EMV® Terminal Level 1 Type Approval – PCD Digital Test Cases

EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases Version 3.2a.r September 2025 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page i Legal Notice This document summarizes EMVCo’s present plans for evaluation services and related policies and is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. 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EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page ii Revision Log – Version 3.2a.r The following changes have been made to the document since the publication of Version 3.2a. Some of the numbering and cross references in this version have been updated to reflect changes introduced by the published bulletins. The numbering of existing requirements did not change, unless explicitly stated otherwise. Changes based on Specification Updates: Other changes (test coverage, test clarification, editorial correction): • Editorial updates © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page iii Contents 1. About this Document .................................................................................................... 1 1.1. Introduction ............................................................................................................ 1 1.2. Scope .................................................................................................................... 1 1.3. Reference Documents ........................................................................................... 1 1.3.1. Specification Documents ............................................................................ 2 1.3.2. Laboratory Test Documents........................................................................ 2 1.4. Acronyms and Abbreviations.................................................................................. 3 2. Generic Information about the Tests............................................................................ 6 2.1. Default Environmental Test Conditions .................................................................. 6 2.2. Default Protocol Test Conditions ............................................................................ 6 2.3. Test Tool Requirements ......................................................................................... 6 2.4. Default Timings ...................................................................................................... 7 2.5. Definitions for Sequences Timings Application and Measurement ......................... 8 2.6. Scenario Notations during Half-Duplex Protocol..................................................... 8 2.7. Types of Frames in the Scenarios.......................................................................... 9 2.8. Notational Conventions .......................................................................................... 9 2.9. Test References..................................................................................................... 9 2.10. Test Bench........................................................................................................... 10 2.11. Loop-Back application and End Of Test Command .............................................. 10 2.12. Parameter Values ................................................................................................ 11 3. POLLING TEST CASES ............................................................................................... 15 3.1. Polling Observation and Timings Verification [TC001] .......................................... 15 3.2. Polling Loop for PCD that supports Other Technologies [TC002] ......................... 17 3.3. Polling Loop for PCD that supports optional suspend [TC003] ............................. 19 4. Type A TEST CASES ................................................................................................... 21 4.1. Basic Type A Exchange (single size UID) and timings measurement [TA001] ..... 21 4.2. Type A Correct Removal [TA002]......................................................................... 25 4.3. Basic Type A Exchange with the minimum and the default maximum Frame Delay Time PCD→PICC [TA003.x] ..................................................................... 28 4.4. Type A Correct Presence Check [TA004.x] .......................................................... 31 4.5. Type A Installation with double and triple UID size [TA101.x] ............................... 35 4.6. Type A Installation with supported values of ATQA [TA102.x] .............................. 38 4.7. Type A Installation with supported values of SAK and of the TA(1) byte of the ATS [TA103.x]..................................................................................................... 43 4.8. Type A Installation with supported values of the TL byte (and historical bytes) of the ATS [TA104.xy] ......................................................................................... 47 4.9. Type A Installation with supported values of SFGI in the TB(1) byte of the ATS [TA105.xy] ................................................................................................... 50 4.10. Type A Installation with supported values of the TC(1) byte of the ATS [TA106.x] ............................................................................................................ 53 4.11. Type A Installation with Type A frame answered to HLTA command [TA108] ...... 55 4.12. Type A Installation with different values of ATQA [TA110.x]................................. 57 4.13. Type A Installation with ‘noise’ after each PICC response [TA112.x].................... 59 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page iv 4.14. Type A Error free non-chained I-Blocks exchanges for all possible values of FWT [TA201.xy] .................................................................................................. 61 4.15. Type A Error free chained I-Blocks in both directions for different values of FSC [TA202.xy]................................................................................................... 64 4.16. Type A Error free chained I-Blocks transmission for FSC = 16 to 256 bytes [TA203.xy]........................................................................................................... 69 4.17. Type A Error free request for Frame Waiting Time Extension on non-chained I-Blocks [TA204.x] ............................................................................................... 90 4.18. Type A Error free request for Frame Waiting Time Extension during chaining in both directions [TA205.x]................................................................................. 94 4.19. Type A Error free chained I-Blocks in both directions with different values of FSD [TA206] ....................................................................................................... 97 4.20. Type A Error free chained I-Blocks reception with rare frame sizes [TA210] ........ 99 4.21. Type A Error free exchange with the minimum Frame Delay Time PCD→PICC for different values of the Frame Waiting Time [TA215.x].............. 102 4.22. Type A I-Blocks exchange and request for Frame Waiting Time Extension with ‘noise’ after each PICC response [TA216.x]............................................... 105 4.23. Type A Polling with an error after WUPA [TA301.xy].......................................... 107 4.24. Type A Collision detection with an error after ANTICOLLISION CL1 [TA302.xy]......................................................................................................... 109 4.25. Type A Polling with detection of a Type A then a Type B PICC [TA303]............. 111 4.26. Type A Collision detection with an error after WUPA [TA304.xy]........................ 113 4.27. Type A Collision detection with an error after SELECT CL1 [TA305.xy] ............. 115 4.28. Type A Activation with an error after RATS [TA306.xy] ...................................... 117 4.29. Type A Activation with ‘noise’ after RATS [TA307.x] .......................................... 120 4.30. Type A Collision detection with a time-out after ANTICOLLISION CL1 [TA310] . 123 4.31. Type A Collision detection with a time-out after WUPA [TA311.x] ...................... 125 4.32. Type A Collision detection with a time-out after SELECT CL1 [TA312] .............. 129 4.33. Type A Activation with a time-out after RATS [TA313] ....................................... 131 4.34. Type A Activation with respect of the EMD Suppression behavior after RATS [TA335.xy]......................................................................................................... 133 4.35. Type A Activation with respect of the ‘deaf time’ after RATS [TA340.x] .............. 136 4.36. Type A Error notification on an I-Block not indicating chaining [TA401.xy] ......... 138 4.37. Type A Time-out after an I-Block not indicating chaining [TA402]....................... 142 4.38. Type A Transmission error in response to an I-Block not indicating chaining [TA403.x] .......................................................................................................... 145 4.39. Type A Protocol error in response to an I-Block not indicating chaining [TA404.xy]......................................................................................................... 149 4.40. Type A Error notification on an I-Block indicating chaining [TA405.xy] ............... 152 4.41. Type A Time-out after an I-Block indicating chaining [TA406] ............................ 155 4.42. Type A Transmission error in response to an I-Block indicating chaining [TA407.x] .......................................................................................................... 158 4.43. Type A Protocol error in response to an I-Block indicating chaining [TA408.xy] . 161 4.44. Type A Time-out after an R(ACK) Block (i.e. error notification) [TA409.xy]......... 164 4.45. Type A Transmission error in response to an R(ACK) Block [TA410.x] .............. 167 4.46. Type A Protocol error in response to an R(ACK) Block [TA411.xy] .................... 171 4.47. Type A Single time-out after an S(WTX) Response Block (several values of WTXM) [TA412.xy]............................................................................................ 174 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page v 4.48. Type A Repeated use of a FWT Extension after a single S(WTX) Request [TA413] ............................................................................................................. 178 4.49. Type A ‘Noise’ in response to an I-Block not indicating chaining [TA414.x] ........ 181 4.50. Type A ‘Noise’ in response to an I-Block indicating chaining [TA415.x] .............. 184 4.51. Type A ‘Noise’ in response to an R(ACK) Block [TA416.x] ................................. 187 4.52. Type A Protocol error in response to an R(NAK)-Block sent to notify a transmission error [TA417.xy] ........................................................................... 190 4.53. Type A Presence Check with an error after R(NAK) [TA419.x]........................... 193 4.54. Type A Removal with an error after WUPA [TA420] ........................................... 196 4.55. Type A Consecutive time-outs after S(WTX) Response Blocks [TA421] ............ 199 4.56. Type A Block protocol with respect of the EMD suppression behavior [TA430.xy]......................................................................................................... 202 4.57. Type A Block Protocol with respect of the ‘deaf time’ [TA435.x] ......................... 206 4.58. Type A Parity error in the first 4 bytes of a sequence in response to an I-Block not indicating chaining [TA440] ......................................................................... 208 4.59. Type A Parity error in the first 4 bytes of a sequence in response to an I-Block indicating chaining [TA441] ............................................................................... 212 4.60. Type A Parity error in the first 4 bytes of a sequence in response to an R(ACK) Block [TA442] ...................................................................................... 215 4.61. Type A Parity error in the first 4 bytes of a sequence in response to an S(WTX) Response Block [TA443] ..................................................................... 219 5. Type B TEST CASES ................................................................................................. 223 5.1. Type B Pre-test to determine TR1PUTMIN [TB000] ................................................ 223 5.2. Basic Type B Exchange and timings measurement [TB001] .............................. 225 5.3. Basic Type B Exchange with supported SoS and EoS [TB002.x] ....................... 228 5.4. Type B Correct Removal [TB003]....................................................................... 231 5.5. Basic Type B Exchange with the minimum and the default maximum Frame Delay Time PCD→PICC [TB004.x] ................................................................... 233 5.6. Basic Type B Exchange with the minimum and the maximum character-tocharacter delay [TB006.x] ................................................................................. 236 5.7. Type B Correct Presence Check [TB007.x] ........................................................ 239 5.8. Type B Installation with supported values of ADC [TB101.x] .............................. 243 5.9. Type B Installation with supported values of FO [TB102.x]................................. 245 5.10. Type B Installation with supported values of Bit_Rate_Capability [TB104.x] ...... 247 5.11. Type B Installation with supported values of ADF [TB106.x] .............................. 249 5.12. Type B Installation with supported values of b4-b2 of Protocol_Type [TB107.x] .......................................................................................................... 251 5.13. Type B Installation with supported values of MBLI [TB108.x] ............................. 253 5.14. Type B Installation with different values of ATQB [TB110.x]............................... 255 5.15. Type B Error free non-chained I-Blocks exchanges for all possible values of FWT [TB201.xy] ................................................................................................ 258 5.16. Type B Error free chained I-Blocks in both directions for different values of FSC [TB202.xy]................................................................................................. 261 5.17. Type B Error free chained I-Blocks transmission for FSC = 16 to 256 bytes [TB203.xy]......................................................................................................... 266 5.18. Type B Error free request for Frame Waiting Time Extension on non-chained I-Blocks [TB204.x] ............................................................................................. 287 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page vi 5.19. Type B Error free request for Frame Waiting Time Extension during chaining in both directions [TB205.x]............................................................................... 291 5.20. Type B Error free chained I-Blocks in both directions with different values of FSD [TB206] ..................................................................................................... 294 5.21. Type B Error free chained I-Blocks reception with rare frame sizes [TB210] ...... 296 5.22. Type B Error free exchange with the minimum Frame Delay Time PCD→PICC for different values of the Frame Waiting Time [TB215.x].............. 299 5.23. Type B Polling with an error after WUPB [TB301.xy].......................................... 302 5.24. Type B Polling with detection of a Type B then a Type A PICC [TB303]............. 304 5.25. Type B Collision detection with an error after WUPB [TB304.xy]........................ 306 5.26. Type B Activation with ‘noise’ after ATTRIB [TB305.x] ....................................... 309 5.27. Type B Activation with an error after ATTRIB [TB306.xy] ................................... 312 5.28. Type B Collision detection with a time-out after WUPB [TB311.x] ...................... 314 5.29. Type B Activation with a time-out after ATTRIB [TB312.x].................................. 317 5.30. Type B Activation with respect of the EMD Suppression behavior after ATTRIB [TB335.xy] ........................................................................................... 319 5.31. Type B Activation with respect of the ‘deaf time’ after ATTRIB [TB340.x] ........... 322 5.32. Type B Error notification on an I-Block not indicating chaining [TB401.xy] ......... 325 5.33. Type B Time-out after an I-Block not indicating chaining [TB402]....................... 329 5.34. Type B Transmission error in response to an I-Block not indicating chaining [TB403.x] .......................................................................................................... 332 5.35. Type B Protocol error in response to an I-Block not indicating chaining [TB404.xy]......................................................................................................... 336 5.36. Type B Error notification on an I-Block indicating chaining [TB405.xy] ............... 339 5.37. Type B Time-out after an I-Block indicating chaining [TB406] ............................ 342 5.38. Type B Transmission error in response to an I-Block indicating chaining [TB407] ............................................................................................................. 344 5.39. Type B Protocol error in response to an I-Block indicating chaining [TB408.xy] . 347 5.40. Type B Time-out after an R(ACK) Block (i.e. error notification) [TB409.xy]......... 350 5.41. Type B Transmission error in response to an R(ACK) Block [TB410.x] .............. 353 5.42. Type B Protocol error in response to an R(ACK) Block [TB411.xy] .................... 357 5.43. Type B Single time-out after an S(WTX) Response Block (several values of WTXM) [TB412.xy]............................................................................................ 360 5.44. Type B Repeated use of a FWT extension after a single S(WTX) Request [TB413] ............................................................................................................. 364 5.45. Type B ‘Noise’ in response to an I-Block not indicating chaining [TB414.x] ........ 367 5.46. Type B ‘Noise’ in response to an I-Block indicating chaining [TB415.x] .............. 370 5.47. Type B ‘Noise’ in response to an R(ACK) Block [TB416.x] ................................. 373 5.48. Type B Protocol error in response to an R(NAK)-Block sent to notify a transmission error [TB417.xy] ........................................................................... 376 5.49. Type B Presence Check with an error after R(NAK) [TB419.x]........................... 379 5.50. Type B Removal with an error after WUPB [TB420] ........................................... 381 5.51. Type B Consecutive time-outs after S(WTX) Response Blocks [TB421] ............ 384 5.52. Type B Block protocol with respect of the EMD suppression behavior [TB430.xy]......................................................................................................... 387 5.53. Type B Block Protocol with respect of the ‘deaf time’ [TB435.x] ......................... 391 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page vii Scenarios Scenario 1: Polling Observation and Timings Verification __________________________ 16 Scenario 2: Polling Loop for PCD that supports Other Technologies__________________ 18 Scenario 3: Polling Loop for PCD that supports optional suspend____________________ 20 Scenario 4: Basic Type A Exchange (single size UID) and timings measurement _______ 23 Scenario 5: Type A Correct Removal __________________________________________ 27 Scenario 6: Basic Type A Exchange with the minimum and the default maximum Frame Delay Time PCD→PICC (x=0 and 1) __________________________________________ 30 Scenario 7: Type A Correct Presence Check (x=0) _______________________________ 33 Scenario 8: Type A Correct Presence Check (x=1) _______________________________ 34 Scenario 9: Basic Type A Installation (double UID size; x=0) _______________________ 36 Scenario 10: Basic Type A Installation (triple UID size; x=1) ________________________ 37 Scenario 11: Type A Installation with supported values of ATQA (x=0 to 5, 8 and 9) _____ 40 Scenario 12: Type A Installation with supported values of ATQA (x=6) ________________ 41 Scenario 13: Type A Installation with supported values of ATQA (x=7) ________________ 42 Scenario 14: Type A Installation with supported values of SAK and of the TA(1) byte of the ATS (x=0 to 3) ___________________________________________________________ 45 Scenario 15: Type A Installation with supported values of SAK (x=4 to 5) _____________ 46 Scenario 16: Type A Installation with supported values of the TL byte (and historical bytes) of the ATS (xy=00 to 21) _____________________________________________________ 49 Scenario 17: Type A Installation with supported values of SFGI in the TB(1) byte of the ATS (xy=00 to 16) ____________________________________________________________ 52 Scenario 18: Type A Installation with supported values of the TC(1) byte of the ATS (x=0 to 5) _____________________________________________________________________ 54 Scenario 19: Type A Installation with Type A frame answered to HLTA command _______ 56 Scenario 20: Type A installation with different values of ATQA (x=0 to 3) ______________ 58 Scenario 21: Type A Installation with ‘noise’ after each PICC response (x= 0 to 1) ______ 60 Scenario 22: Type A Error free non-chained I-Blocks exchanges for all possible values of FWT (xy=00 to 15) ________________________________________________________ 63 Scenario 23: Type A Error free chained I-Blocks in both directions for different values of FSC (x=1 to 7, y=0) ___________________________________________________________ 66 Scenario 24: Type A Error free chained I-Blocks in both directions for different values of FSC (x=1 to 7, y=1) ___________________________________________________________ 68 Scenario 25: Type A Error free chained I-Blocks transmission (FSC = 32 bytes; x=0 and 6, y=0) ___________________________________________________________________ 71 Scenario 26: Type A Error free chained I-Blocks transmission (FSC = 32 bytes; x=0 and 6, y=1) ___________________________________________________________________ 72 Scenario 27: Type A Error free chained I-Blocks transmission (FSC = 40 bytes, x=1, y=0) 72 Scenario 28: Type A Error free chained I-Blocks transmission (FSC = 40 bytes, x=1, y=1) 73 Scenario 29: Type A Error free chained I-Blocks transmission (FSC = 48 bytes, x=2, y=0) 74 Scenario 30: Type A Error free chained I-Blocks transmission (FSC = 48 bytes, x=2, y=1) 75 Scenario 31: Type A Error free chained I-Blocks transmission (FSC = 64 bytes, x=3, y=0) 76 Scenario 32: Type A Error free chained I-Blocks transmission (FSC = 64 bytes, x=3, y=1) 77 Scenario 33: Type A Error free chained I-Blocks transmission (FSC = 96 bytes, x=4, y=0) 78 Scenario 34: Type A Error free chained I-Blocks transmission (FSC = 96 bytes, x=4, y=1) 79 Scenario 35: Type A Error free chained I-Blocks transmission (FSC = 128; x=5, y=0) ____ 80 Scenario 36: Type A Error free chained I-Blocks transmission (FSC = 128; x=5, y=1) ____ 81 Scenario 37: Type A Error free chained I-Blocks transmission (FSC = 16; x=7, y=0) _____ 82 Scenario 38: Type A Error free chained I-Blocks transmission (FSC = 16; x=7, y=1) _____ 83 Scenario 39: Type A Error free chained I-Blocks transmission (FSC = 24; x=8, y=0) _____ 84 Scenario 40: Type A Error free chained I-Blocks transmission (FSC = 24; x=8, y=1) _____ 85 Scenario 41: Type A Error free chained I-Blocks transmission (FSC = 256; x=9, y=0) ____ 87 Scenario 42: Type A Error free chained I-Blocks transmission (FSC = 256; x=9, y=1) ____ 89 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page viii Scenario 43: Type A Error free request for Frame Waiting Time Extension on non-chained IBlocks (x= 0 to 1) _________________________________________________________ 93 Scenario 44: Type A Error free request for Frame Waiting Time Extension during chaining in both directions (x = 0 to 1) __________________________________________________ 96 Scenario 45: Type A Error free chained I-Blocks with different values of FSD __________ 98 Scenario 46: Type A Error free chained I-Blocks reception with rare frame sizes _______ 101 Scenario 47: Type A Error free exchange with the minimum Frame Delay Time PCD→PICC for different values of the Frame Waiting Time (x=0 to 2) _________________________ 104 Scenario 48: Type A I-Blocks exchange and request for Frame Waiting Time Extension with ‘noise’ after each PICC response (x= 0 to 1) ___________________________________ 106 Scenario 49: Type A Collision Detection with an error after WUPA (xy=00, 01 and 13 to 16) ______________________________________________________________________ 108 Scenario 50: Type A Collision detection with an error after ANTICOLLISION CL1 (xy=00 to 05, 07 and 11 to 13) ______________________________________________________ 110 Scenario 51: Type A Polling with detection of a Type A then a Type B PICC __________ 112 Scenario 52: Type A Collision detection with an error after WUPA (xy=00 to 02, 13 to 14 and 16) ___________________________________________________________________ 114 Scenario 53: Type A Collision detection with an error after SELECT CL1 (xy=00 to 03 and 11 to 12) _________________________________________________________________ 116 Scenario 54: Type A Activation with an error after RATS (xy=00 to 02, 04-05, 10 and 12 to 15) ___________________________________________________________________ 119 Scenario 55: Type A Activation with ‘noise’ after RATS (x=0 to 3)___________________ 122 Scenario 56: Type A Collision detection with a time-out after ANTICOLLISION CL1 ____ 124 Scenario 57: Type A Collision detection with a time-out after WUPA (x=0) ____________ 126 Scenario 58: Type A Collision detection with a time-out after WUPA (x=1) ____________ 127 Scenario 59: Type A Collision detection with a time-out after WUPA (x=2) ____________ 128 Scenario 60: Type A Collision detection with a time-out after SELECT CL1 ___________ 130 Scenario 61: Type A Activation with a time-out after RATS ________________________ 132 Scenario 62: Type A Activation with respect of the EMD Suppression behavior after RATS (xy=00 to 05, xy=10 to 15 and xy=20 to 25) ____________________________________ 135 Scenario 63: Type A Activation with respect of the ‘deaf time’ after RATS (x=0 and 1)___ 137 Scenario 64: Type A Error notification on an I-Block not indicating chaining (xy=00 to 14) 140 Scenario 65: Type A Error notification on an I-Block not indicating chaining (xy=15) ____ 141 Scenario 66: Type A time-out after an I-Block not indicating chaining ________________ 144 Scenario 67: Type A Transmission error in response to an I-Block not indicating chaining (x=0 to 2 and 5) _________________________________________________________ 148 Scenario 68: Type A Protocol error in response to an I-Block not indicating chaining (xy=00 to 11, 13 to16) ____________________________________________________________ 151 Scenario 69: Type A Error notification on an I-Block indicating chaining (xy=00 to 14) ___ 154 Scenario 70: Type A time-out after an I-Block indicating chaining ___________________ 157 Scenario 71: Type A Transmission error in response to an I-Block indicating chaining (x= 4) ______________________________________________________________________ 160 Scenario 72: Type A Protocol error in response to an I-Block indicating chaining (xy=00 to 09 and 11 to12) ____________________________________________________________ 163 Scenario 73: Type A Time-out after an R(ACK) Block (i.e. error notification) (xy=00 to 15) 166 Scenario 74: Type A Transmission error in response to an R(ACK) Block (x=0 to 2 and 4) 170 Scenario 75: Type A Protocol error in response to an R(ACK) Block (xy=00 to 11 and 13 to 16) ___________________________________________________________________ 173 Scenario 76: Type A Single time-out after an S(WTX) Response Block (i.e. several values of WTXM) (xy=00 to 14 and 22 to 28) __________________________________________ 177 Scenario 77: Type A Repeated use of a FWT Extension after a single S(WTX) Request _ 180 Scenario 78: Type A ‘Noise’ in response to an I-Block not indicating chaining (x=0 to 2 and4) ______________________________________________________________________ 183 Scenario 79: Type A ‘Noise’ in response to an I-Block indicating chaining (x=0 to 2 and 4) 186 Scenario 80: Type A ‘Noise’ in response to an R(ACK) Block (x=0 to 2 and 4) _________ 189 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page ix Scenario 81: Type A Protocol error in response to an R(NAK)-Block sent to notify a transmission error (xy=00 to 07 and 09 to 11) __________________________________ 192 Scenario 82: Type A Presence Check with an error after R(NAK) (x=0 to 2)___________ 195 Scenario 83: Type A Removal with an error after WUPA __________________________ 198 Scenario 84: Type A Consecutive time-outs after S(WTX) Response Blocks __________ 201 Scenario 85: Type A Block protocol with respect of the EMD suppression behavior (xy=00 to 05, xy=10 to 15 and xy=20 to 25) ____________________________________________ 205 Scenario 86: Type A Block Protocol with respect of the ‘deaf time’ (x=0 and 1) ________ 207 Scenario 87: Type A Parity error in the first 4 bytes of a sequence in response to an I-Block not indicating chaining)____________________________________________________ 211 Scenario 88: Type A Parity error in the first 4 bytes of a sequence in response to an I-Block indicating chaining _______________________________________________________ 214 Scenario 89: Type A Parity error in the first 4 bytes of a sequence in response to an R(ACK) Block__________________________________________________________________ 218 Scenario 90: Type A Parity error in the first 4 bytes of a sequence after an S(WTX) Response Block__________________________________________________________________ 222 Scenario 91: Type B Pre-test to determine TR1PUTMIN ____________________________ 224 Scenario 92: Basic Type B Exchange and timings measurement ___________________ 227 Scenario 93: Basic Type B Exchange with supported SoS and EoS (x=0 to 1) _________ 230 Scenario 94: Type B Correct Removal ________________________________________ 232 Scenario 95: Basic Type B Exchange with the minimum and the default maximum Frame Delay Time PCD→PICC (x=0 and 1) _________________________________________ 235 Scenario 96: Basic Type B Exchange with the minimum and the maximum character-tocharacter delay (x=0 and 1) ________________________________________________ 237 Scenario 97: Type B Correct Presence Check (x=0) _____________________________ 241 Scenario 98: Type B Correct Presence Check (x=1) _____________________________ 242 Scenario 99: Type B Installation with supported values of ADC (x=0 to 2) ____________ 244 Scenario 100: Type B Installation with supported values of FO (x=0 to 2)_____________ 246 Scenario 101: Type B Installation with supported values of Bit_Rate_Capability (x=0 to 3) 248 Scenario 102: Type B Installation with supported values of ADF (x=0 to 3) ___________ 250 Scenario 103: Type B Installation with supported values of b4-b2 of Protocol_Type (x=0 to 3) ______________________________________________________________________ 252 Scenario 104: Type B Installation with supported values of MBLI (x=0 to 4) ___________ 254 Scenario 105: Type B Installation with different values of ATQB (x=0 to 5) ____________ 257 Scenario 106: Type B Error free non-chained I-Blocks exchanges for all possible values of FWT (xy=00 to 14) _______________________________________________________ 260 Scenario 107: Type B Error free chained I-Blocks in both directions for different values of FSC (x=1 to 7, y=0) ______________________________________________________ 263 Scenario 108: Type B Error free chained I-Blocks in both directions for different values of FSC (x=1 to 7, y=1) ______________________________________________________ 265 Scenario 109: Type B Error free chained I-Blocks transmission (FSC = 32 bytes; x=0, y=0) ______________________________________________________________________ 267 Scenario 110: Type B Error free chained I-Blocks transmission (FSC = 32 bytes; x=0, y=1) ______________________________________________________________________ 268 Scenario 111: Type B Error free chained I-Blocks transmission (FSC = 40 bytes, x=1, y=0) ______________________________________________________________________ 269 Scenario 112: Type B Error free chained I-Blocks transmission (FSC = 40 bytes, x=1, y=1) ______________________________________________________________________ 270 Scenario 113: Type B Error free chained I-Blocks transmission (FSC = 48 bytes, x=2, y=0) ______________________________________________________________________ 271 Scenario 114: Type B Error free chained I-Blocks transmission (FSC = 48 bytes, x=2, y=1) ______________________________________________________________________ 272 Scenario 115: Type B Error free chained I-Blocks transmission (FSC = 64 bytes, x=3, y=0) ______________________________________________________________________ 273 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page x Scenario 116: Type B Error free chained I-Blocks transmission (FSC = 64 bytes, x=3, y=1) ______________________________________________________________________ 274 Scenario 117: Type B Error free chained I-Blocks transmission (FSC = 96 bytes, x=4, y=0) ______________________________________________________________________ 275 Scenario 118: Type B Error free chained I-Blocks transmission (FSC = 96 bytes, x=4, y=1) ______________________________________________________________________ 276 Scenario 119: Type B Error free chained I-Blocks transmission (FSC = 128; x=5, y=0) __ 277 Scenario 120: Type B Error free chained I-Blocks transmission (FSC = 128; x=5, y=1) __ 278 Scenario 121: Type B Error free chained I-Blocks transmission (FSC = 16; x=6, y=0) ___ 279 Scenario 122: Type B Error free chained I-Blocks transmission (FSC = 16; x=6, y=1) ___ 280 Scenario 123: Type B Error free chained I-Blocks transmission (FSC = 24; x=7, y=0) ___ 281 Scenario 124: Type B Error free chained I-Blocks transmission (FSC = 24; x=7, y=1) ___ 282 Scenario 125: Type B Error free chained I-Blocks transmission (FSC = 256; x=8, y=0) __ 284 Scenario 126: Type B Error free chained I-Blocks transmission (FSC = 256; x=8, y=1) __ 286 Scenario 127: Type B Error free request for Frame Waiting Time Extension on non-chained IBlocks (x = 0 to 1)________________________________________________________ 290 Scenario 128: Type B Error free request for Frame Waiting Time Extension during chaining in both directions (x = 0 to 1) _________________________________________________ 293 Scenario 129: Type B Error free chained I-Blocks in both directions with different values of FSD __________________________________________________________________ 295 Scenario 130: Type B Error free chained I-Blocks reception with rare frame sizes ______ 298 Scenario 131: Type B Error free exchange with the minimum Frame Delay Time PCD→PICC for different values of the Frame Waiting Time (x=0 to 2) _________________________ 301 Scenario 132: Type B Polling with an error after WUPB (x=01, 02, 10, 11, 13, 14 and 15) 303 Scenario 133: Type B Polling with detection of a Type B then a Type A PICC _________ 305 Scenario 134: Type B Collision detection with an error after WUPB (xy=01, 02, 10, 11, 13, 14 and 15) ________________________________________________________________ 307 Scenario 135: Type B Activation with ‘noise’ after ATTRIB (x=0 to 2 and 4 to 5) _______ 311 Scenario 136: Type B Activation with an error after ATTRIB (xy=01, 02, 10 and 11) ____ 313 Scenario 137: Type B Collision detection with a time-out after WUPB (x=0) ___________ 315 Scenario 138: Type B Collision detection with a time-out after WUPB (x=1) ___________ 316 Scenario 139: Type B Collision detection with a time-out after WUPB (x=2) ___________ 316 Scenario 140: Type B Activation with a time-out after ATTRIB (x=0 to 8) _____________ 318 Scenario 141: Type B Activation with respect of the EMD Suppression behavior after ATTRIB (xy=00 to 05, xy=10 to 15 and xy=20 to 25) ____________________________________ 321 Scenario 142: Type B Activation with respect of the ‘deaf time’ after ATTRIB (x=0 and 1) 324 Scenario 143: Type B Error notification on an I-Block not indicating chaining (xy=00 to 14)327 Scenario 144: Type B Error notification on an I-Block not indicating chaining (xy=15) ___ 328 Scenario 145: Type B Time-out after an I-Block not indicating chaining ______________ 331 Scenario 146: Type B Transmission error in response to an I-Block not indicating chaining (x=0 and 2 to 4) _________________________________________________________ 335 Scenario 147: Type B Protocol error in response to an I-Block not indicating chaining(xy=00 to 11, 13 to 16) __________________________________________________________ 338 Scenario 148: Type B Error notification on an I-Block indicating chaining (xy=00 to 14) __ 341 Scenario 149: Type B Time-out after an I-Block indicating chaining _________________ 343 Scenario 150: Type B Transmission error in response to an I-Block indicating chaining__ 346 Scenario 151: Type B Protocol error in response to an I-Block indicating chaining (xy=00 to 09, 11 to 12) ____________________________________________________________ 349 Scenario 152: Type B Time-out after an R(ACK) Block (i.e. error notification) (xy=00 to 15) ______________________________________________________________________ 352 Scenario 153: Type B Transmission error in response to an R(ACK) Block (x=0 to 1) ___ 356 Scenario 154: Type B Protocol error in response to an R(ACK) Block (xy=00 to 11, 13 to 16) ______________________________________________________________________ 359 Scenario 155: Type B Single time-out after an S(WTX) Response Block (i.e. several values of WTXM) (xy=00 to 14 and 22 to 28) ________________________________________ 363 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page xi Scenario 156: Type B Repeated use of a FWT extension after a single S(WTX) Request 366 Scenario 157: Type B ‘Noise’ in response to an I-Block not indicating chaining (x=0, 1 and 3) ______________________________________________________________________ 369 Scenario 158: Type B ‘Noise’ in response to an I-Block indicating chaining (x=0 to 1 and 3) ______________________________________________________________________ 372 Scenario 159: Type B ‘Noise’ in response to an R(ACK) Block (x=0 to 1 and 3) ________ 375 Scenario 160: Type B Protocol error in response to an R(NAK)-Block sent to notify a transmission error (xy=00 to 07, 09 to 11) _____________________________________ 378 Scenario 161: Type B Presence Check with an error after R(NAK) (x=0 to 1)__________ 380 Scenario 162: Type B Removal with an error after WUPB_________________________ 383 Scenario 163: Type B consecutive time-outs after S(WTX) Response Blocks _________ 386 Scenario 164: Type B Block protocol with respect of the EMD suppression behavior (xy=00 to 05, xy=10 to 15 and xy=20 to 25) ____________________________________________ 390 Scenario 165: Type B Block Protocol with respect of the ‘deaf time’ (x=0 and 1) _______ 393 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page xii Figures Figure 1: Test Bench ............................................................................................................10 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page xiii Tables Table 1: Specification Documents ..........................................................................................2 Table 2: List of Abbreviations .................................................................................................5 Table 3: End Of Test command step ....................................................................................11 Table 4: End Of Test command with transaction completion procedure step ........................11 Table 5: Parameter values Common Type A and Type B .....................................................12 Table 6: Parameter values Specific Type A ..........................................................................13 Table 7: Parameter values Specific Type B ..........................................................................14 © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 1 / 394 1. About this Document 1.1. Introduction The present document describes the detailed organization and requirements of the executable tests the vendors has to comply with, to allow the digital part of the Contactless Terminal Level 1 Type Approval Testing. The intended audience of this document includes test tool vendors, recognised test laboratories and auditors. Describing the executable tests and the associated procedures is necessary to ensure reproducibility of the test results, even across different test laboratories. 1.2. Scope For each individual executable test in this document, the following information is available: • The test number with the version of the Test Cases in which the Test Case was updated for the last time, • The objective of the test, • The related reference specification section(s) of the Test Case, • The conditions of the test, • The procedure of the test, • The acceptance criteria(s), • The failure actions, • The scenario of the test presented as a flow chart. 1.3. Reference Documents EMV documents are available on the EMVCo web site: http://www.emvco.com/approvals.aspx and http://www.emvco.com/specifications.aspx © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r 1.3.1. Specification Documents Document EMV® Level 1 Specifications for Payment Systems ― EMV Contactless Interface Specification EMV® Specification Bulletin No. 282 PPS0 and PPS1 RFU Value Handling EMV® Specification Bulletin No. 283 PCD Carrier Phase Drift EMV® Specification Bulletin No. 300 PICC Presence Check Procedure EMV® Specification Bulletin No. 303 Adding an Optional Suspend and a Mandatory Suspend in the Polling Loop EMV® Type Approval Contactless Terminal Level 1 ― Device Test Environment Table 1: Specification Documents Page 2 / 394 Version Issue date 3.2, June 2022 First Edition, March 2023 First Edition, March 2023 First Edition, June 2024 Second Edition, May 2024 3.2a, January 2025 1.3.2. Laboratory Test Documents The test documents to be applied by EMVCo recognised laboratories when performing an EMV Contactless Terminal Type Approval Level 1 session are listed in the following document: • EMVCo Type Approval • Contactless Terminal Level 1 • Laboratories Documentation Check the last version of this document for any update of the test documents. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 3 / 394 1.4. Acronyms and Abbreviations The following abbreviations and notations are used in this document: Abbreviation ACK ADC AFI ANTICOLLISION Apf ASK ATQA ATQB ATS ATTRIB BCC BPSK CID CLn CT CRC_A CRC_B CUT DR DRI DS DSI DUT EGT EMD EoF EoS etu FDT fc FO Description Positive ACKnowledgement Application Data Coding, Type B Application Family Identifier, Type B Collision detection command, Type A Anticollision prefix f, Type B Amplitude Shift Keying Answer To reQuest, Type A Answer To reQuest, Type B Answer To Select, Type A Selection command, Type B Check byte, Type A Binary Phase Shift Keying Card IDentifier Cascade Level n, Type A Cascade Tag, Type A Cyclic Redundancy Check error detection code for Type A Cyclic Redundancy Check error detection code for Type B Card Under Test. When the Instance Under Test as defined in ISO 9646 is a EMVCo Proximity IC Card Divisor Receive (PCD, PICC) Divisor Receive Integer (PCD, PICC) Divisor Send (PICC, PCD) Divisor Send Integer (PICC, PCD) Device Under Test Extra Guard Time, Type B ElectroMagnetic Disturbance (= ‘noise’) End of Frame End of Sequence Elementary time unit (= ‘bit duration’) Frame Delay Time Carrier frequency Frame Option, Type B © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 4 / 394 Abbreviation fs FSC FSCI FSD FSDI FWI FWT HLTA HLTB INF ISO LSB LT MBL MBLI MSB NAD NAK NRZ-L OOK OSI PCB PCD PI PICC PPS PUPI PUT RATS REQA REQB RF RFU SAK Description Subcarrier frequency Frame Size for proximity Card Frame Size for proximity Card Integer Frame Size for proximity coupling Device Frame Size for proximity coupling Device Integer Frame Waiting time Integer Frame Waiting Time Halt Command, Type A Halt Command, Type B INFormation field International Organization for Standardization Least Significant Bit Lower Tester. Maximum Buffer Length Maximum Buffer Length Integer Most Significant Bit Node ADdress Negative Acknowledgment Non-Return to Zero, (L for Level) On-Off Keying Open Systems Interconnection Protocol Control Byte Proximity Coupling Device (reader) Protocol Information field of the ATQB, Type B Proximity IC Card Protocol and Parameter Selection, Type A Pseudo-Unique PICC Identifier, Type B PCD Under Test. When the Instance Under Test as defined in ISO 9646 is an EMV Contactless Proximity Coupling Device (reader) Request for Answer To Select REQuest command, Type A REQuest command, Type B Radio Frequency Reserved for Future Use Select AcKnowledge, Type A © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 5 / 394 Abbreviation SELECT SFGT SoF SoS UID uidn UT WTX WTXM WUPA WUPB Description SELECTion command, Type A Minimum Frame Delay Time after ATS (for Type A) or ATTRIB Response (for Type B) Start of Frame Start of Sequence Unique IDentifier, Type A Byte number n of Unique Identifier Upper Tester Waiting Time eXtension Waiting Time eXtension Multiplier Wake UP command, Type A Wake UP command, Type B Table 2: List of Abbreviations © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r 2. Generic Information about the Tests Page 6 / 394 2.1. Default Environmental Test Conditions The following environmental conditions shall be used for all the tests described in the present document: • The Reference PICC Antenna shall be placed in the EMV Contactless operating volume of the PCD under Test (as defined in section “Operating Volume” of the EMV Contactless specification) so that the transaction can be performed correctly (some manual positioning should be performed to obtain the best test results). • The external perturbations shall be suppressed: no metal objects or other perturbing elements in a volume of 30 centimeters around the Test System and no other antennas (contactless terminals, cell phones …) in a volume of 1 meter around the Test System. 2.2. Default Protocol Test Conditions Unless specified in the test description (i.e. for exception processing tests), the blocks sent by the LT shall never contain a CID or a NAD field as it is not supported by an EMV Contactless terminal. Unless specified in the test description (i.e. to perform a PICC Reset), the PUT shall never stop sending the carrier during an EMV Contactless transaction. Unless specified in the test description, the LT shall apply the default EMV Contactless timings and the default EMV Contactless parameter values (as defined in the present section). Unless specified in the test description, the polling for other technologies shall be deactivated in the Device Test Environment. Unless specified in the test description, the optional suspend shall be deactivated in the Device Test Environment. 2.3. Test Tool Requirements When, for applied: • • • • • Type Approval, a Test Tool is used as a LT, the following requirements should be Any executed subcase shall generate traces, logs and a test report. The generation of traces, logs and test reports shall indicate whether the acceptance criterias have been met. All acceptance criterias and related values shall be visible in the traces, logs or test reports (e.g. for a timing measurement, the timing measured by the Test Tool shall be present, so shall be the tolerance used by the Test Tool and the expected value or expected range of values for this timing). Any applied timing shall be visible in the traces, logs or test reports. All the commands and APDUs sent by the PCD Under Test shall be checked, e.g. all the data bytes included in the I-Blocks (chained or not chained) sent by the PUT shall be checked. All the frames sent by the PUT shall be checked. It means that the Test Tool shall check that: © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 7 / 394 • Regarding the Type A frames: the presence of Start of Frame (SoF), parity bits, End of Frame (EoF) and the two CRC bytes when expected. • Regarding the type B frames: the presence of Start of Sequence (SoS), End of Sequence (EoS), a start bit (Logic “0”) followed by 8 data bits and a stop bit (Logic “1”) and the two CRC bytes when expected. • The value of the two CRC bytes is correct, when expected. 2.4. Default Timings For the time parameters given below, when a test description does not indicate a specific value which has to be used to perform the test, then the default time value shall be used by the Lower Tester to send sequences (i.e. the LT shall reply to the PUT with delays equal to the default value). The concerned parameters and their default values are as follows: In Type A: • After WUPA, ANTICOLLISION and SELECT commands: o FDTA,PICC = (1152 x 1/fc + 20/fc) [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b o FDTA,PICC = (1152 x 1/fc + 84/fc) [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b • After all other commands and after all Blocks: o FDTA,PICC = (3200 x 1/fc + 20/fc) [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b • FDTA,PICC = (3200 x 1/fc + 84/fc) [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b In Type B: • FDTB,PICC = 3840 x 1/fc after all commands and all Blocks (TR0 = 1920 x 1/fc with no subcarrier generated by the LT and TR1 = 1920 x 1/fc with subcarrier with no phase transition generated by the LT) • EGTPICC = 128/fc between two consecutive characters within any sequence. • Start of Sequence (SoS) = 1344 x 1/fc of logical state low (i.e. a subcarrier phase transition followed by the subcarrier with phase φ0+180°) followed by 320 x 1/fc of logical state high (i.e. a subcarrier phase transition followed by the subcarrier with phase φ0) • End of Sequence (EoS) = 1344 x 1/fc of logical state low (i.e. a subcarrier phase transition followed by the subcarrier with phase φ0+180°) followed by a logical state transition (i.e. a subcarrier phase transition to phase φ0) and 136 x 1/fc with subcarrier on (then the LT turns the subcarrier off) Notation: in the EMV Contactless specification, the Frame Delay Time (FDT) is defined as the delay between the end of a sequence sent by the PUT and the beginning of a sequence sent by the LT. © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 8 / 394 2.5. Definitions for Sequences Timings Application and Measurement When a Test Case asks for the measurement or the application of a delay between two consecutive sequences sent in the same direction or in opposite directions, the delay shall be measured or applied using the following definitions: • Beginning of a sequence sent by a Type A PICC: the start (i.e. the first modulation transmitted) of the Start of Frame (SoF) of the PICC sequence. • Beginning of a sequence sent by a Type A PCD: the start of the lower level within the Start of Frame (SoF) of the PCD sequence. • Beginning of a sequence sent by a Type B PICC: the start of the Start of Sequence (SoS) of the PICC sequence. • Beginning of a sequence sent by Type B PCD: the start of the Start of Sequence (SoS) of the PCD sequence. • End of a sequence sent by a Type A PICC: the last modulation transmitted in the PICC sequence. • End of the modulation of a block sent by a Type A PICC: the last modulation transmitted in the PICC sequence. • End of a sequence sent by a Type A PCD: the rising edge of the last lower level of the PCD sequence (within the last data bit sent by the PCD if this last data bit is a Logic “1” or within the End of Frame if the last data bit sent by the PCD is a Logic “0”). • End of a sequence sent by a Type B PICC: the start of the End of Sequence (EoS) of the PICC sequence. • End of the modulation of a block sent by a Type B PICC: the end of the last modulation of a block, i.e. the end of the EoS if the PICC does not maintain the subcarrier ON after the EoS or the end of the last subcarrier modulation if the PICC does maintain the subcarrier ON after the EoS • End of a sequence sent by a Type B PCD: the end of the End of Sequence (EoS) of the PCD sequence. 2.6. Scenario Notations during Half-Duplex Protocol Notation I(0)x [‘HH … HH’] I(1)x [‘HH … HH’] R(ACK)x R(NAK)x S(…) Description Not chained I-Block or last I-Block of a chain with block number x and containing the hexadecimal data bytes ‘HH … HH’ (i.e. transmitted APDUs) Chained I-Block (except the last I-Block of a chain) with block number x and containing the hexadecimal data bytes ‘HH … HH’ (i.e. transmitted APDUs) R-Block indicating a positive acknowledgment with block number x R-Block indicating a negative acknowledgment with block number x S-Block © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 9 / 394 2.7. Types of Frames in the Scenarios In the present document, when describing the EMV Contactless transactions within the test scenarios, the following rules apply: In Type A tests, if nothing is indicated, the bytes are transported within a Type A standard frame with the 2 bytes of CRC_A (i.e. a valid CRC_A is automatically added after the bytes by the Test Tool). In Type A tests, if “(short frame)” is indicated, the bytes are transported within a Type A short frame. In Type A tests, if “(no CRC_A)” is indicated, the bytes are transported within a Type A standard frame with no CRC_A bytes. In Type A tests, if “(Type B frame)” is indicated, the bytes are transported within a Type B frame with 2 bytes of CRC_B (i.e. a valid CRC_B is automatically added after the bytes by the Test Tool). In Type B tests, if nothing is indicated, the bytes are transported within Type B frames with 2 bytes of CRC_B (i.e. a valid CRC_B is automatically added after the bytes by the Test Tool). In Type B tests, if “(no CRC_B)” is indicated, the bytes are transported within a Type B frame with no CRC_B bytes (exception processing tests). In Type B tests, if “(Type A short frame)” is indicated, the bytes are transported within a Type A short frame (WUPA command sent during collision detection). 2.8. Notational Conventions The following notations apply: ‘00’ to ‘FF’ or “00…00” to “FF…FF”: hexadecimal values (sometimes the hexadecimal values are indicated between parenthesis and followed by a lower case “h”). (0)b or (“1001”)b: binary notation. Values expressed in binary form are followed by a lower case “b”. u: any value (e.g. byte A = (“1u11 0101”)b means that b7 of byte A can take any value). UID Size 1, 2 or 3: refers to the single, double or triple size Type A UID as defined in the EMV specification. 2.9. Test References The tests described in the following sections are referenced this way: Test codification: T- - - - . - - - abc . d a: Frame Type: • A = Type A tests • B = Type B tests • C = Common tests to Type A and Type B (i.e. Polling Tests) © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 10 / 394 b: Test Type: • 0 = Basic tests • 1 = Installation Tests • 2 = Half Duplex Block Protocol Exchanges • 3 = Installation with Exception Processing Tests • 4 = Block Protocol and transaction completion tests with Exception Processing Tests c: Test Number (within the Test Type): • From 00 to 99 d: Optional Subcase Reference xy: • From 0 to 99 e.g. TA223.2 represents the Subcase 2 of the Test number 23 within the tests concerning the Half Duplex Block Protocol Exchanges in Type A. 2.10.Test Bench A Test Platform (on the PC) and a Protocol Contactless Card Simulator are used for conducting the tests (Lower Tester): PC running the Test Platform Protocol Contactless Card Simulator Simulation antenna Lower Tester Terminal Loop-Back Application (+ other technologies disabled) Ethernet connexion PCD Under Test (PUT) Figure 1: Test Bench Upper Tester 2.11.Loop-Back application and End Of Test Command The Test Bench which is used to implement the EMV Contactless Terminal Type Approval tests is based on the use of the Loop-Back Application (and a function to disable the optional polling for other technologies than EMV Contactless Type A and B, if needed) in the terminal containing the PCD Under Test (Upper Tester). The PCD Under Test shall allow for the Loop-Back application to be used during the Level 1 digital tests. This test application becomes active when the PCD Under Test reports to the Upper Tester that a (single) card is present. When it becomes active, it sends a defined first © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 11 / 394 Command APDU and then any received Response APDU is derived into the next Command APDU. The Lower Tester can indicate the end of a test scenario to the PCD Under Test by sending an I-Block containing a specific command referred to as the End Of Test command. When the terminal receives this command, it shall immediately initiate the transaction completion procedure. The End Of Test command is a specific Response APDU sent by the Lower Tester within an I-Block (Response APDU with the INS field equal to ‘70’). In the scenarios of this document, whenever, there is a step: 1 PUT I(0)0 [‘‘EOT Command’’ + ‘90 00’] LT End Of Test command Table 3: End Of Test command step It shall be understood as: 1 PUT I(0)0 [‘00 70 04 04 00’ (EOT Command) + ‘90 00’] End Of Test command LT with trasaction completion procedure Table 4: End Of Test command with transaction completion procedure step Indicating that the Lower Tester shall send an I-Block with an R-APDU containing ‘00 70 04 04 00’ (EOT Command) + ‘90 00’ i.e. an EOT Command requesting to the Loop-Back application to initiate the transaction completion Procedure (2nd byte of the R-APDU set to ‘70’). The Loop-Back application and the End of Test command are detailed in the ‘Device Test Environment’ vendor form provided by EMVCo. 2.12.Parameter Values This section defines the parameter values to be applied or observed during the PCD digital tests unless identified in the test descriptions otherwise. The timing values in the table below are as given in the EMV Contactless specification and do not take the test margins induced by the tool inaccuracy into account. When a timing value is applied by the test tool (e.g. FDTA,PICC or FDTB,PICC), the test implementation should be as close as possible to the timing given in the table and the following rules shall be respected by the test tool: • In the case where a minimum timing value shall be supported by the PCD under test, the applied timing value shall never be lower than the specification value given in the table. • In the case where a maximum timing value shall be supported by the PCD under test, the applied timing value shall never be higher than the specification value given in the table. When a timing value is measured during a test, the tolerances of the test tool shall be used. The following is the maximum tolerance p accepted for a test tool: • If T is defined in ‘1/fc’ and T  12800 x 1/fc then p = 12.8 x 1/fc • If T is defined in ‘1/fc’ and 12800 &lt; T  128000 x 1/fc then p = 64 x 1/fc • If T is defined in ‘1/fc’ and 128000 < T  1280000 x 1/fc then p = 128 x 1/fc • If T is defined in ‘1/fc’ and T > 1280000 x 1/fc then p = 0.001 * T • If T is defined in ‘ms’ then p = 0.001 * T (e.g. T = 10 ms => p = 10 µs) © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 12 / 394 Notation: T is the timing which shall be measured within a Test Case and p is the time precision needed for this Test Cases. Parameters common to Type A and Type B: Parameter name Parameter value Comments tP,MIN 5.1 ms tP,MAX 10.0 ms tRESET,MIN 5.1 ms tRESET,MAX 10.0 ms tSUSPEND, MIN 5.1 ms tSUSPEND, MAX 30 ms tMIN,RETRANSMISSION 3.0 ms tRETRANSMISSION 10.0 ms tRESETDELAY 33.0 ms tRECOVERY 1280/fc TPCD 16.4 ms FWT+FWT n x 128/fc = (4096 x 2FWI + 49152) x Detailed in the test description 1/fc (FWT+FWT)DEFAULT 114688 x 1/fc Corresponding to the basic installation: FWI = 4 FWTMAX 67108864 x 1/fc Corresponds to FWIMAX = 14 FSC n bytes Detailed in the test description FSD 256 bytes Table 5: Parameter values Common Type A and Type B Parameters specific to Type A: Parameter name Parameter value Comments FDTA,PICC,ANTICOLLISION and FDTA,PICC,MIN 9 x 128/fc + 20/fc [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b 9 x 128/fc + 84/fc [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b FDTA,PICC,MAX n x 128/fc + 20/fc [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b n x 128/fc + 84/fc [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b (n+1) x 128/fc = FWT+FWT Detailed in the test description © 2010-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval PCD Digital Test Cases v3.2a.r Page 13 / 394 Parameter name FDTA,PICC,ACTIV,MAX FDTA,PCD,MIN FWTACTIVATION (SFGT+SFGT) Parameter value Comments 559 x 128/fc + 20/fc [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (0)b 559 x 128/fc + 84/fc [-1/fc ; +0.4 µs + 1/fc] if the last bit transmitted by the PCD is (1)b 6780 x 1/fc 71680 x 1/fc [(256 x 16/fc) x 2SFGI] + [384/fc x 2SFGI] SFGI ≤ SFGIMAX = 14 Detailed in the test description Table 6: Parameter values Specific Type A Parameters specific to Type B: Parameter name Parameter value TR0MIN 1008 x 1/fc TR0MAX,ATQB 6416 x 1/fc Comments With no subcarrier generated by the LT TR1MIN 1264 x 1/fc Subcarrier with no phase transition generated by the LT TR1PUTMIN TR1MAX Determined by performing the Minimum value of TR1 supported bypre-test TB000 and used to the PCD (specific to the PUT) initialize some subcases in the tests TB340 and TB435 3216 x 1/fc Subcarrier with no phase transition generated by the LT FDTB,PICC,MIN 2272 x 1/fc = TR0MIN + TR1MIN = (1008 + 1264) x 1/fc FDTB,PICC,MAX n x 128/fc = FWT+FWT Detailed in the test description FWTATQB 7680 x 1/fc FDTB,PCD,MIN EGTPICC,MIN and EGTPCD,MIN EGTPICC,MAX 6780 x 1/fc 0 x 1/fc 272 x 1/fc EGTPCD,MAX tPICC,S,1,MIN tPICC,S,1,MAX tPICC,S,2,MIN tPICC,S,2,MAX tPICC,E,MIN tPICC,E,MAX tFSOFF,MIN 752 x 1/fc 1264 x 1/fc 1424 x 1/