2.1.3. ─ When the option is enabled, the PCD Under Test shall poll for Type A and B only (as defined in EMV Contactless Interface Specification section 9.2.1.3, 9.2.1.4 and 9.2.1.5) and shall suspend the Operating Field before continuing with 9.2.1.3. Table 4-2—PCD function needed for testing
• Optional suspend in the polling loop EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a of 15 countries.

4.3 Control of PCD transaction completion procedure The PCD is allowed to implement both the presence check procedure and the removal procedure for transaction completion. On the condition that the PCD Under Test supports both transaction completion procedures, the Device Test Environment shall implement a command to access a PCD function that allows to select the one that will be used. PCD function (Conditional) PCD Function description Removal/”presence check” The PCD uses the removal or the presence check procedure for transaction completion. ─ When the PCD function is set to removal, the PCD Under Test shall execute the removal procedure (as defined in EMV Contactless Interface Specification section 9.5.1) when transaction completion is requested. ─ When the PCD function is set to “presence check”, the PCD Under Test shall execute the presence check procedure (as defined in EMV Contactless Interface Specification section 9.5.2) when transaction completion is requested. Table 4-3—PCD function needed for testing – Transaction completion procedure EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. 5 Requirements for PCD Timing Measurement Accuracy Evaluation Loopback Application 5.1 Testing Architecture Presentation For the PCD Timing Measurement Accuracy Evaluation, a card simulator is presented to the PCD Under Test. The card simulator stores a set of predefined responses (responses to the installation and transaction completion commands or blocks) for each test scenario. When the card simulator has been activated, it sends the responses of the set, one after the other, to the PCD. These responses are sent using defined parameters and timings (defined for each test scenario). Device Test Environment PCD Under Test (Implementation Under Test) Card Simulator TEST SCENARIO R-APDU (1) … R-APDU (n) R-APDU (n+1)... R-APDU (x) TEST SCENARIO R-APDU (1) … R-APDU (n) R-APDU (n+1)... R-APDU (x) TEST SCENARIO R-APDU (1) … R-APDU (n) R-APDU (n+1)... R-APDU (x) Tested Protocol= [EMV CL spec] Exchange between Level 1 & Level 2 Figure 5-1—Schematic View of the Test Environment Following the “PICC activation” step, the card simulator sends response blocks containing some test-specific R-APDUs to the PCD Under Test. The PCD Under Test transmits these R_APDUs to a test application, called the PCD Timing Measurement Accuracy Evaluation Loopback Application, which the vendor needs to implement in the Device Test Environment. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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5.2 Required PCD Timing Measurement Accuracy Evaluation Loopback Application Behavior YES YES NO NO NO Reception of R-APDU ? Send SELECT-PPSE Start Await R-APDU Send C-APDU with measured timing Check R-APDU second byte Request PCD to start transaction completion procedure Convert R-APDU into next C- APDU to be sent and send this new C-APDU Second byte equals ’70’? Second byte equals ’0A’? 1 2 3 4 YES 6a Stop Stop 6b Second byte equals ’EA’? Ensure timing measurement for next C-APDU/R-APDU exchange NO YES 6c 5 EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. Figure 5-2 — PCD Timing Measurement Accuracy Evaluation Loopback application behavior 1. Following the “PICC activation” step, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall become active. 2. The PCD Timing Measurement Accuracy Evaluation Loopback Application shall send the first C-APDU to the PCD Under test. The first C-APDU to be sent is a SELECT Proximity Payment System Environment (SELECT_PPSE) APDU (= ‘00A404000E’ + “2PAY.SYS.DDF01” + ‘00’). 3. The PCD Timing Measurement Accuracy Evaluation Loopback Application awaits the R-APDU: ➢ In the situation where the PCD Under Test reports a failure at the protocol level (protocol error or excess of transmission or time-out errors), the PCD Timing Measurement Accuracy Evaluation Loopback Application shall stop. ➢ In case of R-APDU reception, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall continue with the next step. 4. The PCD Timing Measurement Accuracy Evaluation Loopback Application checks the second byte of the R-APDU ➢ If the second byte of the R-APDU equals ‘70’, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall continue with step 6a. ➢ If the second byte of the R-APDU equals ‘0A’, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall continue with step 6b. ➢ If the second byte of the R-APDU equals ‘EA’, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall continue with step 6c. ➢ If the second byte of the R-APDU is different from ‘70’, ’0A’ or ‘EA’, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall continue with step 5. 5. The PCD Timing Measurement Accuracy Evaluation Loopback Application shall convert the R-APDU into a C-APDU by stripping the status word from the R-APDU and using the remaining byte string as C-APDU. The PCD Timing Measurement Accuracy Evaluation Loopback Application sends this new C-APDU to the PCD Under Test, the PCD Timing Measurement Accuracy Evaluation Loopback Application shall go back to step 3. 6a. The PCD Timing Measurement Accuracy Evaluation Loopback Application requests the PCD Under Test to invoke the transaction completion procedure as described in section 9.5 of EMV Contactless Interface Specification. 6b. The PCD Timing Measurement Accuracy Evaluation Loopback Application shall send as the next C-APDU: ➢ ’80 EA 00 00 04 01 UU UU UU 00’, with ’UU UU UU’ the FDT measured for the previous C-APDU/R-APDU exchange, expressed as a big-endian unsigned integer in μs, if the sixth byte of the last R-APDU equaled ’01’ ➢ ’80 EA 00 00 04 02 UU UU UU 00’, with ’UU UU UU’ the Time Taken measured for the previous C-APDU/R-APDU exchange, expressed as a big-endian unsigned integer in μs, if the sixth byte of the last R-APDU equaled ’02’ Then the PCD Timing Measurement Accuracy Evaluation Loopback Application shall go back to step 3. 6c. The PCD Timing Measurement Accuracy Evaluation Loopback Application shall ensure that the PCD Under Test will permit to provide the measured timing for the next C-APDU/R-APDU exchange, the measured timing being: ➢ the FDT if the ninth byte of the last R-APDU equaled ’01’ ➢ the Time Taken if the ninth byte of the last R-APDU equaled ’02’ EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. Then the PCD Timing Measurement Accuracy Evaluation Loopback Application shall go back to step 5.

5.3 PCD Timing Measurement Accuracy Evaluation Loopback Application Example Step Exchanges Size Comments 1 PCD 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) PICC 20 SELECT PPSE 2 PCD ’80 EA 00 00 04 00 00 00 01 00’ + '90 00' PICC 12 Response to SELECT PPSE 3 PCD ’80’ (CLA) + ’EA’ (INS) + ’00’ (P1) + ’00’ (P2) + ’04’ (Lc) + ’00 00 00 01’ + ’00’ (Le) PICC 10 ERRD Command 4 PCD ’80 0A 00 00 00 01 00 01 01 83 00 64’ + ’90 00’ PICC 14 ERRD Response 5 PCD ’80’ (CLA) + ’EA’ (INS) + ’00’ (P1) + ’00’ (P2) + ’04’ (Lc) + ’01 UU UU UU’ + ’00’ (Le) PICC 10 ERRD Command with FDT measured (’UU UU UU’) 6 PCD ‘00 70 02 04 00’ (EOT Command) + ‘90 00' PICC 7 End Of Test command Table 5-1— PCD Timing Measurement Accuracy Evaluation Loopback Application Example with FDT measured EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Device Test Environment v1.0a

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countries. *** End of Document ***