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EMV® Terminal Level 1 Type Approval - PCD Timing Measurement Accuracy Evaluation Test Cases

v1.0a Test Cases & Test Environments
Contactless Acceptance Device

countries. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases Version 1.0a July 2026 EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a Page i

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Legal Notice

This document is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. In the absence of such a written agreement, no product provider, test laboratory or any other third party should rely on this document, and EMVCo shall not be liable for any such reliance. No product provider, test laboratory or other third party may refer to a product, service or facility as EMVCo approved, in form or in substance, nor otherwise state or imply that EMVCo (or any agent of EMVCo) has in whole or part approved a product provider, test laboratory or other third party or its products, services, or facilities, except to the extent and subject to the terms, conditions and restrictions expressly set forth in a written agreement with EMVCo, or in an approval letter, compliance certificate or similar document issued by EMVCo. All other references to EMVCo approval are strictly prohibited by EMVCo. Under no circumstances should EMVCo approvals, when granted, be construed to imply any endorsement or warranty regarding the security, functionality, quality, or performance of any particular product or service, and no party shall state or imply anything to the contrary. EMVCo specifically disclaims any and all representations and warranties with respect to products that have received evaluations or approvals, and to the evaluation process generally, including, without limitation, any implied warranties of merchantability, fitness for purpose or non- infringement. All warranties, rights and remedies relating to products and services that have undergone evaluation by EMVCo are provided solely by the parties selling or otherwise providing such products or services, and not by EMVCo, and EMVCo will have no liability whatsoever in connection with such products and services. This document is provided "AS IS" without warranties of any kind, and EMVCo neither assumes nor accepts any liability for any errors or omissions contained in this document. EMVCO DISCLAIMS ALL REPRESENTATIONS AND WARRANTIES, EXPRESS OR IMPLIED, INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, TITLE AND NON -INFRINGEMENT, AS TO THIS DOCUMENT. EMVCo makes no representations or warranties with respect to intellectual property rights of any third parties in or in relation to this document. EMVCo undertakes no responsibility to determine whether any implementation of this document may violate, infringe, or otherwise exercise the patent, copyright, trademark, trade secret, know-how, or other intellectual property rights of third parties, and thus any person who implements any part of this document should consult an intellectual property attorney before any such implementation. Without limiting the foregoing, this document may provide for the use of public key encryption and other technology, which may be the subject matter of patents in several countries. Any party seeking to implement this document is solely responsible for determining whether its activities require a license to any such technology, including for patents on public key encryption technology. EMVCo shall not be liable under any theory for any party's infringement of any intellectual property rights in connection with this document. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a

countries. Revision Log – Version 1.0a This is the first version of this document. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a

countries. Contents 1. 1.1. 1.2. 1.3. 1.3.1. 1.3.2. 1.4. 2. 2.1. 2.2. 2.3. 2.4. 2.5. 2.6. 2.7. 2.8. 2.9. 2.10. 2.11. 2.12. 3. 3.1. Type A

  • PCD Timing Measurement Accuracy Evaluation testing [PA001. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a countries. Scenarios Scenario 1: Type A
  • PCD Timing Measurement Accuracy Evaluation testing – FDT (y=0) 16 Scenario 2: Type A
  • PCD Timing Measurement Accuracy Evaluation testing – Time Taken (y=1) ___________________________________________________________________ 16 EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a Page v countries. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a countries. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. 1. About this Document 1.1.

Introduction

The present document describes the detailed organization and requirements of the executable tests that will permit EMVCo to evaluate the accuracy of timing measurements by the PCD during Contactless Terminal Level 1 Type Approval Testing. The intended audience of this document includes product providers, test tool vendors, recognised test laboratories and auditors. Describing the executable tests and the associated procedures is necessary to ensure reproducibility of the test results, even across different test laboratories. 1.2.

Scope

For each individual executable test in this document, the following information is available:

  • The test number with the version of the Test Cases in which the Test Case was updated for the last time,
  • The objective of the test,
  • The related reference specification section(s) of the Test Case,
  • The conditions of the test,
  • The procedure of the test,
  • The acceptance criteria(s),
  • The expected results (optional),
  • The failure actions,
  • The scenario of the test presented as a flow chart. 1.3. Reference Documents EMV documents are available on the EMVCo web site: https://www.emvco.com/resources/ EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. 1.3.1. Specification Documents Document Version Issue date EMV® Level 1 Specifications for Payment Systems ― EMV Contactless Interface Specification Latest EMV® Contactless Terminal Level 1 Type Approval ― PCD Timing Measurement Accuracy Evaluation Device Test Environment 1.0a, July 2026 Table 1: Specification Documents 1.3.2. Laboratory Test Documents The test documents to be applied by EMVCo recognised laboratories when performing an EMV Contactless Terminal Type Approval Level 1 PCD Timing Measurement Accuracy Evaluation test session are listed in the following document:
  • EMVCo Type Approval
  • Contactless Terminal Level 1
  • Laboratories Documentation Check the last version of this document for any update of the test documents. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. 1.4. Acronyms and Abbreviations The following abbreviations and notations are used in this document: Abbreviation

Description

AFI Application Family Identifier, Type B ANTICOLLISION Collision detection command, Type A ATQA

Answer

To reQuest, Type A ATQB Answer To reQuest, Type B ATS Answer To Select, Type A ATTRIB Selection command, Type B BCC Check byte, Type A CID Card IDentifier CLn Cascade Level n, Type A CRC_A Cyclic Redundancy Check error detection code for Type A CRC_B Cyclic Redundancy Check error detection code for Type B CUT Card Under Test. When the Instance Under Test as defined in ISO 9646 is a EMVCo Proximity IC Card DUT Device Under Test EGT Extra Guard Time, Type B EoF End of Frame EoS End of Sequence etu Elementary time unit (= ‘bit duration’) FDT Frame Delay Time fc Carrier frequency FSC Frame Size for proximity Card FSCI Frame Size for proximity Card Integer FSD Frame Size for proximity coupling Device FSDI Frame Size for proximity coupling Device Integer FWI Frame Waiting time Integer FWT Frame Waiting Time HLTA Halt Command, Type A INF INFormation field ISO International Organization for Standardization LT Lower Tester. MSB Most Significant Bit NAD Node ADdress EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a

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countries. Abbreviation Description PCD Proximity Coupling Device (reader) PICC Proximity IC Card PUT PCD Under Test. When the Instance Under Test as defined in ISO 9646 is an EMV Contactless Proximity Coupling Device (reader) RATS Request for Answer To Select SAK Select AcKnowledge, Type A SELECT SELECTion command, Type A SFGT Minimum Frame Delay Time after ATS (for Type A) or ATTRIB Response (for Type B) SoF Start of Frame SoS Start of Sequence Time Taken The time between the start of the first block containing the C-APDU and the end of the last block containing the R-APDU. UID Unique IDentifier, Type A WUPA Wake UP command, Type A WUPB Wake UP command, Type B Table 2: List of Abbreviations EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a

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countries. 2. Generic Information about the Tests 2.1. Default Environmental Test Conditions The following environmental conditions shall be used for all the tests described in the present document:

  • The Test Tool Antenna shall be placed in the EMV Contactless operating volume of the PCD under Test (as defined in section “Operating Volume” of the EMV Contactless specification) so that the transaction can be performed correctly (some manual positioning should be performed to obtain the best test results).
  • The external perturbations shall be suppressed: no metal objects or other perturbing elements in a volume of 30 centimeters around the Test System and no other antennas (contactless terminals, cell phones …) in a volume of 1 meter around the Test System. 2.2. Default Protocol Test Conditions Unless specified in the test description (i.e. for exception processing tests), the blocks sent by the LT shall never contain a CID or a NAD field as it is not supported by an EMV Contactless terminal. Unless specified in the test description (i.e. to perform a PICC Reset), the PUT shall never stop sending the carrier during an EMV Contactless transaction. Unless specified in the test description, the LT shall apply the default EMV Contactless timings and the default EMV Contactless parameter values (as defined in the present section). Unless specified in the test description, the polling for other technologies shall be deactivated in the Device Test Environment. Unless specified in the test description, the optional suspend shall be deactivated in the Device Test Environment. 2.3. Test Tool Requirements When, for Type Approval, a Test Tool is used as a LT, the following requirements should be applied:
  • Any executed subcase shall generate traces, logs and a test report.
  • The generation of traces, logs and test reports shall indicate whether the acceptance criterias have been met. All acceptance criterias and related values shall be visible in the traces, logs or test reports (e.g. for a timing measurement, the timing measured by the Test Tool shall be present, so shall be the tolerance used by the Test Tool and the expected value or expected range of values for this timing).
  • Any applied timing shall be visible in the traces, logs or test reports.
  • All the commands and APDUs sent by the PCD Under Test shall be checked, e.g. all the data bytes included in the I-Blocks (chained or not chained) sent by the PUT shall be checked.
  • All the frames sent by the PUT shall be checked. It means that the Test Tool shall check that: EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries.
  • Regarding the Type A frames: the presence of Start of Frame (SoF), parity bits, End of Frame (EoF) and the two CRC bytes when expected.
  • Regarding the type B frames: the presence of Start of Sequence (SoS), End of Sequence (EoS), a start bit (Logic “0”) followed by 8 data bits and a stop bit (Logic “1”) and the two CRC bytes when expected.
  • The value of the two CRC bytes is correct, when expected. 2.4. Default Timings For the time parameters given below, when a test description does not indicate a specific value which has to be used to perform the test, then the default time value shall be used by the Lower Tester to send sequences (i.e. the LT shall reply to the PUT with delays equal to the default value). The concerned parameters and their default values are as follows: In Type A:
  • After WUPA, ANTICOLLISION and SELECT commands:
  • FDTA,PICC = (1152 x 1/fc + 20/fc) [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b
  • FDTA,PICC = (1152 x 1/fc + 84/fc) [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b
  • After all other commands and after all Blocks:
  • FDTA,PICC = (3200 x 1/fc + 20/fc) [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b
  • FDTA,PICC = (3200 x 1/fc + 84/fc) [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b In Type B:
  • FDTB,PICC = 3840 x 1/fc after all commands and all Blocks (TR0 = 1920 x 1/fc with no subcarrier generated by the LT and TR1 = 1920 x 1/fc with subcarrier with no phase transition generated by the LT)
  • EGTPICC = 128/fc between two consecutive characters within any sequence.
  • Start of Sequence (SoS) = 1344 x 1/fc of logical state low (i.e. a subcarrier phase transition followed by the subcarrier with phase φ0+180°) followed by 320 x 1/fc of logical state high (i.e. a subcarrier phase transition followed by the subcarrier with phase φ0)
  • End of Sequence (EoS) = 1344 x 1/fc of logical state low (i.e. a subcarrier phase transition followed by the subcarrier with phase φ0+180°) followed by a logical state transition (i.e. a subcarrier phase transition to phase φ0) and 136 x 1/fc with subcarrier on (then the LT turns the subcarrier off) Notation: in the EMV Contactless specification, the Frame Delay Time (FDT) is defined as the delay between the end of a sequence sent by the PUT and the beginning of a sequence sent by the LT. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. 2.5. Definitions for Sequences Timings Application and Measurement When a Test Case asks for the measurement or the application of a delay between two consecutive sequences sent in the same direction or in opposite directions, the delay shall be measured or applied using the following definitions:
  • Beginning of a sequence sent by a Type A PICC: the start (i.e. the first modulation transmitted) of the Start of Frame (SoF) of the PICC sequence.
  • Beginning of a sequence sent by a Type A PCD: the start of the lower level within the Start of Frame (SoF) of the PCD sequence.
  • Beginning of a sequence sent by a Type B PICC: the start of the Start of Sequence (SoS) of the PICC sequence.
  • Beginning of a sequence sent by Type B PCD: the start of the Start of Sequence (SoS) of the PCD sequence.
  • End of a sequence sent by a Type A PICC: the last modulation transmitted in the PICC sequence.
  • End of the modulation of a block sent by a Type A PICC: the last modulation transmitted in the PICC sequence.
  • End of a sequence sent by a Type A PCD: the rising edge of the last lower level of the PCD sequence (within the last data bit sent by the PCD if this last data bit is a Logic “1” or within the End of Frame if the last data bit sent by the PCD is a Logic “0”).
  • End of a sequence sent by a Type B PICC: the start of the End of Sequence (EoS) of the PICC sequence.
  • End of the modulation of a block sent by a Type B PICC: the end of the last modulation of a block, i.e. the end of the EoS if the PICC does not maintain the subcarrier ON after the EoS or the end of the last subcarrier modulation if the PICC does maintain the subcarrier ON after the EoS
  • End of a sequence sent by a Type B PCD: the end of the End of Sequence (EoS) of the PCD sequence. 2.6. SCENARIO Notations during Half-Duplex Protocol Notation Description I(0)x [‘HH … HH’] Not chained I-Block or last I-Block of a chain with block number x and containing the hexadecimal data bytes ‘HH … HH’ (i.e. transmitted APDUs) I(1)x [‘HH … HH’] Chained I-Block (except the last I-Block of a chain) with block number x and containing the hexadecimal data bytes ‘HH … HH’ (i.e. transmitted APDUs) R(ACK)x R-Block indicating a positive acknowledgment with block number x R(NAK)x R-Block indicating a negative acknowledgment with block number x S(…) S-Block EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. 2.7. Types of Frames in the Scenarios In the present document, when describing the EMV Contactless transactions within the test scenarios, the following rules apply: In Type A tests, if nothing is indicated, the bytes are transported within a Type A standard frame with the 2 bytes of CRC_A (i.e. a valid CRC_A is automatically added after the bytes by the Test Tool). In Type A tests, if “(short frame)” is indicated, the bytes are transported within a Type A short frame. In Type A tests, if “(no CRC_A)” is indicated, the bytes are transported within a Type A standard frame with no CRC_A bytes. In Type A tests, if “(Type B frame)” is indicated, the bytes are transported within a Type B frame with 2 bytes of CRC_B (i.e. a valid CRC_B is automatically added after the bytes by the Test Tool). In Type B tests, if nothing is indicated, the bytes are transported within Type B frames with 2 bytes of CRC_B (i.e. a valid CRC_B is automatically added after the bytes by the Test Tool). In Type B tests, if “(no CRC_B)” is indicated, the bytes are transported within a Type B frame with no CRC_B bytes (exception processing tests). In Type B tests, if “(Type A short frame)” is indicated, the bytes are transported within a Type A short frame (WUPA command sent during collision detection). 2.8. Notational Conventions The following notations apply: ‘00’ to ‘FF’ or “00…00” to “FF…FF”: hexadecimal values (sometimes the hexadecimal values are indicated between parenthesis and followed by a lower case “h”). (0)b or (“1001”)b: binary notation. Values expressed in binary form are followed by a lower case “b”. u: any value (e.g. byte A = (“1u11 0101”)b means that b7 of byte A can take any value). UID Size 1, 2 or 3: refers to the single, double or triple size Type A UID as defined in the EMV specification. 2.9. Test

References

The tests described in the following sections are referenced this way: Test codification: R - - - -. - - - a b c. d a: Frame Type:

  • A = Type A tests
  • B = Type B tests EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. b: Test Type:
  • 0 = Basic tests c: Test Number (within the Test Type):
  • From 00 to 99 d: Optional Subcase Reference xy:
  • From 0 to 99 e.g. RA001.01 represents the Subcase 01 of the Test number 01 within the tests concerning the basic PCD Timing Measurement Accuracy Evaluation in Type A. 2.10. Test Bench A Test Platform (on the PC) and a Protocol Contactless Card Simulator are used for conducting the tests (Lower Tester): Figure 1: Test Bench 2.11. Loop-Back application and End Of Test Command The Test Bench which is used to implement the EMV Contactless Terminal Type Approval tests is based on the use of the Loop-Back Application (and a function to disable the optional polling for other technologies than EMV Contactless Type A and B, if needed) in the terminal containing the PCD Under Test (Upper Tester). The PCD Under Test shall allow for the Loop-Back application to be used during the PCD Timing Measurement Accuracy Evaluation. This test application becomes active when the PCD Under Test reports to the Upper Tester that a (single) card is present. When it becomes active, it sends a defined first Command APDU and then any received Response APDU is derived into the next Command APDU. The Lower Tester can indicate that the PCD shall permit to assess the expected results timing for the next C-APDU/R-APDU exchange by sending an I-Block containing a R-APDU with a tag set to ’EA’ as the second byte of the R-APDU. Protocol Contactless Card Simulator PCD Under Test (PUT) Simulation antenna Loop-Back Application (+ other technologies disabled) Terminal Upper Tester Lower Tester PC running the Test Platform EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. The Lower Tester can indicate that the PCD Under Test shall transmit the wanted timing for the current C-APDU/R-APDU exchange, in the next C-APDU, by sending an I-Block containing a R-APDU with a tag set to ’0A’ as the second byte of the R-APDU. The Lower Tester can indicate the end of a test scenario to the PCD Under Test by sending an I-Block containing a specific command referred to as the End Of Test command. When the terminal receives this command, it shall immediately initiate the transaction completion procedure. The End Of Test command is a specific Response APDU sent by the Lower Tester within an I-Block (Response APDU with the INS field equal to ‘70’). In the scenarios of this document, whenever, there is a step: 1 PUT I(0)0 [‘‘EOT Command’’ + ‘90 00’] LT End Of Test command Table 3: End Of Test command step It shall be understood as: 1 PUT I(0)0 [‘00 70 04 04 00’ (EOT Command) + ‘90 00’] LT End Of Test command with transaction completion procedure Table 4: End Of Test command with transaction completion procedure step Indicating that the Lower Tester shall send an I-Block with an R-APDU containing ‘00 70 04 04 00’ (EOT Command) + ‘90 00’ i.e. an EOT Command requesting to the Loop-Back application to initiate the transaction completion Procedure (2nd byte of the R-APDU set to ‘70’). The Loop-Back application and the End of Test command are detailed in the ‘Device Test Environment’ vendor form provided by EMVCo. 2.12. Parameter Values This section defines the parameter values to be applied or observed during the PCD Timing Measurement Accuracy Evaluation unless identified in the test descriptions otherwise. The timing values in the table below are as given in the EMV Contactless specification and do not take the test margins induced by the tool inaccuracy into account. When a timing value is applied by the test tool (e.g. FDTA,PICC or FDTB,PICC), the test implementation should be as close as possible to the timing given in the table and the following rules shall be respected by the test tool:
  • In the case where a minimum timing value shall be supported by the PCD under test, the applied timing value shall never be lower than the specification value given in the table.
  • In the case where a maximum timing value shall be supported by the PCD under test, the applied timing value shall never be higher than the specification value given in the table. When a timing value is measured during a test, the tolerances of the test tool shall be used. The following is the maximum tolerance p accepted for a test tool:
  • If T is defined in ‘1/fc’ and T  12800 x 1/fc then p = 12.8 x 1/fc
  • If T is defined in ‘1/fc’ and 12800 < T  128000 x 1/fc then p = 64 x 1/fc
  • If T is defined in ‘1/fc’ and 128000 < T  1280000 x 1/fc then p = 128 x 1/fc
  • If T is defined in ‘1/fc’ and T > 1280000 x 1/fc then p = 0.001 * T
  • If T is defined in ‘ms’ then p = 0.001 * T (e.g. T = 10 ms => p = 10 µs) EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. Notation: T is the timing which shall be measured within a Test Case and p is the time precision needed for this Test Cases. Parameters common to Type A and Type B: Parameter name Parameter value Comments tP,MIN 5.1 ms tP,MAX 10.0 ms tRESET,MIN 5.1 ms tRESET,MAX 10.0 ms tSUSPEND, MIN 5.1 ms tSUSPEND, MAX 30 ms tMIN,RETRANSMISSION 3.0 ms tRETRANSMISSION 10.0 ms tRESETDELAY 33.0 ms tRECOVERY 1280/fc TPCD 16.4 ms FWT+FWT n x 128/fc = (4096 x 2 FWI + 49152) x 1/fc Detailed in the test description (FWT+FWT)DEFAULT 114688 x 1/fc Corresponding to the basic installation: FWI = 4 FWTMAX 67108864 x 1/fc Corresponds to FWIMAX = 14 FSC n bytes Detailed in the test description FSD 256 bytes Table 5: Parameter values Common Type A and Type B Parameters specific to Type A: Parameter name Parameter value Comments FDTA,PICC,ANTICOLLISION and FDTA,PICC,MIN 9 x 128/fc + 20/fc [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b 9 x 128/fc + 84/fc [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b FDTA,PICC,MAX n x 128/fc + 20/fc [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b n x 128/fc + 84/fc [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b (n+1) x 128/fc = FWT+FWT Detailed in the test description EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. Parameter name Parameter value Comments FDTA,PICC,ACTIV,MAX 559 x 128/fc + 20/fc [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b 559 x 128/fc + 84/fc [-1/fc; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b FDTA,PCD,MIN 6780 x 1/fc FWTACTIVATION 71680 x 1/fc (SFGT+SFGT) [(256 x 16/fc) x 2 SFGI ] + [384/fc x 2 SFGI ] SFGI ≤ SFGIMAX = 14 Detailed in the test description Table 6: Parameter values Specific Type A Parameters specific to Type B: Parameter name Parameter value Comments TR0MIN 1008 x 1/fc With no subcarrier generated by the LT TR0MAX,ATQB 6416 x 1/fc TR1MIN 1264 x 1/fc Subcarrier with no phase transition generated by the LT TR1PUTMIN Minimum value of TR1 supported by the PCD (specific to the PUT) Determined by performing the pre-test TB000 and used to initialize some subcases in the tests TB340 and TB435 TR1MAX 3216 x 1/fc Subcarrier with no phase transition generated by the LT FDTB,PICC,MIN 2272 x 1/fc = TR0MIN + TR1MIN = (1008 + 1264) x 1/fc FDTB,PICC,MAX n x 128/fc = FWT+FWT Detailed in the test description FWTATQB 7680 x 1/fc FDTB,PCD,MIN 6780 x 1/fc EGTPICC,MIN and EGTPCD,MIN 0 x 1/fc EGTPICC,MAX 272 x 1/fc EGTPCD,MAX 752 x 1/fc tPICC,S,1,MIN 1264 x 1/fc With subcarrier with phase φ0 +180° tPICC,S,1,MAX 1424 x 1/fc tPICC,S,2,MIN 240 x 1/fc With subcarrier with phase φ0 tPICC,S,2,MAX 400 x 1/fc tPICC,E,MIN 1264 x 1/fc With subcarrier with phase φ0 +180° tPICC,E,MAX 1424 x 1/fc tFSOFF,MIN 0 x 1/fc EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. Parameter name Parameter value Comments tFSOFF,MAX 272 x 1/fc With subcarrier with phase φ0 (optional) tPCD,S,1,MIN 1280 x 1/fc With carrier low (modulation applied) tPCD,S,1,MAX 1416 x 1/fc tPCD,S,2,MIN 248 x 1/fc With carrier high (no modulation applied) tPCD,S,2,MAX 392 x 1/fc tPCD,E,MIN 1280 x 1/fc With carrier low (modulation applied) tPCD,E,MAX 1416 x 1/fc Table 7: Parameter values Specific Type B EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. 3. Type A TEST CASES 3.1. Type A - PCD Timing Measurement Accuracy Evaluation testing [PA001.xy] Test codification: PA001 - Rev 1.0a Test objective: To ensure that the PCD permits to accurately assess different types of timing (FDT, Time Taken), for a C-APDU/R-APDU exchange in Type A. References Requirements: NA Conditions: The PCD permits to assess the FDT or the Time Taken for an exchange (see ICS). Respect of the Generic Information about the Tests (see section 2). The test starts (step 1 of the scenario) upon receipt of a WUPA command sent by the PUT during the polling procedure. The LT uses the Type A frame format and a bit rate of 106 kb/s. For each subcase x: - Run y=0 if the PCD supports FDT measurement (see ICS). - Run y=1 if the PCD supports Time Taken measurement (see ICS). Procedure: Run the following scenario. The LT sends the response to the ERRD command with the FDTTEMP as indicated in the table below. In this test, the following ATS and FDTTEMP shall be used: ATS FDTTEMP Time TakenTEMP TL T0 TA(1) TB(1) TC(1) T1…TK x=0 ‘05’ ‘72’ ‘80’ ‘70’ ‘02’ - (32984 ± 32) x 1/fc i.e. (2.43 ms) 5.0 ms x=1 ‘05’ ‘72’ ‘80’ ‘70’ ‘02’ - (100784 ± 32) x 1/fc i.e. (7.43 ms) 10.0 ms x=2 ‘05’ ‘72’ ‘80’ ‘70’ ‘02’ - (236384 ± 32) x 1/fc i.e. (17.43 ms) 20.0 ms For y=0: The LT takes the FDT timing ’UU UU UU’ expressed as a big-endian unsigned integer in μs from the command following the ERRD Response and calculates the accuracy as follows: calculated accuracy = FDT - FDTTEMP. EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. Note: Preferably, the LT measures the FDTTEMP (from end of last modulation of the command, to start of first modulation of the response) to calculate the accuracy. For y=1: The LT takes the Time Taken timing ’UU UU UU’ expressed as a big-endian unsigned integer in μs from the command following the ERRD Response and calculates the accuracy as follows: calculated accuracy = Time Taken - TimeTakenTEMP. Note: Preferably, the LT measures the TimeTakenTEMP (from start of first modulation of the command, to end of last modulation of the response) to calculate the accuracy. The LT assesses the accuracy range of the PCD as follows: - Less than 0.10 ms if -100 μs ⩽ calculated accuracy ⩽ 100 μs, - Less than 0.25 ms if -250 μs ⩽ calculated accuracy ⩽ 250 μs, - Less than 0.50 ms if -500 μs ⩽ calculated accuracy ⩽ 500 μs, - Less than 1.00 ms if -1000 μs ⩽ calculated accuracy ⩽ 1000 μs, - More than 1.00 ms otherwise. Acceptance criteria: Not applicable Expected results: For each subcase, the test tool reports: - The calculated accuracy, - The accuracy range Failure action: Not applicable. Scenario: Step Exchanges Comments 1 PUT ‘52’ (short frame) LT WUPA during polling 2 PUT ‘01 00’ (no CRC_A) LT ATQA 3 PUT ‘50 00’ LT HLTA 4 PUT ‘05 00 08’ (Type B frame) LT WUPB 5 PUT ‘52’ (short frame) LT WUPA 6 PUT ‘01 00’ (no CRC_A) LT ATQA 7 PUT ‘93 20’ (no CRC_A) LT ANTICOLLISION CL1 8 PUT ‘00 00 00 00’ + ‘00’ (no CRC_A) LT UID 9 PUT ‘93 70’ + ‘00 00 00 00’ + ‘00’ LT SEL1 + UID CL1 + BCC 10 PUT ‘20’ LT SAK 11 PUT ‘E0 U0’ with '8'  ’U’  'C' LT RATS 12 PUT ATS LT ATS 13 PUT I(0)0 [‘00 A4 04 00 0E’ + ‘‘2PAY.SYS.DDF01’’ + ‘00’] LT Select PPSE 14 PUT I(0)0 [’80 EA 00 00 04 00 00 00 01 00’ + ‘90 00’] LT 15 PUT I(0)1 [’80 EA 00 00 04 00 00 00 01 00’] LT ERRD Command EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. Step Exchanges Comments 16 PUT I(0)1 [’80 0A 00 00 00 01 00 01 01 83 00 64’ + ’90 00’] sent at FDTTEMP LT ERRD Response 17 PUT I(0)0 [’80 EA 00 00 04 01 UU UU UU 00’] LT ERRD Command with ’01 UU UU UU’ indicating FDT in μs 18 PUT I(0)0 [‘‘EOT Command’’ + ‘90 00’] LT End Of Test command Scenario 1: Type A - PCD Timing Measurement Accuracy Evaluation testing – FDT (y=0) Step Exchanges Comments 1 PUT ‘52’ (short frame) LT WUPA during polling 2 PUT ‘01 00’ (no CRC_A) LT ATQA 3 PUT ‘50 00’ LT HLTA 4 PUT ‘05 00 08’ (Type B frame) LT WUPB 5 PUT ‘52’ (short frame) LT WUPA 6 PUT ‘01 00’ (no CRC_A) LT ATQA 7 PUT ‘93 20’ (no CRC_A) LT ANTICOLLISION CL1 8 PUT ‘00 00 00 00’ + ‘00’ (no CRC_A) LT UID 9 PUT ‘93 70’ + ‘00 00 00 00’ + ‘00’ LT SEL1 + UID CL1 + BCC 10 PUT ‘20’ LT SAK 11 PUT ‘E0 U0’ with '8'  ’U’  'C' LT RATS 12 PUT ATS LT ATS 13 PUT I(0)0 [‘00 A4 04 00 0E’ + ‘‘2PAY.SYS.DDF01’’ + ‘00’] LT Select PPSE 14 PUT I(0)0 [’80 EA 00 00 04 00 00 00 02 00’ + ‘90 00’] LT 15 PUT I(0)1 [’80 EA 00 00 04 00 00 00 02 00’] LT ERRD Command 16 PUT I(0)1 [’80 0A 00 00 00 02 00 01 01 83 00 64’ + ’90 00’] sent at FDTTEMP LT ERRD Response 17 PUT I(0)0 [’80 EA 00 00 04 02 UU UU UU 00’] LT ERRD Command with ’02 UU UU UU’ indicating Time Taken in μs 18 PUT I(0)0 [‘‘EOT Command’’ + ‘90 00’] LT End Of Test command Scenario 2: Type A - PCD Timing Measurement Accuracy Evaluation testing – Time Taken (y=1) EMV® Contactless Terminal Level 1 Type Approval PCD Timing Measurement Accuracy Evaluation Test Cases v1.0a / 17 countries. *** END OF DOCUMENT ***