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EMV® Terminal Level 1 Type Approval – Device Test Environment

v3.2a.r Test Cases & Test Environments
Contactless Acceptance Device
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EMV® Contactless Terminal Level 1 Type Approval Device Test Environment Version 3.2a.r September 2025 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page i Legal Notice This document summarizes EMVCo’s present plans for evaluation services and related policies and is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. In the absence of such a written agreement, no product provider, test laboratory or any other third party should rely on this document, and EMVCo shall not be liable for any such reliance. No product provider, test laboratory or other third party may refer to a product, service or facility as EMVCo approved, in form or in substance, nor otherwise state or imply that EMVCo (or any agent of EMVCo) has in whole or part approved a product provider, test laboratory or other third party or its products, services, or facilities, except to the extent and subject to the terms, conditions and restrictions expressly set forth in a written agreement with EMVCo, or in an approval letter, compliance certificate or similar document issued by EMVCo. All other references to EMVCo approval are strictly prohibited by EMVCo. Under no circumstances should EMVCo approvals, when granted, be construed to imply any endorsement or warranty regarding the security, functionality, quality, or performance of any particular product or service, and no party shall state or imply anything to the contrary. EMVCo specifically disclaims any and all representations and warranties with respect to products that have received evaluations or approvals, and to the evaluation process generally, including, without limitation, any implied warranties of merchantability, fitness for purpose or non-infringement. All warranties, rights and remedies relating to products and services that have undergone evaluation by EMVCo are provided solely by the parties selling or otherwise providing such products or services, and not by EMVCo, and EMVCo will have no liability whatsoever in connection with such products and services. This document is provided "AS IS" without warranties of any kind, and EMVCo neither assumes nor accepts any liability for any errors or omissions contained in this document. EMVCO DISCLAIMS ALL REPRESENTATIONS AND WARRANTIES, EXPRESS OR IMPLIED, INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, TITLE AND NON-INFRINGEMENT, AS TO THIS DOCUMENT. EMVCo makes no representations or warranties with respect to intellectual property rights of any third parties in or in relation to this document. EMVCo undertakes no responsibility to determine whether any implementation of this document may violate, infringe, or otherwise exercise the patent, copyright, trademark, trade secret, know-how, or other intellectual property rights of third parties, and thus any person who implements any part of this document should consult an intellectual property attorney before any such implementation. Without limiting the foregoing, this document may provide for the use of public key encryption and other technology, which may be the subject matter of patents in several countries. Any party seeking to implement this document is solely responsible for determining whether its activities require a license to any such technology, including for patents on public key encryption technology. EMVCo shall not be liable under any theory for any party's infringement of any intellectual property rights in connection with this document. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page ii Revision Log – 3.2a.r The following changes have been made to the document since the publication of Version 3.2a. Some of the numbering and cross references in this version have been updated to reflect changes introduced by the published bulletins. The numbering of existing requirements did not change, unless explicitly stated otherwise. Changes based on Specification Updates: None Other editorial changes: Editorial updates. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page iii Contents 1 Using this Manual ........................................................................................................... 1 1.1 Purpose................................................................................................................... 1 1.2 Audience ................................................................................................................. 1 1.3 Reference Documents ............................................................................................ 1 1.3.1 Standards Documents ................................................................................. 1 1.3.2 Specification Documents ............................................................................. 1 1.4 Definitions ............................................................................................................... 2 1.5 Terminology and Conventions................................................................................. 3 1.6 Support ................................................................................................................... 3 2 Introduction..................................................................................................................... 4 3 General Requirements for Device Test Environment .................................................. 5 3.1 Test Laboratory control of the Terminal Main Loop ................................................. 5 3.2 Device Test Environment structure and PCD integrity............................................. 6 3.3 Device Test Environment Documentation ............................................................... 7 4 Requirements for PCD controls..................................................................................... 8 4.1 Control of PCD functions......................................................................................... 8 4.2 Control of PCD optional polling for other technologies ............................................ 9 4.3 Control of PCD optional suspend in the polling loop ............................................. 10 4.4 Control of PCD transaction completion procedure ................................................ 11 5 Requirements for Loopback Application .................................................................... 12 5.1 Testing Architecture Presentation ......................................................................... 12 5.2 Required Loopback Application Behavior.............................................................. 13 5.3 Loopback Application Code Example .................................................................... 14 6 Requirements for Transaction Send Application ....................................................... 16 6.1 Testing Architecture Presentation ......................................................................... 16 6.2 Required Transaction Send Application Behavior ................................................. 18 7 Requirements for Interoperability Testing Loopback ................................................ 20 7.1 Testing Architecture Presentation ......................................................................... 20 7.2 Required Interoperability Testing Loopback Application Behavior ......................... 21 7.3 Interoperability Testing Loopback Application Example ........................................ 23 8 Guidelines for user interface design ........................................................................... 24 8.1 PC interface expected for Analogue Test .............................................................. 24 8.2 PC interface expected for Digital Test ................................................................... 24 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page iv Figures Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 2-1—Schematic view of the Test Environment ........................................................... 4 3-1—Terminal Main Loop ........................................................................................... 5 3-2—Examples of Device Test Environment structure................................................ 7 5-1—Schematic View of the Test Environment......................................................... 12 5-2—Loopback application behavior......................................................................... 13 6-1—Schematic View of the Test Environment......................................................... 16 6-2—Transaction Send application behavior ............................................................ 18 7-1—Schematic View of the Test Environment......................................................... 20 7-2—Interoperability Testing Loopback Application behavior ................................... 21 8-1—TTA L1 – Analogue Menu ................................................................................ 24 8-2—TTA L1 – Digital Menu ..................................................................................... 24 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page v Tables Table 4-1—PCD functions needed for testing........................................................................ 9 Table 4-2—PCD function needed for testing - Optional polling for other technologies......... 10 Table 4-3—PCD function needed for testing - Optional suspend in the polling loop ............ 10 Table 4-4—PCD function needed for testing – Transaction completion procedure .............. 11 Table 6-1— Type A Transaction Send Application commands ............................................ 17 Table 6-2— Type B Transaction Send Application commands ............................................ 17 Table 7-1—Interoperability Testing Loopback Application Example .................................... 23 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 1 of 25 1 Using this Manual 1.1 Purpose This document describes the requirements the Device Test Environment developed by the Vendor has to comply with, in order to allow Contactless Terminal Level 1 Type Approval Testing. 1.2 Audience This manual is provided to: • PCD Vendors • Testing laboratories recognised to perform the Type Approval tests 1.3 Reference Documents EMV documents are available on the EMVCo web site: www.emvco.com 1.3.1 Standards Documents Document ISO/IEC 17025:2017 : General Requirements for the Competence of Calibration and Testing Laboratories ISO/IEC Guide 98-3:2008 (JCGM/WG1/100): Uncertainty of measurement ─ Part 3 ─ Guide to the expression of uncertainty in measurement (GUM 1995) Version Issue date 2017 2008 1.3.2 Specification Documents Notation EMV Level 1 Specifications for Payment Systems ― EMV Contactless Interface Specification EMV SB No. 282 PPS0 and PPS1 RFU Value Handling EMV SB No. 283 PCD Carrier Phase Drift EMV SB No. 300 PICC Presence Check Procedure EMV SB No. 303 Adding an Optional Suspend and a Mandatory Suspend in the Polling Loop Description Version 3.2, July 2022 First Edition March 2023 First Edition March 2023 First Edition June 2024 Second Edition May 2024 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Notation EMV Contactless Symbol Reproduction Requirements EMV Card and Terminal Type Approval Laboratory Recognition Requirements. IEEE Standard on transitions, Pulses and related Waveforms, IEEE Std 181-2011. Page 2 of 25 Description Version 2.0, October 2019 Version 2.6, December 2017 1.4 Definitions In addition of terms already defined in the reference documentation, the following terms are used in this document: Term Analogue Test Device Test Environment Implementation Conformance Statement (ICS) Loopback Application Loopback mode PCD Type Approval PCD Under Test PCD Vendor Polling Presentation Plane Proximity Coupling Device (PCD) Definition Set of tests that check the Radio Frequency characteristics of the hardware and software/firmware of the PCD against the EMV Contactless Interface Specification. Part of the Test Environment needed to perform the PCD Type Approval Test, which the Vendor needs to develop and submit to the Testing Laboratory at the same time as the Samples. Form completed by the Vendor identifying the PCD implementation and to be submitted to the Test Laboratory along with the Samples. Test application that the vendor needs to develop and implement in the Device Test Environment. Loopback involves cycling back information in a channel. Any data transmitted through such a channel is immediately received by the same channel. A device is in loopback mode after such a mode has been activated. Acknowledgment by EMVCo that a specified PCD within a specified Contactless Product has demonstrated sufficient conformance to the EMV Contactless Interface Specification. PCD embedded in the Sample that is actually tested during Type Approval Test. Entity that submits the PCD for PCD Type Approval. Sequence during which the PCD sends alternatively WUPA and WUPB commands until a response is received. The plane on the EMV – TEST PICC that faces the EMV – TEST PCD. A hardware device that uses inductive coupling to provide power to the PICC and exchange data with the PICC. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 3 of 25 Term Proximity Integrated Circuit Card (PICC) Sample Terminal Test Bench Test Environment Testing Laboratory Transaction Transaction Send Application Definition A hardware device containing an integrated circuit and capable of inductive coupling in the proximity of a coupling device. A physical implementation of a PICC or a PCD delivered to the Testing Laboratory for testing. Any device used to interact with a PICC and which operates to the requirements of the EMV Level 1 Specifications for Payment Systems ― EMV Contactless Interface Specification. This includes the PCD and may also include other components and interfaces. A specific test bench as described in the in the EMVCo Contactless Type Approval: PCD Analogue Test Bench and Test Case Requirements manual. Environment needed to perform the Test. It is constituted of a Test Bench in combination with a Device Test Environment for PCD Type Approval Test. A facility recognised by EMVCo for performing EMV Contactless testing of the analogue interface for PICCs and PCDs. A sequence of logic interactions that the PICC and the Terminal shall execute as foreseen by the EMV Contactless application. The transaction starts with the first logic message from the PCD to the PICC. Test application that the vendor needs to develop and to implement in the Device Test Environment. 1.5 Terminology and Conventions The following words are used often in this specification and have a specific meaning: Shall Defines a product or system capability which is mandatory. May Defines a product or system capability which is optional or a statement which is informative only and is out of scope for this specification. Should Defines a product or system capability which is recommended. 1.6 Support For support regarding EMV Contactless PCD testing, refer to www.emvco.com. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r 2 Introduction Page 4 of 25 EMVCo requires that the devices implementing EMV Specifications and submitted for PCD Type Approval are to be tested against the EMV Specifications. To test the compliance of the implementation to EMV Contactless Interface Specification the PCDs have to be tested in a determined Test Environment, as described in Figure 2-1 below as well as in the following sections of this document. Device Test Environment Exchange between Level1 & Level2 PCD Under Test (Implementation Under Test) Tested Protocol= [EMV specifications] Test Bench Figure 2-1—Schematic view of the Test Environment This Test Environment is composed of two parts: • The Test Bench provided by the Test Laboratory. This Laboratory Test Environment allows control and observation of the tested signals and protocol. • The Device Test Environment is provided by the vendor at the same time as the Samples. This Device Test Environment allows control of the commands and observation of the responses between the PCD and the Device Test Environment. As the interface between the application layer and the PCD depends on vendor’s choices for PCD design, the Device Test Environment has to be provided by the vendor. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r 3 General Requirements for Device Test Environment The Device Test Environment shall comply with the following requirements: Page 5 of 25 3.1 Test Laboratory control of the Terminal Main Loop When the PCD Under Test is activated or powered up, the polling sequence may start directly depending on the design. Note: If such implementation is not available, the Device Test Environment shall allow the Test Laboratory to switch the PCD polling on, by commanding the polling function of the PCD. When the PCD starts polling, it initiates a Terminal Main Loop, compliant with EMV Contactless Interface Specification - Figure 9.1, reported below in Figure 3-1. WAIT tPAUSE RESET tRESET POLL COLLISION DETECTION YES COLLISION NO ACTIVATE PICC PROCESS PICC REMOVE PICC RESET tRESET Figure 3-1—Terminal Main Loop • The Device Test Environment shall allow the Test Laboratory to control some steps and sequences of the Terminal Main Loop using PCD functions described EMV Contactless Interface Specification . Requirements for these PCD controls are further detailed in section 4.1. • The Device Test Environment shall implement three test applications ( the Loopback Application, the Transaction Send Application and the Interoperability Testing Loopback Application) that simulate the transaction processing situated © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 6 of 25 at the application layer. Requirements for these test applications are further developed in sections 5 ,6 and 7 below. • The Device Test Environment shall allow the Test Laboratory to select, start and stop the test applications. • In the situation of a PCD implementing the optional polling for other technologies, the Device Test Environment shall allow the Test Laboratory to enable or disable this option. • In the situation of a PCD implementing the optional suspend of the Operating Field during polling when no other technologies than type A and type B are supported, the Device Test Environment shall allow the Test Laboratory to enable or disable this option. • In the situation of a PCD implementing both transaction completion procedures (removal and presence check procedures), the Device Test Environment shall allow the Test Laboratory to select the transaction completion procedure to be used for testing. • Requirements for this PCD control are further detailed in section 4.2. • Exception processing may involve the PCD Under Test reporting an error to the Device Test Environment. During the whole Terminal Main Loop, the Device Test Environment shall ignore the error notifications from the PCD Under Test. • The Device Test Environment shall implement a user interface. • Guidelines for the user interface design are given in section 8. • The Device Test Environment shall be able to log, decode and interpret the protocol that is exchanged between the PCD and the Device Test Environment, and display the APDUs exchanged on the user interface (in order to validate the PCD receptivity). • In any state of the Device Test Environment, if a screen is available on the PCD Under Test, it shall be turned on (i.e. activated and readable). 3.2 Device Test Environment structure and PCD integrity As stated in the PCD Type Approval administrative process, the PCD Under Test shall be identical to the one that will be sold. Therefore, the Device Test Environment structure shall not alter the PCD configuration, nor the interface between the PCD and the rest of the device (e.g. communication channel between PCD and Level 2, PCD power supply, etc.), compared to the ones that will exist in vendor’s marketed devices. This means that, regardless of the designed Device Test Environment structure, the hardware and software architecture of the Samples shall not be modified for the test. In particular, the test application shall be situated where the Level 2 will be situated once the device on the field, as described in Figure 3-2. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Device Test Environment Other functionalities Sample=DUT Terminal Test Application PCD Under Test Device Test Environment Terminal Other functionalities Sample=DUT Card Reader Test Application PCD Under Test Page 7 of 25 Device Test Environment Other functionalities Terminal Test Application Sample=DUT Card Reader PCD Under Test DUT= Fully Integrated Terminal DUT= Intelligent Card Reader DUT= Transparent Card Reader Figure 3-2—Examples of Device Test Environment structure Note: Ideally, the other functionalities of the Device Test Environment (commands, user interface, etc.) are integrated in a single Test Environment, running on a computer. However, any other Device Test Environment structure that may be integrated to the product itself is accepted, as long as the PCD and the PCD interface (with the rest of the device) are not altered. 3.3 Device Test Environment Documentation The vendor shall supply clear instructions on how to install and operate the Device Test Environment. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r 4 Requirements for PCD controls Page 8 of 25 4.1 Control of PCD functions The Device Test Environment shall implement the commands that allow the Test Laboratory to set up the PCD in a specified manner, as shown in Table 4-1. With the exception of TRANSAC_A and TRANSAC_B, the Device Test Environment shall allow the Test Laboratory to command these functions in a one-shot mode or in an endless loop mode. In endless loop mode, the time between the end of the nth iteration and the start of the (n+1)th iteration shall be at least 5 ms. Note: The RF, Analogue and Digital parameters (for example VOV, t1, t2, t3, t4, mi, tR, tF, tP, tRESET, etc.) shall not vary from one function to another, they shall remain identical to those implemented into the Product that will be sold. PCD function Carrier Polling Reset Power-off WUPA WUPB PCD Function description The PCD emits an unmodulated carrier. The PCD polls. The PCD resets the operating field, in conformance with section 3.2.6 of EMV Contactless Interface Specification. Remark: This function requires the Carrier function to be activated first by the Test Laboratory. The PCD perform a power-off of the operating field, in conformance with section 3.2.9 of EMV Contactless Interface Specification. Remark: This function requires the Carrier function to be activated first by the Test Laboratory. The PCD sends WUPA command. Remark: This function requires the Carrier function to be activated first by the Test Laboratory. The PCD sends WUPB command. Remark: This function requires the Carrier function to be activated first by the Test Laboratory. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 9 of 25 PCD function RATS PCD Function description The PCD proceeds to the following consecutive steps: 1. Sends the commands of the collision detection procedure (section 9.3.2. of EMV Contactless Interface Specification) 2. Sends the commands of the activation procedure (section 9.4.1. of EMV Contactless Interface Specification) until sending RATS command. Remark: This function requires the Carrier function to be activated first by the test laboratory ATTRIB The PCD proceeds to the following consecutive steps: 1. Sends the commands of the collision detection procedure (section 9.3.3. of EMV Contactless Interface Specification) 2. Sends the commands of the activation procedure (section 9.4.2. of EMV Contactless Interface Specification) until sending ATTRIB command. Remark: This function requires the Carrier function to be activated first by the test laboratory TRANSAC_A The PCD sends a pre-defined Type A set of commands using fixed intervals between the commands. In this mode, the PCD does not care about any answer that the PICC may provide, these are ignored. TRANSAC_B The PCD sends a pre-defined Type B set of commands using fixed intervals between the commands. In this mode, the PCD does not care about any answer that the PICC may provide, these are ignored. Table 4-1—PCD functions needed for testing 4.2 Control of PCD optional polling for other technologies The PCD is allowed to poll for other technologies than the EMV contactless Type A and B protocols (called ‘optional polling for other technologies’). However, some of the tests performed to analyze the analogue and digital layers require disabling this option. On the condition that the PCD Under Test supports other technologies, the Device Test Environment shall implement a command to access a PCD function that disables/enables the polling for other technologies. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 10 of 25 PCD function (Conditional) PCD Function description Other Technologies Enable/Disable The PCD enables or disables the polling for other technologies. ─ When the option is disabled, the PCD Under Test shall poll for Type A and B only (as defined in EMV Contactless Interface Specification section 9.2.1.3, 9.2.1.4 and 9.2.1.5) and shall not suspend the Operating Field before continuing with 9.2.1.3. ─ When the option is enabled, the PCD Under Test shall poll for Type A, Type B and also poll for the ‘other technologies’, i.e. the PCD shall poll as described in EMV Contactless Interface Specification sections 9.2.1.3, 9.2.1.4, 9.2.1.6 and 9.2.1.7 (with the PCD continuing with 9.2.1.3 after 9.2.1.7). Table 4-2—PCD function needed for testing - Optional polling for other technologies 4.3 Control of PCD optional suspend in the polling loop The PCD is allowed to suspend the Operating Field (between 5 ms and 30 ms) in the polling loop when no other technologies than the EMV contactless Type A and Type B are supported. On the condition that the PCD Under Test does not supports other technologies and that the PCD Under Test supports an optional suspend, the Device Test Environment shall implement a command to access a PCD function that disables/enables the optional suspend in the polling loop. PCD function (Conditional) PCD Function description Optional suspend Enable/Disable The PCD enables or disables the optional suspend in the polling loop. ─ When the option is disabled, the PCD Under Test shall poll for Type A and B only (as defined in EMV Contactless Interface Specification section 9.2.1.3, 9.2.1.4 and 9.2.1.5) and shall not suspend the Operating Field before continuing with 9.2.1.3. ─ When the option is enabled, the PCD Under Test shall poll for Type A and B only (as defined in EMV Contactless Interface Specification section 9.2.1.3, 9.2.1.4 and 9.2.1.5) and shall suspend the Operating Field before continuing with 9.2.1.3. Table 4-3—PCD function needed for testing - Optional suspend in the polling loop © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 11 of 25 4.4 Control of PCD transaction completion procedure The PCD is allowed to implement both the presence check procedure and the removal procedure for transaction completion. On the condition that the PCD Under Test supports both transaction completion procedures, the Device Test Environment shall implement a command to access a PCD function that allows to select the one that will be used. PCD function (Conditional) Removal/”presence check” PCD Function description The PCD uses the removal or the presence check procedure for transaction completion. ─ When the PCD function is set to removal, the PCD Under Test shall execute the removal procedure (as defined in EMV Contactless Interface Specification section 9.5.1) when transaction completion is requested. ─ When the PCD function is set to “presence check”, the PCD Under Test shall execute the presence check procedure (as defined in EMV Contactless Interface Specification section 9.5.2) when transaction completion is requested. Table 4-4—PCD function needed for testing – Transaction completion procedure © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r 5 Requirements for Loopback Application Page 12 of 25 5.1 Testing Architecture Presentation For the Digital Test and part of the Analogue Test, a card simulator is presented to the PCD Under Test. The card simulator stores a set of predefined responses (responses to the installation and transaction completion commands or blocks) for each test scenario. When the card simulator has been activated, it sends the responses of the set, one after the other, to the PCD. These responses are sent using defined parameters and timings (defined for each test scenario). Device Test Environment Exchange between Level1 & Level2 PCD Under Test (Implementation Under Test) Tested Protocol= [EMV CL spec] Card Simulator TEST TESTTESSCT ENARIO SCENARIO SCENARIO R-APDU (1) R-ARP-DA…UPD(1U) (1) … … R-APDU (n) R-ARP-DARUP-AD(PnU)D(Un)(n+1) R-ARP-DA..UP. D(nU+(1n)+1) ... ... R-APDU (x) R-APDU (x) R-APDU (x) Figure 5-1—Schematic View of the Test Environment Following the “PICC activation” step, the card simulator sends response blocks containing some test-specific R-APDUs to the PCD Under Test. The PCD Under Test transmits these R_APDUs to a test application, called the Loopback Application, which the vendor needs to implement in the Device Test Environment. This Loopback Application converts each received R-APDU into the next C-APDU (by stripping the status words), and sends this C-APDU back to the card simulator via the PCD Under Test. The PCD Under Test exits the loopback application when receiving the EOT (End Of Test) Command from the card simulator. The EOT command that stops a test is an R-APDU whose second byte can take two different values: • ‘70’ when the Loopback Application shall trigger a transaction completion procedure. • ‘72’ when the Loopback Application shall trigger a Power-Off procedure. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r 5.2 Required Loopback Application Behavior 1 Start 2 Send SELECT-PPSE Page 13 of 25 3 Await R-APDU Reception NO of R-APDU? YES 4 Check R-APDU second byte Second byte NO equals ‘70’? YES stop Second byte NO ConCv-eArtPRD-UAPtoDbUeinsetontnext 5 equals ‘72’? And send this new C-APDU Request PCD to start 6a transaction completion procedure Request PCD to start 6b Power-Off procedure stop stop Figure 5-2—Loopback application behavior 1. Following the “PICC activation” step, the Loopback Application shall become active. 2. The Loopback Application shall send the first C-APDU to the PCD Under test. The first C-APDU to be sent is a SELECT Proximity Payment System Environment (SELECT_PPSE) APDU (= ‘00A404000E’ + “2PAY.SYS.DDF01” + ‘00’). 3. The Loopback Application awaits the R-APDU: ➢ In the situation where the PCD Under Test reports a failure at the protocol level (protocol error or excess of transmission or time-out errors), the Loopback Application shall stop. ➢ In case of R-APDU reception, the Loopback Application shall continue with the next step. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 14 of 25 4. The Loopback Application checks the second byte of the R-APDU ➢ If the second byte of the R-APDU equals ‘70’, the Loopback Application shall continue with step 6a. ➢ If the second byte of the R-APDU equals ‘72’, the Loopback Application shall continue with step 6b. ➢ If the second byte of the R-APDU is different from ‘70’ or ‘72’, the Loopback Application shall continue with step 5. 5. The Loopback Application shall convert the R-APDU into a C-APDU by stripping the status word from the R-APDU and using the remaining byte string as C-APDU. The Loopback Application sends this new C-APDU to the PCD Under Test, the Loopback Application shall go back to step 3. 6a. The Loopback Application requests the PCD Under Test to invoke the transaction completion procedure as described in section 9.5 of EMV Contactless Interface Specification . 6b. The Loopback Application requests the PCD Under Test to invoke the Power-Off procedure as described in section 9.5 of EMV Contactless Interface Specification . 5.3 Loopback Application Code Example Sub LoopBack() Dim EndofTest As Boolean Dim Command As String Dim Response As String EndofTest = False ‘ The first APDU sent is a SELECT Proximity Payment System Environment APDU Command = "00A404000E325041592E5359532E444446303100" ‘ Loop described While (Not EndofTest) ‘ The “IUT_SENDAPDU” is a function used to send an APDU (Command) to the LT and returns its R-APDU (Response) Response = IUT_SENDAPDU(Command) If mid$(Response, 3, 2)="70" Or mid$(Response, 3, 2)=’72’ Then ‘ If the second byte of the R-APDU is 70 or 72, the loop is stopped EndofTest = True Else ‘ The R-APDU without the Status Word will be used as the next C-APDU Command = left$(Response, len(Response)-4) End If Wend If mid$(Response, 3, 2)="70" Then ‘ The Loopback Application is ending and the transaction completion sequence starts Call IUT_COMPLETION © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Else ‘ The Loopback Application is ending and the Power-Off sequence starts Call IUT_POWEROFF End If End Sub Page 15 of 25 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 16 of 25 6 Requirements for Transaction Send Application 6.1 Testing Architecture Presentation For some parts of the Analogue Tests, the PCD Under Test shall send commands without waiting for any PICC answer. The signals forming these commands are analyzed by the Test Bench. Device Test Environment Exchange between Level1 & Level2 PCD Under Test (Implementation Under Test) PCD signals Test Bench with measurement equipment Figure 6-1—Schematic View of the Test Environment Following the activation of this mode, the PCD Under Test starts transmitting the commands defined below for the modulation type selected, with a 2 ms interval between the end of a command and the start of the next one. At the end of the commands list, the PCD Under Test pauses for 100 ms and then restarts sending all the commands from the first one. The commands that shall be sent for Type A mode transaction are as follows (CRC values are shown between parenthesis): Sequence 1 Command WUPA Code 52 Notes Type A short frame 2 HLTA 50 00 (57 CD) 3 WUPB 05 00 08 (39 73) Using Type B modulation 4 WUPA 52 Type A short frame 5 ANTICOLLISION 93 20 6 SELECT 93 70 27 E9 3B 11 E4 (53 46) © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Sequence 7 Command RATS 8 I-BLOCK 1 Code Notes E0 X0 (31 73) with '8' ≤ ’X’ ≤ 'C' 02 00 A4 04 00 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 00 (E0 42) 9 I-BLOCK 2 03 00 A4 04 00 0C 01 02 03 04 05 06 07 08 09 0A 0B 0C 00 (4D C9) Page 17 of 25 Table 6-1— Type A Transaction Send Application commands The commands that shall be sent for Type B mode transaction are as follows (CRC values are shown between parentheses): Sequence 1 Command WUPB Code 05 00 08 (39 73) Notes 2 WUPA 52 Type A short frame 3 WUPB 05 00 08 (39 73) 4 ATTRIB 5 I-BLOCK 1 1D 46 B5 C7 A0 00 0X 01 00 (69 B5) with '8' ≤ ’X’ ≤ 'C' 02 00 A4 04 00 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 00 (2A 2D) 6 I-BLOCK 2 03 00 A4 04 00 0C 01 02 03 04 05 06 07 08 09 0A 0B 0C 00 (AA 2B) Table 6-2— Type B Transaction Send Application commands © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 18 of 25 6.2 Required Transaction Send Application Behavior 1 Start 2 Set command counter n = 1 YES Type A NO requested ? Send nth command 3 Send nth command in Type A list in Type B list 4 n = n + 1 6 Wait 100 ms NO End of the list ? YES NO User stopped the application ? YES stop 5 Wait 2 ms Figure 6-2—Transaction Send application behavior 1. Following the selection of the needed modulation type by the User, the Transaction Send Application shall become active. 2. The Transaction Send Application shall set a command counter to 1, for example n=1. 3. The Transaction Send Application shall send the nth command of the concerned list to the PCD Under test. 4. When the PCD Under Test has sent this command, the Transaction Send Application shall increment the command counter by one unit. 5. The Transaction Send Application shall repeat steps 3 and 4 with each command in the list above. Between two commands, the Transaction Send Application shall wait 2 ms (two milliseconds). © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 19 of 25 6. When all the commands in the concerned list have been sent, the Transaction Send Application shall check if the User has stopped the application and terminate if so. 7. If not, the Transaction Send Application shall wait for 100 ms (hundred milliseconds). After this waiting time, the Transaction Send Application shall restart at step 2 above. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 20 of 25 7 Requirements for Interoperability Testing Loopback 7.1 Testing Architecture Presentation For the Interoperability test, a PICC is presented to the PCD Under Test. Figure 7-1—Schematic View of the Test Environment Following the “PICC activation” step, the PICC sends response blocks containing some testspecific R-APDUs to the PCD Under Test. The PCD Under Test transmits these R_APDUs to a test application, called the Interoperability Testing Loopback Application, which the vendor shall implement in the Device Test Environment. This Interoperability Testing Loopback Application converts each received R-APDU into the next C-APDU (by stripping the status words), and sends this C-APDU back to the PICC via the PCD Under Test. The PCD Under Test exits the Interoperability Testing Loopback Application when receiving the EOT (End Of Test) Command from the PICC. The EOT command that stops a test is an R-APDU whose second byte is ‘70’. The Interoperability Testing Loopback Application shall be capable to request to the PCD to generate two kinds of Indicators: • Success Indicator. • Error Indicator. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r These indicators can be: • Sound Indicators. • LED Indicators. • TTL Signals. The Success Indicator and Error Indicator shall be easily distinguishable. Page 21 of 25 7.2 Required Interoperability Testing Loopback Application Behavior Figure 7-2—Interoperability Testing Loopback Application behavior 1. Following the “PICC activation” step, the Interoperability Testing Loopback Application shall become active. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 22 of 25 2. The Interoperability Testing Loopback Application shall send the first C-APDU to the PCD Under test. The first C-APDU to be sent is a SELECT Proximity Payment System Environment (SELECT_PPSE) APDU (= ‘00A404000E’ + “2PAY.SYS.DDF01” + ‘00’). 3. The Interoperability Testing Loopback Application awaits the R-APDU: ➢ In the situation where the PCD Under Test reports a failure at the protocol level (protocol error or excess of transmission or time-out errors), the Interoperability Testing Loopback Application shall go to step 7. ➢ In case of R-APDU reception, the Interoperability Testing Loopback Application shall continue with the next step. 4. The Interoperability Testing Loopback Application checks the second byte of the RAPDU ➢ If the second byte of the R-APDU equals ‘70’, the Interoperability Testing Loopback Application shall continue with step 6. ➢ If the second byte of the R-APDU is different from ‘70’, the Interoperability Testing Loopback Application shall continue with step 5. 5. The Interoperability Testing Loopback Application shall convert the R-APDU into a CAPDU by stripping the status word from the R-APDU and using the remaining byte string as C-APDU. The Interoperability Testing Loopback Application sends this new C-APDU to the PCD Under Test, the Interoperability Testing Loopback Application shall go back to step 3. 6 The Interoperability Testing Loopback Application requests the PCD Under Test to generate a Success Indicator and to invoke the transaction completion procedure as described in section 9.5 of EMV Contactless Interface Specification. 7 The Interoperability Testing Loopback Application requests the PCD Under Test to generate an Error Indicator and to invoke the transaction completion procedure as described in section 9.5 of EMV Contactless Interface Specification. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 23 of 25 7.3 Interoperability Testing Loopback Application Example Step 1 PCD 2 PCD 3 PCD 4 PCD 5 PCD 6 PCD 7 PCD 8 PCD 9 PCD 10 PCD Exchanges 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 00 (CLA) + B2 (INS) + 01 (P1) + 0C (P2) + absent (Lc) + absent + 00h (Le) + '90 00' 00 (CLA) + B2 (INS) + 01 (P1) + 0C (P2) + absent (Lc) + absent + 00h (Le) 00 (CLA) + 04 (INS) + 04 (P1) + 00 (P2) + F8 (Lc) + 01 02 … F8 + 00h (Le) + '90 00' 00 (CLA) + 04 (INS) + 04 (P1) + 00 (P2) + F8 (Lc) + 01 02 … F8 + 00h (Le) 80 (CLA) + A8 (INS) + 00 (P1) + 00 (P2) + 04 (Lc) + FF FE 00 64 + 00h (Le) + '90 00' 80 (CLA) + A8 (INS) + 00 (P1) + 00 (P2) + 04 (Lc) + FF FE 00 64 + 00h (Le) 00 (CLA) + B2 (INS) + 02 (P1) + 0C (P2) + absent (Lc) + absent + 00h (Le) + '90 00' 00 (CLA) + B2 (INS) + 02 (P1) + 0C (P2) + absent (Lc) + absent + 00h (Le) ‘00 70 02 04 00’ (EOT Command) + ‘90 00' PICC PICC PICC PICC PICC PICC PICC PICC PICC PICC Size 20 7 5 256 254 12 10 7 5 7 Comments SELECT PPSE Response to SELECT PPSE READ Record SFI 1 Rec 1 INS 4 command GPO Command Response to GPO READ Record SFI 1 Rec 2 Table 7-1—Interoperability Testing Loopback Application Example © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r 8 Guidelines for user interface design Page 24 of 25 8.1 PC interface expected for Analogue Test Figure 8-1—TTA L1 – Analogue Menu 8.2 PC interface expected for Digital Test Figure 8-2—TTA L1 – Digital Menu © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Device Test Environment v3.2a.r Page 25 of 25 *** End of Document *** © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries.