EMV® Contactless Terminal Level 1 Type Approval – Reduced Range PCD Level 1 Test Guidelines

EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines Version 3.2a.r September 2025 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page i / vi Legal Notice This document summarizes EMVCo’s present plans for evaluation services and related policies and is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. 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EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page ii / vi Revision Log – Version 3.2a.r The following changes have been made to the document since the publication of Version 3.2a. Some of the numbering and cross references in this version have been updated to reflect changes introduced by the published bulletins. The numbering of existing requirements did not change, unless explicitly stated otherwise. Changes Introduced in version 3.2 of PCD Analogue Test Cases: None Other changes (test coverage, editorial): Editorial updates © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Contents Page iii / vi 1 About this document ................................................................................................................... 1 1.1 Introduction ............................................................................................................................ 1 1.2 Audience ................................................................................................................................ 1 1.3 Reference Documents ........................................................................................................... 1 1.3.1 Specification Documents ................................................................................................... 1 1.4 Acronyms and Abbreviations and Definitions ........................................................................ 2 2 Generic guidelines ....................................................................................................................... 4 2.1 Device Under Test (DUT) ...................................................................................................... 4 2.2 Testing Conditions ................................................................................................................. 4 2.3 Forms ..................................................................................................................................... 4 2.4 Applicable Test Plans ............................................................................................................ 4 2.5 DUT Positioning ..................................................................................................................... 5 2.5.1 Landing Plane definition .................................................................................................... 5 2.5.2 Origin of the Operating Volume ......................................................................................... 5 2.5.3 Test Antenna positioning ................................................................................................... 5 3 Analogue Guidelines.................................................................................................................... 7 3.1 Positioning Convention .......................................................................................................... 7 3.2 Analogue Test Procedure updates ........................................................................................ 8 3.3 Analogue Test Positions updates .......................................................................................... 9 3.3.1 Analogue Test Positions for Reduced Range 1 ................................................................ 9 3.3.2 Analogue Test Positions for Reduced Range 2 .............................................................. 12 3.4 Analogue Testing Acceptance Criteria ................................................................................ 15 4 Digital Guidelines for Approval Process ................................................................................. 16 5 Interoperability Test Guidelines................................................................................................ 17 5.1 PTP Devices used for Testing ............................................................................................. 17 5.2 Interoperability Testing Reduced Range PCD Test Positions ............................................. 17 5.2.1 Reduced Range 1 ........................................................................................................... 17 5.2.2 Reduced Range 2 ........................................................................................................... 18 5.3 Scores .................................................................................................................................. 19 5.4 Interoperability Testing Acceptance Criteria ........................................................................ 20 Annex A A.1 A.2 A.3 A.4 A.5 A.6 A.7 A.8 Updated Analogue Test Cases..................................................................................... 21 TA121.x.y.z00 Verifying the t1 Timing ................................................................................. 22 TA122.x.y.z00 Verifying the Monotonic Decrease from V4 to V2 ....................................... 25 TA123.x.y.z00 Verifying the Ringing ................................................................................... 28 TA124.x.y.z00 Verifying the t2 Timing ................................................................................. 31 TA125.x.y.z00 Verifying the t3 and t4 Timings .................................................................... 33 TA127.x.y.z00 Verifying the Monotonic Increase from V2 to V4 ......................................... 36 TA128.x.y.z00 Verifying the Overshoot ............................................................................... 38 TA129.x.y.z00 Verifying the Undershoot ............................................................................. 41 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page iv / vi A.9 A.10 A.11 A.12 A.13 A.14 A.15 TB121.x.y.z00 Verifying the Modulation Index .................................................................... 44 TB122.x.y.z00 Verifying the Fall Time ................................................................................. 46 TB123.x.y.z00 Verifying the Rise Time ............................................................................... 49 TB124.x.y.z00 Verifying the Monotonic Rising Edge .......................................................... 51 TB125.x.y.z00 Verifying the Monotonic Falling Edge .......................................................... 54 TB126.x.y.z00 Verifying Overshoots ................................................................................... 57 TB127.x.y.z00 Verifying Undershoots ................................................................................. 60 Annex B ID-1 Card positioning convention for Interoperability Tests .................................... 64 Annex C Analogue Test Plan Summary...................................................................................... 65 Annex D Weight Values for Interoperability tests ..................................................................... 68 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page v / vi Figures Figure 2-1—Relative Positioning of DUT and Test Antennas................................................................. 6 Figure 3-1— Label Points in a Plane of the Target Position ................................................................... 8 Figure 5-1— Reduced Range 1 Interoperability Testing positions ....................................................... 18 Figure 5-2— Reduced Range 2 Interoperability Testing positions ....................................................... 19 Figure A-3—Non Monotonic Decrease ................................................................................................. 26 Figure A-4—Acquired Signal................................................................................................................. 29 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page vi / vi Tables Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table 3-1—z Values and Associated z Identifiers .................................................................................. 7 3-2—r Values and Associated r Identifiers.................................................................................... 7 3-3— Reduced Range 1 Analogue Test position Updates ......................................................... 11 3-4— Reduced Range 2 Analogue Test position Updates ......................................................... 14 A-1— EMV – TEST PICCs for Test TA121.x.y.zrf ...................................................................... 22 A-2— EMV – TEST PICC Loads for Test TA121.x.y.zrf ............................................................. 22 A-3—Test Positions of Test TA121.x.y.z00 ................................................................................ 22 A-4— EMV – TEST PICCs for Test TA122.x.y.z00 .................................................................... 25 A-5—EMV – TEST PICC Loads for Test TA122.x.y.z00 ............................................................ 25 A-6—Test Positions of Test TA122.x.y.z00 ................................................................................ 25 A-7—EMV – TEST PICCs for Test TA123.x.y.z00 ..................................................................... 28 A-8—EMV – TEST PICC Loads for Test TA123.x.y.z00 ............................................................ 28 A-9—Test Positions of Test TA123.x.y.z00 ................................................................................ 28 A-10—EMV – TEST PICCs for Test TA124.x.y.z00 ................................................................... 31 A-11—EMV – TEST PICC Loads for Test TA124.x.y.z00 .......................................................... 31 A-12—Test Positions of Test TA124.x.y.z00 .............................................................................. 31 A-13—EMV – TEST PICCs for Test TA125.x.y.z00 ................................................................... 33 A-14—EMV – TEST PICC Loads for Test TA125.x.y.z00 .......................................................... 33 A-15—Test Positions of Test TA125.x.y.z00 .............................................................................. 33 A-16—EMV – TEST PICCs for Test TA127.x.y.z00 ................................................................... 36 A-17—EMV – TEST PICC Loads for Test TA127.x.y.z00 .......................................................... 36 A-18—Test Positions of Test TA127.x.y.z00 .............................................................................. 36 A-19—EMV – TEST PICCs for Test TA128.x.y.z00 ................................................................... 38 A-20—EMV – TEST PICC Loads for Test TA128.x.y.z00 .......................................................... 38 A-21—Test Positions of Test TA128.x.y.z00 .............................................................................. 38 A-22—EMV – TEST PICCs for Test TA129.x.y.z00 ................................................................... 41 A-23—EMV – TEST PICC Loads for Test TA129.x.y.z00 .......................................................... 41 A-24—Test Positions of Test TA129.x.y.z00 .............................................................................. 41 A-25—EMV – TEST PICCs for Test TB121.x.y.z00 ................................................................... 44 A-26—EMV – TEST PICC Loads for Test TB121.x.y.z00 .......................................................... 44 A-27—Test Positions of Test TB121.x.y.z00 .............................................................................. 44 A-28—EMV – TEST PICCs for Test TB122.x.y.z00 ................................................................... 46 A-29—EMV – TEST PICC Loads for Test TB122.x.y.z00 .......................................................... 46 A-30—Test Positions of Test TB122.x.y.z00 .............................................................................. 46 A-31—EMV – TEST PICCs for Test TB123.x.y.z00 ................................................................... 49 A-32—EMV – TEST PICC Loads for Test TB123.x.y.z00 .......................................................... 49 A-33—Test Positions of Test TB123.x.y.z00 .............................................................................. 49 A-34—EMV – TEST PICCs for Test TB124.x.y.z00 ................................................................... 51 A-35—EMV – TEST PICC Loads for Test TB124.x.y.z00 .......................................................... 51 A-36—Test Positions of Test TB124.x.y.z00 .............................................................................. 51 A-37—EMV – TEST PICCs for Test TB125.x.y.z00 ................................................................... 54 A-38—EMV – TEST PICC Loads for Test TB125.x.y.z00 .......................................................... 54 A-39—Test Positions of Test TB125.x.y.z00 .............................................................................. 54 A-40—EMV – TEST PICCs for Test TB126.x.y.z00 ................................................................... 57 A-41—EMV – TEST PICC Loads for Test TB126.x.y.z00 .......................................................... 57 A-42—Test Positions of Test TB126.x.y.z00 .............................................................................. 57 A-43—EMV – TEST PICC s for Test TB127.x.y.z00 .................................................................. 60 A-44—EMV – TEST PICC Loads for Test TB127.x.y.z00 .......................................................... 60 A-45—Test Positions of Test TB127.x.y.z00 .............................................................................. 60 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 1/69 1 About this document 1.1 Introduction This document describes the Level 1 testing guidelines applicable to Reduced Range PCDs, using the EMVCo PCD Administrative documents and PCD Level 1 Test Plans. A Reduced Range PCD may be not fully compliant with EMV Contactless Specifications. These Guidelines aim at adapting the existing PCDs testing to Reduced Range PCDs Level 1 testing by: • selecting relevant test positions, • identifying specific test configurations, • defining Level 1 Reduced Range specific dispositions. For Reduced Range PCD, two testing processes are available: • Reduced Range 1, • Reduced Range 2. This document refers to EMVCo standard Type Approval documents focusing on Reduced Range PCD testing specificities. The audience of this document is therefore expected to be familiar with EMV Contactless PCD Type Approval Process. 1.2 Audience The target audience of this document includes: • Product Provider • Testing laboratories recognised to perform the Type Approval tests 1.3 Reference Documents EMV documents are available on the EMVCo website: https://www.emvco.com/ 1.3.1 Specification Documents Ref. [L1Spec] [EMV CL PCD ANA TC] [EMV CL PCD DIG TC] Document Title EMV Level 1 Specifications for Payment Systems – EMV Contactless Interface Specification EMV Contactless Terminal Level 1 Type Approval – PCD Analogue Test Bench and Test Case Requirements EMV Contactless Terminal Level 1 Type Approval – PCD Digital Test Cases Version 3.2 – July 2022 3.2a – January 2025 3.2a – January 2025 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 2/69 Ref. [EMV CL PCD INTEROP TR] [DTE] [EMV ADMIN] [L1 RR ICS] [ITAR] Document Title EMV Terminal Type Approval PCD Level 1– Interoperability Testing Requirements Version Latest version EMV Contactless Terminal Level 1 Type Approval – Device Test Environment EMV Contactless Terminal Level 1 Type Approval – Reduced Range Administrative Process EMV Reduced Range Level 1 Implementation Conformance Statement EMV Contactless Terminal Level 1 Type Approval – Reduced Range Interoperability Test Application Requirements TTA Bulletin 276: Reduced Range Level1 Acceptance Criteria Latest version Latest version 3.2a – Latest Available Latest Available Latest Available 1.4 Acronyms and Abbreviations and Definitions The following abbreviations and notations are used in this document: Term Definition Analogue Test Set of tests that check the Radio Frequency characteristics of the hardware and software/firmware of the PCD against the EMV Specifications. Device Test Environment Part of the Test Environment needed to perform the PCD Type Approval Test, which the Vendor needs to develop and submit to the Testing Laboratory at the same time as the Samples. DUT EMV – TEST PICC Device Under Test A PICC simulator used for EMV testing [ISO/IEC 10373-6] Calibration Coil 1 Hardware device used to measure Reset and Power Off functions. Landing Plane The designated surface area of a PCD where a user should place a PICC to obtain a successful transaction. LOOPBACK Application Test application that the vendor needs to develop and implement in the Device Test Environment. LOOPBACK mode LOOPBACK involves cycling back information in a channel. Any data transmitted through such a channel is immediately received by the same channel. A device is in loopback mode after such a mode has been activated. Operating Volume The 3-dimensional space in which the PCD shall reliably communicate with a PICC by means of a magnetic field. PCD Type Approval Acknowledgment by EMVCo that a specified PCD within a specified Contactless Product has demonstrated sufficient conformance to the EMV Specification. Product Provider Entity that submits the product for Type Approval. Presentation Plane The plane on the PICC that faces the DUT. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 3/69 Term Proximity Coupling Device (PCD) Proximity Integrated Circuit Card (PICC) Test Bench Test Case Testing Laboratory Test Report Definition A hardware device that uses inductive coupling to provide power to the PICC and exchange data with the PICC. A hardware device containing an integrated circuit and capable of inductive coupling in the proximity of a coupling device. A specific test bench as described in the EMVCo Contactless Type Approval: PCD Analogue Test Bench and Test Case Requirements manual. Test to verify a requirement at a specific position in the Operating Volume. A facility recognised by EMVCo for performing EMV Contactless testing of the analogue interface for PICCs and PCDs. Document provided by the Testing Laboratory containing the Test results. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r 2 Generic guidelines Page 4/69 2.1 Device Under Test (DUT) The Device Under Test (DUT) consists of the Reduced Range PCD to be evaluated. The DUT shall be submitted along with a Device Testing Environment compliant with requirements described in [DTE] with following exceptions: • TRANSAC_A command is not mandatory • TRANSAC_B command is not mandatory • Interoperability Loopback Application: this function is not mandatory if the Interoperability tests with PTP mobiles can be performed using the EMVCo COTS Interoperability Application defined in section 5.1 2.2 Testing Conditions The DUT shall be tested in the following conditions: • If the DUT is powered by a battery: o The DUT shall not be plugged to a charger. o After DUT battery has been charged, the tests shall begin at least 15 minutes after the charger is unplugged. o The DUT battery level shall remain higher than 50% during the whole test session. • If the DUT has a display, the display shall always be on during testing. • The default configuration of a slide, flip or swivel DUT shall be open as for normal usage • The DUT shall be provided with a Reference Mark representing the centre of the Operating Volume and a clear identification of the landing plane (as defined in the [L1 RR ICS]). 2.3 Forms The Product Provider must submit a completed [L1 RR ICS] to the test laboratory. 2.4 Applicable Test Plans The Reduced Range PCD Level 1 Testing is based on the EMV CL PCD Level 1 Test Plans: [EMV CL PCD ANA TC], [EMV CL PCD DIG TC] and [EMV CL PCD INTEROP TR], including the corresponding Type Approval Communications (TTA Communications) unless stated otherwise. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 5/69 The specific dispositions for Analogue testing are described in section 3 of this document. The specific dispositions for the Digital testing are described in section 4 of this document. The specific dispositions for the Interoperability testing are described in section 5 of this document. 2.5 DUT Positioning The Device Under Test positioning information are defined in [L1 RR ICS]: • Reference Mark. • Landing Plane. • φ = 0 axis. 2.5.1 Landing Plane definition The Landing Plane of the Device Under Test shall be defined as the closest plan from Reference Mark where at least 5 out of 9 test positions can be tested at z=0cm (refer to Table 3-3 and Table 3-4) with the EMV – TEST PICCs during Analogue tests. The Landing plane shall be parallel to the product surface. 2.5.2 Origin of the Operating Volume In case the Reference Mark is not on the Landing Plane, the projection of the Reference Mark on the Landing Plane shall be used as origin of the Operating Volume during Testing (position (0,0,0) of the Operating Volume). Otherwise the Reference Mark shall be used as origin of the Operating Volume. Note: In case the DUT is provided with a Contactless Symbol, the Reference Mark shall be positioned on the centre of the Contactless Symbol, and the φ=0 axis shall be defined as specified in [EMV CL PCD ANA TC]. 2.5.3 Test Antenna positioning In order to avoid DUT positioning inconsistencies between laboratories, the following rules must be followed: • The Test Antenna used for Testing (EMV – TEST PICCs, Calibration Coil or PTP Devices) must be presented to the DUT on the side of the Reference Mark. • The Landing Plane of the Test Antenna shall remain parallel to the DUT Landing Plane during Testing. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 6/69 Figure 2-1—Relative Positioning of DUT and Test Antennas © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r 3 Analogue Guidelines Page 7/69 3.1 Positioning Convention The position of the PICC is described with the coordinates of the Presentation Plan (z, r, φ) converted to a position label (z, r, f) using simple identifiers. For Reduced Range PCD testing new positions are defined: Two new z values (z=0,5 cm and z= 1,5 cm) and one r value ( r=7.5 mm) are defined. Table 3-1 shows the relationship between the coordinate z and the z identifier for label points: Value of Coordinate z 0 mm 5 mm 10 mm 15 mm 20 mm 30 mm 40 mm Value of z Identifiers for Label Points 0 0’ 1 1’ 2 3 4 Table 3-1—z Values and Associated z Identifiers Table 3-2 shows the relationship between the coordinate r and the r identifier for label points: Value of Coordinate r 0 mm 7.5 mm 15 mm 25 mm Value of r Identifiers for Label Points 0 0’ 1 2 Table 3-2—r Values and Associated r Identifiers © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 8/69 Figure 3-1 shows the different identifiers corresponding to the label points in a plane of the target position for a given value of z with respect to the Landing Plane of the Product Under Test. Figure 3-1— Label Points in a Plane of the Target Position 3.2 Analogue Test Procedure updates As specified in Section 2.1, the TRANSAC_A and TRANSAC_B commands are not mandatory for Reduced Range PCD testing. As a consequence : • For the following Type B Test cases, the testing procedure is updated. o TB121.x.y.z00 o TB122.x.y.z00 o TB123.x.y.z00 o TB124.x.y.z00 o TB125.x.y.z00 o TB126.x.y.z00 o TB127.x.y.z00 The TRANSAC_B command used to perform the waveform measurements shall be replaced by WUPB command (or LOOPBACK command). Consequently the requested measurements are performed only on one command (WUPB) • For the following Type A Test cases, the testing procedure is updated. o TA121.x.y.z00 © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 9/69 o TA122.x.y.z00 o TA123.x.y.z00 o TA124.x.y.z00 o TA125.x.y.z00 o TA127.x.y.z00 o TA128.x.y.z00 o TA129.x.y.z00 The TRANSAC_A command used to perform the waveform measurements shall be replaced by WUPA command (or LOOPBACK command). Consequently the requested measurements are performed only on one command (WUPA) 3.3 Analogue Test Positions updates The following analogue guidelines are applicable for the test of Reduced Range PCDs. All PCD Analogue Test Cases shall be performed according to [EMV CL PCD ANA TC] specification. The following modifications shall be applied to the test plan. 3.3.1 Analogue Test Positions for Reduced Range 1 Analogue Testing shall be performed up to 2 cm on the Reduced Range 1. All test positions for z = 3cm and z = 4cm shall be omitted. As a consequence the following Test Cases shall not be performed: • TA132.x.1.zrf • TA134.x.1.zrf • TA136.x.1.zrf • TA138.x.1.zrf • TB132.x.1.zrf • TB134.x.1.zrf • TB136.x.1.zrf • TB138.x.1.zrf In addition for the following Test Cases, the test positions defined in [EMV CL PCD ANA TC] shall be replaced by the test positions defined in table below: Test Code TAB111 Description Verifying the PCD to PICC Power Transfer Test Positions (0,0,0); (0,0’,0); (0,0’,3); (0,0’,6); (0,0’,9); (0,1,0); (0,1,3); (0,1,6); (0,1,9) (0’,0,0); (0’,0’,0); (0’,0’,3); (0’,0’,6); (0’,0’,9); (0’,1,0); (0’,1,3); (0’,1,6); (0’,1,9) (1,0,0); (1,0’,0); (1,0’,3); (1,0’,6); (1,0’,9); (1,1,0); (1,1,3); (1,1,6); (1,1,9); (1,2,0); (1,2,3); (1,2,6); (1,2,9) © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 10/69 Test Code TAB112 TAB113 TAB114 TAB115 TAB116 TAB117 TA121 to TA129 TA131 TA133 TA135 TA137 TA132 TA134 TA136 TA138 TA139 Description Verifying the PCD Carrier Frequency Verifying the PCD Operating Field Resetting Verifying the PCD Power-Off of the Operating Field Polling sequence when supporting other technologies Verifying the Suspend of PCD Operating Field Verifying the PCD Phase Drift PCD to PICC Signal Interface for Type A Communications Verifying the Load Modulation VS1,pp in Type A Verifying the Load Modulation VS2,pp in Type A Verifying the FDTA,PICC tolerance Test Positions (1’,0,0); (1’,0’,0); (1’,0’,3); (1’,0’,6); (1’,0’,9); (1’,1,0); (1’,1,3); (1’,1,6); (1’,1,9); (1’,2,0); (1’,2,3); (1’,2,6); (1’,2,9) (2,0,0); (2,0’,0); (2,0’,3); (2,0’,6); (2,0’,9); (2,1,0); (2,1,3); (2,1,6); (2,1,9); (2,2,0); (2,2,3); (2,2,6); (2,2,9) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0,0,0) (1,0,0) (2,0,0) (0,0,0); (0,0’,0); (0,0’,3); (0,0’,6); (0,0’,9); (0,1,0); (0,1,3); (0,1,6); (0,1,9) (0’,0,0); (0’,0’,0); (0’,0’,3); (0’,0’,6); (0’,0’,9); (0’,1,0); (0’,1,3); (0’,1,6); (0’,1,9) (1,0,0); (1,0’,0); (1,0’,3); (1,0’,6); (1,0’,9); (1,1,0); (1,1,3); (1,1,6); (1,1,9); (1,2,0); (1,2,3); (1,2,6); (1,2,9) (1’,0,0); (1’,0’,0); (1’,0’,3); (1’,0’,6); (1’,0’,9); (1’,1,0); (1’,1,3); (1’,1,6); (1’,1,9); (1’,2,0); (1’,2,3); (1’,2,6); (1’,2,9) (2,0,0); (2,0’,0); (2,0’,3); (2,0’,6); (2,0’,9); (2,1,0); (2,1,3); (2,1,6); (2,1,9); (2,2,0); (2,2,3); (2,2,6); (2,2,9) N/T (0’,0,0) © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 11/69 Test Code TA141 TA142 TA143 TA151 TB121 to TB127 TB131 TB133 TB135 TB137 Description Verifying the PCD Transmitted Bit Rate Verifying the Bit Coding and Desynchronization of PCD to PICC Verifying the Bit Coding and Desynchronization PICC to PCD Verifying the PCD IQ Demodulation PCD to PICC Signal Interface for Type B Communications Verifying the Load Modulation VS1,pp in Type B Test Positions (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0,0,0) (1,0,0) (2,0,0) (0,0,0); (0,0’,0); (0,0’,3); (0,0’,6); (0,0’,9); (0,1,0); (0,1,3); (0,1,6); (0,1,9) (0’,0,0); (0’,0’,0); (0’,0’,3); (0’,0’,6); (0’,0’,9); (0’,1,0); (0’,1,3); (0’,1,6); (0’,1,9) (1,0,0); (1,0’,0); (1,0’,3); (1,0’,6); (1,0’,9); (1,1,0); (1,1,3); (1,1,6); (1,1,9); (1,2,0); (1,2,3); (1,2,6); (1,2,9) (1’,0,0); (1’,0’,0); (1’,0’,3); (1’,0’,6); (1’,0’,9); (1’,1,0); (1’,1,3); (1’,1,6); (1’,1,9); (1’,2,0); (1’,2,3); (1’,2,6); (1’,2,9) (2,0,0); (2,0’,0); (2,0’,3); (2,0’,6); (2,0’,9); (2,1,0); (2,1,3); (2,1,6); (2,1,9); (2,2,0); (2,2,3); (2,2,6); (2,2,9) TA132 TA134 TA136 TA138 TB141 TB142 TB145 TB147 TB148 TB151 Verifying the Load Modulation N/T VS2,pp in Type A Verifying the PCD Transmitted Bit Rate Verifying the Synchronization, Bit Coding and De-synchronization of PCD to PICC Verifying the Maximum Limit Desynchronization PICC to PCD (tFSOFF, MAX) Verifying the Bit Boundaries with Type B Communications Verifying the Minimum Limit DeSynchronization PICC to PCD (tFSOFF, MIN) Verifying the PCD IQ Demodulation (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) Table 3-3— Reduced Range 1 Analogue Test position Updates © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Refer to Annex C for more details on Analogue Test Plan. Page 12/69 3.3.2 Analogue Test Positions for Reduced Range 2 For the following Test Cases, the test positions defined in [EMV CL PCD ANA TC] shall be replaced by the test positions defined in table below: Test Code TAB111 TAB112 TAB113 TAB114 TAB115 TAB116 TAB117 Description Verifying the PCD to PICC Power Transfer Verifying the PCD Carrier Frequency Verifying the PCD Operating Field Resetting Verifying the PCD Power-Off of the Operating Field Polling sequence when supporting other technologies Verifying the Suspend of PCD Operating Field Verifying the PCD Phase Drift Test Positions (0,0,0); (0,0’,0); (0,0’,3); (0,0’,6); (0,0’,9); (0,1,0); (0,1,3); (0,1,6); (0,1,9) (0’,0,0); (0’,0’,0); (0’,0’,3); (0’,0’,6); (0’,0’,9); (0’,1,0); (0’,1,3); (0’,1,6); (0’,1,9) (1,0,0); (1,0’,0); (1,0’,3); (1,0’,6); (1,0’,9); (1,1,0); (1,1,3); (1,1,6); (1,1,9); (1,2,0); (1,2,3); (1,2,6); (1,2,9) (1’,0,0); (1’,0’,0); (1’,0’,3); (1’,0’,6); (1’,0’,9); (1’,1,0); (1’,1,3); (1’,1,6); (1’,1,9); (1’,2,0); (1’,2,3); (1’,2,6); (1’,2,9) (2,0,0); (2,0’,0); (2,0’,3); (2,0’,6); (2,0’,9); (2,1,0); (2,1,3); (2,1,6); (2,1,9); (2,2,0); (2,2,3); (2,2,6); (2,2,9) (3,0,0); (3,1,0); (3,1,3); (3,1,6); (3,1,9); (3,2,0); (3,2,3); (3,2,6); (3,2,9) (4,0,0); (4,1,0); (4,1,3); (4,1,6); (4,1,9) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 13/69 Test Code TA131 TA133 TA135 TA137 Description Verifying the Load Modulation VS1,pp in Type A Test Positions (0,0,0); (0,0’,0); (0,0’,3); (0,0’,6); (0,0’,9); (0,1,0); (0,1,3); (0,1,6); (0,1,9) (0’,0,0); (0’,0’,0); (0’,0’,3); (0’,0’,6); (0’,0’,9); (0’,1,0); (0’,1,3); (0’,1,6); (0’,1,9) (1,0,0); (1,0’,0); (1,0’,3); (1,0’,6); (1,0’,9); (1,1,0); (1,1,3); (1,1,6); (1,1,9); (1,2,0); (1,2,3); (1,2,6); (1,2,9) (1’,0,0); (1’,0’,0); (1’,0’,3); (1’,0’,6); (1’,0’,9); (1’,1,0); (1’,1,3); (1’,1,6); (1’,1,9); (1’,2,0); (1’,2,3); (1’,2,6); (1’,2,9) (2,0,0); (2,0’,0); (2,0’,3); (2,0’,6); (2,0’,9); (2,1,0); (2,1,3); (2,1,6); (2,1,9); (2,2,0); (2,2,3); (2,2,6); (2,2,9) TA132 TA134 TA136 TA138 TA139 TA141 TA142 TA143 TA151 Verifying the Load Modulation VS2,pp in Type A (3,0,0); (3,1,0); (3,1,3); (3,1,6); (3,1,9); (3,2,0); (3,2,3); (3,2,6); (3,2,9) (4,0,0); (4,1,0); (4,1,3); (4,1,6); (4,1,9) Verifying the FDTA,PICC tolerance Verifying the PCD Transmitted Bit Rate Verifying the Bit Coding and Desynchronization of PCD to PICC Verifying the Bit Coding and Desynchronization PICC to PCD Verifying the PCD IQ Demodulation (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 14/69 Test Code TB131 TB133 TB135 TB137 Description Verifying the Load Modulation VS1,pp in Type B Test Positions (0,0,0); (0,0’,0); (0,0’,3); (0,0’,6); (0,0’,9); (0,1,0); (0,1,3); (0,1,6); (0,1,9) (0’,0,0); (0’,0’,0); (0’,0’,3); (0’,0’,6); (0’,0’,9); (0’,1,0); (0’,1,3); (0’,1,6); (0’,1,9) (1,0,0); (1,0’,0); (1,0’,3); (1,0’,6); (1,0’,9); (1,1,0); (1,1,3); (1,1,6); (1,1,9); (1,2,0); (1,2,3); (1,2,6); (1,2,9) (1’,0,0); (1’,0’,0); (1’,0’,3); (1’,0’,6); (1’,0’,9); (1’,1,0); (1’,1,3); (1’,1,6); (1’,1,9); (1’,2,0); (1’,2,3); (1’,2,6); (1’,2,9) (2,0,0); (2,0’,0); (2,0’,3); (2,0’,6); (2,0’,9); (2,1,0); (2,1,3); (2,1,6); (2,1,9); (2,2,0); (2,2,3); (2,2,6); (2,2,9) TB132 TB134 TB136 TB138 TB141 TB142 TB145 TB147 TB148 TB151 Verifying the Load Modulation VS2,pp in Type A (3,0,0); (3,1,0); (3,1,3); (3,1,6); (3,1,9); (3,2,0); (3,2,3); (3,2,6); (3,2,9) (4,0,0); (4,1,0); (4,1,3); (4,1,6); (4,1,9) Verifying the PCD Transmitted Bit Rate Verifying the Synchronization, Bit Coding and De-synchronization of PCD to PICC Verifying the Maximum Limit Desynchronization PICC to PCD (tFSOFF, MAX) Verifying the Bit Boundaries with Type B Communications Verifying the Minimum Limit DeSynchronization PICC to PCD (tFSOFF, MIN) Verifying the PCD IQ Demodulation (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) (0’,0,0) Table 3-4— Reduced Range 2 Analogue Test position Updates Refer to Annex C for more details on Analogue Test Plan. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 15/69 3.4 Analogue Testing Acceptance Criteria Specific Analogue Acceptance Criteria for Reduced Range PCDs are defined in TTA Bulletin 276. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r 4 Digital Guidelines for Approval Process Page 16/69 All PCD Digital Test Cases shall be performed according to [EMV CL PCD DIG TC]. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r 5 Interoperability Test Guidelines Page 17/69 All PCD Interoperability Test Cases shall be performed according to [EMV CL PCD INTEROP TR] specification. The following modifications shall be applied to the test plan: 5.1 PTP Devices used for Testing In addition to the PTP mobiles used in the PCD Interoperability Tests, PTP cards are added to the pool of PICCs to be used for Reduced Range PCD Interoperability tests. Please refer to Annex B for more information on cards positioning conventions. The cards used for Interoperability tests are loaded with real payment applications using specific transaction flows. Consequently a specific application shall be loaded on DUT to perform Interoperability tests with cards. EMVCo provides Laboratories with an Android test application allowing performing the Interoperability and Validation tests with PTP mobiles and PTP cards (EMVCo COTS Interoperability Application). This application is compatible with Android operating system (7.0 and later versions). Product Providers can also develop their own application following the requirements defined in [ITAR] 5.2 Interoperability Testing Reduced Range PCD Test Positions Interoperability Testing shall be performed with each PTP device (mobile and card) specified by EMVCo using an automatic positioning system to ensure accuracy of the test positions and movements. The automatic positioning system shall present the PTP device to the DUT once at each test position. The PTP device shall be presented to the DUT using two orientations:  = 0 and  = 3π/2 (Refer to [L1Spec] Annex B for definition of ). Note: A delay due to mobile operating system can occur during the generation by the COTS Interop test application of the Success Rate Indicator. It is recommended to ensure that test bench can detect Success Rate Indicator 500 ms after the card was removed from test position. 5.2.1 Reduced Range 1 The Figure 5-1 defined the test positions to be used for Reduced Range 1 Interoperability tests. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Z=0cm Z=0.5cm Z=1cm Page 18/69 Z=2cm Figure 5-1— Reduced Range 1 Interoperability Testing positions • There is a total of 56 test positions defined and 2 orientations. • The PTP devices shall be presented at each Test Position for a maximum duration of 2 seconds before being removed. 5.2.2 Reduced Range 2 The Figure 5-2 defined the test positions to be used for Reduced Range 2 Interoperability tests. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Z=0cm Z=1 cm Z=1.5 cm Page 19/69 Z=2cm Z=3cm Z=4 cm Figure 5-2— Reduced Range 2 Interoperability Testing positions • There is a total of 92 test positions defined and 2 orientations. • The PTP devices shall be presented at each Test Position for a maximum duration of 1.5 seconds before being removed. 5.3 Scores A Score (also named Success Rate in [EMV CL PCD INTEROP TR]) is calculated for each PTP device (PTP Card and PTP Mobile) using testing positions and associated weights defined in Annex D . It is basically the sum of the weights of testing positions where the © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 20/69 transactions worked divided by the sum of the weights of all tested positions in the considered operating volume. 5.4 Interoperability Testing Acceptance Criteria Specific Interoperability Acceptance Criteria for Reduced Range PCDs are defined in TTA Bulletin 276. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 21/69 Annex A Cases Updated Analogue Test This annex highlights changes to the PCD test cases. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 22/69 A.1 TA121.x.y.z00 Verifying the t1 Timing This test verifies that the time between V4 of the falling edge and V2 of the rising edge is within a given time t1. Test Code : TA121.x.y.z00 Revision: 3.0a Reference This test refers to requirement 3.3.2.1. EMV – TEST PICCs Use Table A-1 for the EMV – TEST PICCs to be used during this test case: Value for x EMV – TEST PICCs to be used 1 EMV – TEST PICC 1 2 EMV – TEST PICC 2 3 EMV – TEST PICC 3 Table A-1— EMV – TEST PICCs for Test TA121.x.y.zrf Load to be used Use Table A-2 for the EMV – TEST PICC loads to be used during this test case : Value for y EMV – TEST PICC Loads to be used 2 HLZ 3 LLZ Table A-2— EMV – TEST PICC Loads for Test TA121.x.y.zrf Test Positions Use Table A-3 for the test positions to be used during this test case: Value for z Value for r Value for f 0 0 0 1 0 0 2 0 0 3 0 0 4 0 0 Table A-3—Test Positions of Test TA121.x.y.z00 Procedure Follow this procedure to verify the time t1 between V4 of the falling edge and V2 of the rising edge. 1. Connect the output J9 of the first EMV – TEST PICC of Table A-1 to the low-pass filter input. Connect the low-pass filter output to the input J8 of the EMV – TEST CMR. Connect the output J4 of the EMV – TEST CMR to the CH0 input of the Acquisition Device. 2. Display the TTA L1 - Analogue menu using the DTE. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 23/69 3. Make sure that there is no modulation applied to input J2 of the EMV – TEST PICC. 4. Configure the EMV – TEST PICC with the first load defined in Table A-2. 5. Place the EMV – TEST PICC in the first position defined in Table A-3. 6. Make sure that the CARRIER is switched on and set the PCD under test in TRANSAC_AWUPA mode. 7. Set the Acquisition Device to capture 50 ms 100 µs of the PCD signal starting just before the first WUPA command sent by the PCD. 8. Optimize the Acquisition Device settings for accurate measurement of waveform level and timing. 9. Launch the acquisition. 10. Measure, using a cursor or its equivalent, the upper level amplitude V1 preceding the first falling edge of the PCD command. 11. Calculate V4 as equal to 0.9 × V1 and place a Y-cursor (or its equivalent) to determine the corresponding level. 12. Measure V2 as equal to 0.05 × V1 and place a Y-cursor (or its equivalent) to determine the corresponding level. 13. Place an X-cursor (or its equivalent) to determine the time where the PCD carrier envelope crosses V4 for the first time as the carrier envelope decays. 14. Place an X-cursor (or its equivalent) to determine the time where the PCD carrier crosses cursor V2 for the first time as the carrier envelope increases (excluding any temporary increase above V2 due to ringing). 15. Determine the timing t1, when V decreases through V4 to when V increases through V2, as the difference between the times identified by the two X-cursors. 16. Repeat steps 10 to 15 for all PCD commands. 17.16. Repeat steps 8 to 16 15 for all positions defined in Table A-3. 18.17. Repeat steps 4 to 17 16for all EMV – TEST PICC loads defined in Table A-2. 19.18. Repeat steps 1 to 18 17 for all EMV – TEST PICCs of Table A-1. Acceptance Criteria V shall decrease from V4 to less than V2 and subsequently increase to greater than V2 in time interval t1. The time interval t1 shall conform to the values shown in Table A.2 in Appendix A of [EMV CL PCD ANA TC]. Expected Results Results for each position including the minimum, maximum and average of all measurements performed (i.e. the sum of all results at the concerned position divided by the number of results) are is recorded with one of two statements: • Pass message © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 24/69 • Fail message including a list of all failed conditions and reference details of the acceptance criterion not met. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 25/69 A.2 TA122.x.y.z00 Verifying the Monotonic Decrease from V4 to V2 This test verifies the monotonic decrease of V from V4 to less than V2. Test Code : TA122.x.y.z00 Revision: 3.0a Reference This test refers to requirement 3.3.2.1. EMV – TEST PICCs Use Table A-4 for the EMV – TEST PICCs to be used during this test case : Value for x EMV – TEST PICCs to be used 1 EMV – TEST PICC 1 2 EMV – TEST PICC 2 3 EMV – TEST PICC 3 Table A-4— EMV – TEST PICCs for Test TA122.x.y.z00 EMV – TEST PICC Loads Use Table A-5 for the EMV – TEST PICC loads to be used during this test case : Value for y EMV – TEST PICC Loads to be used 2 HLZ 3 LLZ Table A-5—EMV – TEST PICC Loads for Test TA122.x.y.z00 Test Positions Use Table A-6 for the test positions to be used during this test case: Value for z Value for r Value for f 0 0 0 1 0 0 2 0 0 3 0 0 4 0 0 Table A-6—Test Positions of Test TA122.x.y.z00 Procedure Follow this procedure to verify that the monotonic decrease of V is from V4 to less than V2: 1. Connect the output J9 of the first EMV – PICC of Table A-4 to the low-pass filter input. Connect the low-pass filter output to the input J8 of the EMV – TEST CMR. Connect the output J4 of the EMV – TEST CMR to the CH0 input of the Acquisition Device. 2. Display the TTA L1 - Analogue menu using the DTE. 3. Make sure that there is no modulation applied to input J2 of the EMV – TEST PICC. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 26/69 4. Configure the EMV – TEST PICC with the first load defined in Table A-5. 5. Place the EMV – TEST PICC in the first position defined in Table A-6. 6. Make sure that the CARRIER is switched on and set the PCD under test in TRANSAC AWUPA mode 7. Set the Acquisition Device to capture 100 µs 50 ms of the PCD signal starting just before the first WUPA command sent by the PCD. 8. Optimize the Acquisition Device settings for accurate measurement of waveform level and timing. 9. Launch the acquisition. Figure A-3 shows a typical waveform envelope display: Figure A-3—Non Monotonic Decrease 10. Measure, using a cursor or its equivalent, the upper level amplitude V1 preceding the first falling edge of the PCD command. 11. Calculate V4 as equal to 0.9 × V1 and place a Y-cursor (or its equivalent) to determine the corresponding level. 12. Calculate V2 as equal to 0.05 × V1 and place a Y-cursor (or its equivalent) to determine the corresponding level. 13. Determine when the PCD carrier envelope decreases through V4 on the first falling edge. 14. Determine when the PCD carrier envelope decreases through V2 on the first falling edge. 15. Observe V decreasing from V4 to less than V2 on the first falling edge on the PCD carrier envelope. If the carrier envelope decreases continuously between V4 and V2, go to step 17. Otherwise go to step 16. 16. Measure (using cursors or their equivalents) the time elapsed between a local maximum value and the previous time that this value was reached. This elapsed time shall be © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 27/69 identified as t5. This shall only apply if the local maximum is greater than V2. See Figure A-3 for details. 17. Repeat steps 10 to 16 for all PCD commands. 18.17. Repeat steps 8 to 167 for all positions defined in Table A-6. 19.18. Repeat steps 4 to 178 for all EMV – TEST PICC loads defined in Table A-5. 20.19. Repeat steps 1 to 189 for all EMV – TEST PICCs of Table A-4. Acceptance Criteria If V does not decrease monotonically, the time t5 between a local maximum and the time of passing the same value before the local maximum shall conform to appropriate values shown in Appendix A of [EMV CL PCD ANA TC]. When multiple t5 times happen within one signal decrease period, each individual t5 time shall conform to appropriate values shown in Appendix A of [EMV CL PCD ANA TC]. Expected Results Results for each position including the minimum, maximum and average of all measurements performed (i.e. the sum of all results at the concerned position divided by the number of results) areis recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance criterion not met. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 28/69 A.3 TA123.x.y.z00 Verifying the Ringing This test verifies the ringing following the falling edge, where the falling edge is the part of the envelope V, where V decreases from V4 to V2. Test Code : TA123.x.y.z00 Revision: 3.0a Reference This test refers to requirement 3.3.2.1. EMV – TEST PICCs Use Table A-7 for the EMV – TEST PICCs to be used during this test case: Value for x EMV – TEST PICCs to be used 1 EMV – TEST PICC 1 2 EMV – TEST PICC 2 3 EMV – TEST PICC 3 Table A-7—EMV – TEST PICCs for Test TA123.x.y.z00 EMV – TEST PICC Loads Use Table A-8 for the EMV – TEST PICC loads to be used during this test case: Value for y EMV – TEST PICC Loads to be used 2 HLZ 3 LLZ Table A-8—EMV – TEST PICC Loads for Test TA123.x.y.z00 Test Positions Use Table A-9 for the test positions to be used during this test case: Value for z Value for r Value for f 0 0 0 1 0 0 2 0 0 3 0 0 4 0 0 Table A-9—Test Positions of Test TA123.x.y.z00 Procedure Follow this procedure to verify the ringing following the falling edge: 1. Connect the output J9 of the first EMV – TEST PICC of Table A-7 to the low-pass filter input. Connect the low-pass filter output to the input J8 of the EMV – TEST CMR. Connect the output J4 of the EMV – TEST CMR to the CH0 input of the Acquisition Device. 2. Display the TTA L1 - Analogue menu using the DTE. 3. Make sure that there is no modulation applied to input J2 of the EMV – TEST PICC. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 29/69 4. Configure the EMV – TEST PICC with the first load defined in Table A-8. 5. Place the EMV – TEST PICC in the first position defined in Table A-9. 6. Make sure that the CARRIER is switched on and set the PCD under test in TRANSAC_AWUPA mode. 7. Set the Acquisition Device to capture 100 µs 50 ms of the PCD signal starting just before the first WUPA command sent by the PCD. 8. Optimize the Acquisition Device settings for accurate measurement of waveform level and timing. 9. Launch the acquisition. Figure A-4 shows the acquired signal: Figure A-4—Acquired Signal 10. Measure, using a cursor or its equivalent, the upper level amplitude V1 preceding the first falling edge of the PCD command. 11. Calculate V2 as equal to 0.05 × V1 and place a Y-cursor (or its equivalent) to determine the corresponding level. 12. If there is no signal peak over the level V2, occurring after the carrier envelope has initially reached this level, then go to step 13. Otherwise, the maximum amplitude due to ringing of any peaks above level V2 and occurring after the carrier envelope has initially reached this level shall be measured (using cursors or their equivalents). 13. Repeat steps 10 to 12 for all PCD commands. 14.13. Repeat steps 8 to 13 12 for all positions defined in Table A-9. 15.14. Repeat steps 4 to 14 13 for all EMV – TEST PICC loads defined in Table A-8. 16.15. Repeat steps 1 to 15 14 for all EMV – TEST PICCs of Table A-7. Acceptance Criteria © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 30/69 When no ringing is observed, the result shall be “Pass”. When ringing is observed, the signal amplitude following the falling edge shall remain below VOU,A × V1. The falling edge is that part of the envelope V where V decreases from V4 to V2. See Appendix A of [EMV CL PCD ANA TC] for the appropriate values of VOU,A. Note: In case of Fail verdict, the test procedure defined in Appendix E of [EMV CL PCD ANA TC] shall be applied on the acquisitions that did not reach the acceptance criteria. If the verdict of the test defined in Appendix E of [EMV CL PCD ANA TC] is PASS, Laboratory shall change the verdict from FAIL to PASS* [PASS with a star]. The corresponding traces and measurement results shall be reported in appendix of the Test Report. Expected Results Results for each position including the minimum, maximum and average of all measurements performed (i.e. the sum of all results at the concerned position divided by the number of results) areis recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance criterion not met. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 31/69 A.4 TA124.x.y.z00 Verifying the t2 Timing This test verifies lower level timing during a Type A modulation. Test Code :TA124.x.y.z00 Revision: 3.0a Reference This test refers to requirement 3.3.2.1. EMV – TEST PICCs Use Table A-10 for the EMV – TEST PICCs to be used during this test case: Value for x EMV – TEST PICCs to be used 1 EMV – TEST PICC 1 2 EMV – TEST PICC 2 3 EMV – TEST PICC 3 Table A-10—EMV – TEST PICCs for Test TA124.x.y.z00 EMV – TEST PICC Loads Use Table A-11 for the EMV – TEST PICC loads to be used during this test case: Value for y EMV – TEST PICC Loads to be used 2 HLZ 3 LLZ Table A-11—EMV – TEST PICC Loads for Test TA124.x.y.z00 Test Positions Use Table A-12 for the test positions to be used during this test case: Value for z Value for r Value for f 0 0 0 1 0 0 2 0 0 3 0 0 4 0 0 Table A-12—Test Positions of Test TA124.x.y.z00 Procedure Follow this procedure to verify the t2 timing: 1. Connect the output J9 of the first EMV – TEST PICC of Table A-10 to the low-pass filter input. Connect the low-pass filter output to the input J8 of the EMV – TEST CMR. Connect the output J4 of the EMV – TEST CMR to the CH0 input of the Acquisition Device. 2. Display the TTA L1 - Analogue menu using the DTE. 3. Make sure that there is no modulation applied to input J2 of the EMV – TEST PICC. 4. Configure the EMV – TEST PICC with the first load defined in Table A-11. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 32/69 5. Place the EMV – TEST PICC at the first position defined in Table A-12. 6. Make sure that the CARRIER is switched on and set the PCD under test in TRANSAC_AWUPA mode. 7. Set the Acquisition Device to capture 100 µs 50 ms of the PCD signal starting just before the first WUPA command sent by the PCD. 8. Optimize the Acquisition Device settings for accurate measurement of waveform level and timing. 9. Launch the acquisition. 10. Measure, using a cursor or its equivalent, the upper level amplitude V1 preceding the first falling edge of the PCD command. 11. Calculate V2 as equal to 0.05 × V1 and place a Y-cursor (or its equivalent) to identify the corresponding level. 12. Place an X-cursor (or its equivalent) to identify the time where the PCD carrier envelope crosses V2 for the last time preceding the first rising edge. 13. Place an X-cursor (or its equivalent) to identify the time where the PCD carrier envelope crosses V2 for the first time as the carrier envelope increases. 14. Determine the timing t2 when V decreases through V2 to when V increases through V2 as the difference between the times identified by the two X-cursors. 15. Repeat steps 10 to 14 for all PCD commands. 16.15. Repeat steps 8 to 145 for all positions defined in Table A-12. 17.16. Repeat steps 4 to 156 for all EMV – TEST PICC loads defined in Table A-11. 18.17. Repeat steps 1 to 167 for all EMV – TEST PICCs of Table A-10. Acceptance Criteria V shall remain less than V2 for a time t2. The time interval t2 shall conform to appropriate values shown in in Appendix A of [EMV CL PCD ANA TC]. Expected Results Result s for each position including the minimum, maximum and average of all measurements performed (i.e. the sum of all results at the concerned position divided by the number of results) areis recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance criterion not met. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 33/69 A.5 TA125.x.y.z00 Verifying the t3 and t4 Timings This test verifies the increase of V from V2 to V4 within a given time t3 and from V2 to V3 within a given time t4. Test Code : TA125..x.y.z00 Revision: 3.0a Reference This test refers to requirement 3.3.2.1. EMV – TEST PICCs Use Table A-13 for the EMV – TEST PICCs to be used during this test case: Value for x EMV – TEST PICCs to be used 1 EMV – TEST PICC 1 2 EMV – TEST PICC 2 3 EMV – TEST PICC 3 Table A-13—EMV – TEST PICCs for Test TA125.x.y.z00 EMV – TEST PICC Loads Use Table A-14 for the EMV – TEST PICC loads to be used during this test case: Value for y EMV – TEST PICC Loads to be used 2 HLZ 3 LLZ Table A-14—EMV – TEST PICC Loads for Test TA125.x.y.z00 Test Positions Use Table A-15 for the test positions to be used during this test case: Value for z Value for r Value for f 0 0 0 1 0 0 2 0 0 3 0 0 4 0 0 Table A-15—Test Positions of Test TA125.x.y.z00 Procedure Follow this procedure to verify the increase of V from V2 to V4 within a given time t3 and the increase of V from V2 to V3 within a given time t4: 1. Connect the output J9 of the first EMV – TEST PICC of Table A-13 to the low-pass filter input. Connect the low-pass filter output to the input J8 of the EMV – TEST CMR. Connect the output J4 of the EMV – TEST CMR to the CH0 input of the Acquisition Device. 2. Display the TTA L1 - Analogue menu using the DTE. © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 34/69 3. Make sure that there is no modulation applied to input J2 of the EMV – TEST PICC. 4. Configure the EMV – TEST PICC with the first load defined in Table A-14. 5. Place the EMV – TEST PICC at the first position defined in Table A-15. 6. Make sure that the CARRIER is switched on and set the PCD under test in TRANSAC_AWUPA mode. 7. Set the Acquisition Device to capture 100 µs 50 ms of the PCD signal starting just before the first WUPA command sent by the PCD. 8. Optimize the Acquisition Device settings for accurate measurement of waveform level and timing. 9. Launch the acquisition. 10. Measure, using a cursor or its equivalent, the upper level amplitude V1 preceding the first falling edge of the PCD command. 11. Calculate V2 as equal to 0.05 × V1 and place a Y-cursor Y1 at the corresponding level. 12. Calculate V3 as equal to 0.6 × V1 and place a Y-cursor Y2 at the corresponding level. 13. Calculate V4 as equal to 0.9 × V1 and place a Y-cursor Y3 at the corresponding level. 14. Place an X-cursor X1 (or its equivalent) to identify the time where the PCD carrier envelope increases through V2. 15. Place an X-cursor X2 (or its equivalent) to identify the time where the PCD carrier envelope increases through V3. 16. Place an X-cursor X3 (or its equivalent) to identify the time where the PCD carrier envelope increases through V4. 17. Determine the timing t4 as the difference between the times identified by the X1 and X2 cursors. 18. Determine the timing t3 as the difference between the times identified by the X1 and X3 cursors. 19. Repeat steps 10 to 18 for all PCD commands. 20.19. Repeat steps 8 to 19 18 for all positions defined in Table A-15. 21.20. Repeat steps 4 to 20 19 for all EMV – TEST PICC loads defined in Table A-14. 22.21. Repeat steps 1 to 21 20 for all EMV – TEST PICCs of Table A-13. Acceptance Criteria V shall increase from V2 to V4 within a given time t3. V shall increase from V2 to V3 within a given time t4. The time intervals t3 and t4 shall conform to appropriate values shown in in Appendix A of [EMV CL PCD ANA TC]. . © 2024-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contactless Terminal Level 1 Type Approval Reduced Range PCD Level 1 Test Guidelines v3.2a.r Page 35/69 Expected Results Results for each position including the minimum, maximum and average of all measurements performed (i.e. the sum of all results at the concerned position divided by the number of results) are recorded w