EMV® Contact Terminal Level 1 Type Approval –IFM Mechanical and Electrical Test Cases

EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases Version 1.0a.r September 2025 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page i Legal Notice This document summarizes EMVCo’s present plans for evaluation services and related policies and is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. In the absence of such a written agreement, no product provider, test laboratory or any other third party should rely on this document, and EMVCo shall not be liable for any such reliance. No product provider, test laboratory or other third party may refer to a product, service or facility as EMVCo approved, in form or in substance, nor otherwise state or imply that EMVCo (or any agent of EMVCo) has in whole or part approved a product provider, test laboratory or other third party or its products, services, or facilities, except to the extent and subject to the terms, conditions and restrictions expressly set forth in a written agreement with EMVCo, or in an approval letter, compliance certificate or similar document issued by EMVCo. All other references to EMVCo approval are strictly prohibited by EMVCo. Under no circumstances should EMVCo approvals, when granted, be construed to imply any endorsement or warranty regarding the security, functionality, quality, or performance of any particular product or service, and no party shall state or imply anything to the contrary. EMVCo specifically disclaims any and all representations and warranties with respect to products that have received evaluations or approvals, and to the evaluation process generally, including, without limitation, any implied warranties of merchantability, fitness for purpose or noninfringement. All warranties, rights and remedies relating to products and services that have undergone evaluation by EMVCo are provided solely by the parties selling or otherwise providing such products or services, and not by EMVCo, and EMVCo will have no liability whatsoever in connection with such products and services. This document is provided "AS IS" without warranties of any kind, and EMVCo neither assumes nor accepts any liability for any errors or omissions contained in this document. EMVCO DISCLAIMS ALL REPRESENTATIONS AND WARRANTIES, EXPRESS OR IMPLIED, INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, TITLE AND NON-INFRINGEMENT, AS TO THIS DOCUMENT. EMVCo makes no representations or warranties with respect to intellectual property rights of any third parties in or in relation to this document. EMVCo undertakes no responsibility to determine whether any implementation of this document may violate, infringe, or otherwise exercise the patent, copyright, trademark, trade secret, know-how, or other intellectual property rights of third parties, and thus any person who implements any part of this document should consult an intellectual property attorney before any such implementation. Without limiting the foregoing, this document may provide for the use of public key encryption and other technology, which may be the subject matter of patents in several countries. Any party seeking to implement this document is solely responsible for determining whether its activities require a license to any such technology, including for patents on public key encryption technology. EMVCo shall not be liable under any theory for any party's infringement of any intellectual property rights in connection with this document. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page ii Revision Log – Version 1.0a.r The following changes have been made to the document since the publication of Version 1.0a. Some of the numbering and cross references in this version have been updated to reflect changes introduced by the published bulletins. The numbering of existing requirements did not change, unless explicitly stated otherwise. Incorporated changes described in the following Specification Updates and Bulletins • N/A Testing coverage improvements • N/A Other editorial changes • Editorial updates. Version 1.0a 1.0a.r Date December 2023 January 2025 Revision Description Alignment with new Specification structure and numbering Merged T.T.A. Comm. No.285, 3rd Edition into Test Cases Change in Test Case 1CB.013 regarding Renewals Editorial updates © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page iii Contents 1. Using this Manual .......................................................................................................... 1 1.1. Purpose ................................................................................................................. 1 1.2. Audience ................................................................................................................ 1 1.3. Reference Documents............................................................................................ 2 1.3.1. Standard Documents .................................................................................. 2 1.3.2. Specification Documents............................................................................. 2 1.4. Definitions .............................................................................................................. 3 1.5. Notational Conventions .......................................................................................... 4 1.6. Acronyms and Abbreviations.................................................................................. 4 1.7. Terminology and Conventions................................................................................ 7 1.8. Support .................................................................................................................. 7 2. General requirements.................................................................................................... 8 2.1. Testing Strategy ..................................................................................................... 8 2.1.1. Compliance Demonstration Objective ......................................................... 8 2.1.2. Device Under Test for Level 1 Approval ...................................................... 8 2.2. Test Tool Implementation Requirements ................................................................ 8 2.2.1. Physical compatibility requirements ............................................................ 8 2.2.2. Contact forces requirements ..................................................................... 11 2.2.3. Electrical signal generation requirements.................................................. 12 2.2.4. Electrical measurement requirements ....................................................... 13 2.2.5. Environmental monitoring requirements .................................................... 14 2.3. Test Conditions .................................................................................................... 14 2.3.1. Default environmental conditions .............................................................. 14 2.3.2. Reference ATRs ....................................................................................... 14 2.3.3. Loopback .................................................................................................. 15 2.3.4. Test Transaction ....................................................................................... 15 2.3.5. Testing of IFMs Powered by Batteries....................................................... 16 2.3.6. Test Case Naming Convention ................................................................. 17 3. Mechanical Test Cases................................................................................................ 18 3.1. 1CA.001.0x - Physical compatibility and contact location ..................................... 18 3.2. 1CA.002.00 – IFM Contact Forces ....................................................................... 19 4. Electrical Test Cases ................................................................................................... 20 4.1. Foreword.............................................................................................................. 20 4.2. 1CB.001.0x - Short circuit resilience..................................................................... 21 4.3. 1CB.002.00 - C6 isolation .................................................................................... 23 4.4. 1CB.003.0x - C6 voltage ...................................................................................... 24 4.5. 1CB.004.xx - I/O current....................................................................................... 25 4.6. 1CB.005.0x - I/O transmission voltage ................................................................. 27 4.7. 1CB.006.0x - I/O transmission rise and fall time ................................................... 29 4.8. 1CB.007.xx - I/O transmission signal perturbations .............................................. 31 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page iv 4.9. 1CB.008.xx - I/O reception voltage....................................................................... 33 4.10. 1CB.009.0x - I/O reception rise and fall times ...................................................... 35 4.11. 1CB.010.0x - CLK voltage .................................................................................... 37 4.12. 1CB.011.0x - CLK rise and fall times.................................................................... 38 4.13. 1CB.012.xx - CLK signal perturbations................................................................. 40 4.14. 1CB.013.0x - CLK frequency and duty cycle ........................................................ 42 4.15. 1CB.014.0x - RST voltage.................................................................................... 44 4.16. 1CB.015.0x - RST rise and fall times.................................................................... 45 4.17. 1CB.016.0x - RST signal perturbations ................................................................ 47 4.18. 1CB.017.xx - VCC voltage ..................................................................................... 49 4.19. 1CB.018.xx - Transients neutralization on VCC ................................................... 51 5. Card Session Test Cases ............................................................................................ 55 5.1. 1CC.001.0x - Contacts activation sequence......................................................... 55 5.2. 1CC.002.0x - Contacts deactivation sequence ..................................................... 57 5.3. 1CC.003.0x - Cold reset....................................................................................... 59 5.4. 1CC.004.0x - Warm reset..................................................................................... 60 Appendix A – Test Transaction contents........................................................................ 62 Appendix A.1 – T=0 Test Transaction ........................................................................... 62 Appendix A.2 – T=1 Test Transaction ........................................................................... 64 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page v Figures Figure 2-1 – Top view of the minimum dimensions probe ...........................................................9 Figure 2-2 – Side view of the minimum dimensions probe .........................................................9 Figure 2-3 – Top view of the maximum dimensions probe .......................................................10 Figure 2-4 – Side view of the maximum dimensions probe ......................................................10 Figure 2-5 – Top view of a contact pad for both probes ...........................................................11 Figure 4-1 – Definition of ICC spikes .......................................................................................53 Figure 5-1 – Contacts Activation Sequence .............................................................................56 Figure 5-2 – Contacts Deactivation Sequence.........................................................................58 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page vi Tables Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table 2-1 – Electrical signal generation requirements...............................................................12 2-2 – Electrical signal measurement requirements..........................................................13 2-3 – Environmental monitoring requirements.................................................................14 2-4 – Type Approval Tests environmental conditions ......................................................14 2-5 – Reference ATRs ....................................................................................................15 2-6 – Number of iterations in the loopback section..........................................................16 3-1 – Test conditions for 1CA.001.0x ..............................................................................18 4-1 – Test conditions for 1CB.001.0x ..............................................................................21 4-2 – Test conditions for 1CB.003.0x ..............................................................................24 4-3 – Test conditions for 1CB.004.0x ..............................................................................25 4-4 – Test conditions for 1CB.005.0x ..............................................................................27 4-5 – Test conditions for 1CB.006.0x ..............................................................................29 4-6 – Test conditions for 1CB.007.0x ..............................................................................32 4-7 – Test conditions for 1CB.008.0x ..............................................................................34 4-8 – Test conditions for 1CB.009.0x ..............................................................................35 4-9 – Test conditions for 1CB.010.0x ..............................................................................37 4-10 – Test conditions for 1CB.011.0x ............................................................................38 4-11 – Test conditions for 1CB.012.0x ............................................................................41 4-12 – Test conditions for 1CB.013.0x ............................................................................42 4-13 – Test conditions for 1CB.014.0x ............................................................................44 4-14 – Test conditions for 1CB.015.0x ............................................................................45 4-15 – Test conditions for 1CB.016.0x ............................................................................47 4-16 – Test conditions for 1CB.017.0x ............................................................................49 4-17 – Class A test conditions for 1CB.018.0x ................................................................52 4-18 – Class B test conditions for 1CB.018.0x ................................................................53 5-1 – Test conditions for 1CC.001.0x..............................................................................55 5-2 – Test conditions for 1CC.002.0x..............................................................................57 5-3 – Test conditions for 1CC.003.0x..............................................................................59 5-4 – Test conditions for 1CC.004.0x..............................................................................60 A-1 – T=0 Test Transaction ............................................................................................64 A-2 – T=1 Test Transaction ............................................................................................66 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 1 / 66 1. Using this Manual 1.1. Purpose EMVCo, LLC (“EMVCo”) is the owner of the EMV® Integrated Circuit Card Specification for Payment Systems (version 4.4), hereinafter called EMV® Specification. This specification is divided in 5 books: • The EMV® Level 1 Contact Interface Specification • Book 1: Application Independent ICC to Terminal Interface Requirements • Book 2: Security and Key Management • Book 3: Application Specification • Book 4: Cardholder, Attendant, and Acquirer Interface Requirements The document “EMV® Level 1 Specifications for Payment Systems – EMV Contact Interface Specification” describes the minimum functionality required of integrated circuit cards (ICCs) and terminals to ensure correct operation and interoperability independent of the application to be used. The Book 1 (Part II) and Book 2 define the complete flow of a transaction between an Integrated Circuit Card (ICC) and a terminal, from the selection of an application in the ICC to the completion of the transaction. The Book 3 defines the format of ICC commands used during the transaction flow between the ICC and terminal. Also defined is the transaction flow and associated data for an application compliant with the EMV specifications. Finally, the Book 4 defines the characteristics of a Terminal that supports an ICC conforming to the two previous specifications mentioned. The present document, “EMV® Terminal Type Approval – Level 1 Mechanical and Electrical Test Cases”, describes the Test Cases that, when applied to the IFM part of terminals, are designed to determine whether the IFM meets the mechanical and electrical requirements listed in the EMV® Contact Interface Specification. The Test Cases described cover only the IFM interface as defined in the ‘EMV® Type Approval – Terminal Level 1 – Administrative Process’ (See document [D11]), and test mechanical, electrical and answer to reset requirements. Testing of character transmission, T=0 protocol, and T=1 protocol requirements is described in a separate document. The Test Cases presented below do not cover the terminal/host interface (if present), general terminal functionality, or other regulatory requirements such as electrical safety or electromagnetic compatibility. The environment and conditions to be maintained during testing are defined in Section 2.3.1 below. If any special conditions are required for a specific test case, these conditions are described in the Test Case itself. 1.2. Audience This manual is provided to: • Testing laboratories recognized for performing the type approval tests • Terminal equipment vendors • Qualified auditors © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 2 / 66 A Testing Laboratory that wants to implement and run test cases described in the present document shall follow the rules defined in EMVCo ‘Terminal Level 1 Type Approval – Administrative Process’ document (See document [D11]). 1.3. Reference Documents EMV® documents are available on the EMVCo web site: https://www.emvco.com/document-search/ 1.3.1. Standard Documents Document [D01] ISO/IEC 17025:2017: General Requirements for the Competence of Calibration and Testing Laboratories Version Issue Date 2017 [D02] ISO/IEC Guide 98-3:2008: Uncertainty of measurement ─ Part 3 ─ Guide 2008 to the expression of uncertainty in measurement, ISO/IEC, corrected version 2011. [D03] ISO/IEC 7816 (15 parts): Identification cards – Integrated circuit cards 1988 - 2021 [D04] ISO 5725 (6 parts): Accuracy (trueness and precision) of measurements methods and results. 1994 - 2020 [D05] IEEE Standard on transitions, Pulses and related Waveforms, IEEE Std 181-2011. 2011 1.3.2. Specification Documents Document [D06] EMV® Level 1 Specifications for Payment Systems – EMV Contact Interface Specification [D07] SB284 “Contact – Clarification for Procedure Byte Use” EMV® Specification Bulletin No.284 [D08] SB298 “Contact – Clarification of Terminal Timing for Consecutive Characters” EMV® Specification Bulletin No.298 Version Issue Date Version 1.0, October 2022 1st Edition March 2023 1st Edition September 2023 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 3 / 66 Document [D09] EMV® Contact Terminal Level 1 Type Approval ─ Loopback Upper Tester Specification [D10] EMV® Contact Terminal Level 1 Type Approval – IFM Protocol Test Cases [D11] EMV® Contact Terminal Level 1 Type Approval ─ Administrative Process Version Issue Date Version 1.0a December 2023 Version 1.0a, December 2023 Version 4.3d December 2021 1.4. Definitions In addition of terms already defined in the reference documentation, the following terms are used in this document: Term Acceptance Testing EMV® Compatible EMV® Compliant Protocol Tests Sample Test Bench Test Case Test Code Test Tool Test Tool Provider Testing Laboratory Test Report Transaction Definition Set of procedures and tests to perform for the qualification of a Test Tool or Test Bench. An ATR is EMV® compatible when it shall be accepted by at least one generation of EMV® terminals. An ATR is EMV® compliant when it complies with the specification documents. A defined set of tests that checks the software responsible for the data exchange between ICC and IFM. A physical implementation of an ICC or an IFM (design), delivered to the Testing Laboratory for the test. A system designed to perform the Test Cases described in this document. A test to verify a defined subset of the requirements under specific test conditions. The code identifying a Test Case. A generic system design integrating equipment and software in order to fulfil the requirements and provide the capabilities described in this document. A commercial entity recognized by EMVCo for providing Contact IFM Test Tools to Testing Laboratories. A facility recognized by EMVCo for performing EMV Type Approval testing of IFMs. Document provided by the Testing Laboratory containing the Test results. A sequence of logic interactions that the ICC and the Terminal shall execute as foreseen by the EMV application. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 4 / 66 Trigger delay Property of a digitizing circuit to not follow immediately the input signal changes that are shorter than the Trigger Delay, so that less switching is generated. 1.5. Notational Conventions The following abbreviations and notations are used in this document: Notation xx Value Description 1.6. Acronyms and Abbreviations Abbreviation εΩ ε% εA εHz εN εs εV εVV µA µs Ω AC ADC APDU ATR BGT BWI BWT C-APDU CIN Definition Resistance Measurement Uncertainty of the Test Tool equipment Duty Cycle Measurement Uncertainty of the Test Tool equipment Current Measurement Uncertainty of the Test Tool equipment Frequency Measurement Uncertainty of the Test Tool equipment Force Measurement Uncertainty of the Test Tool equipment Time Measurement Uncertainty of the Test Tool equipment Absolute Voltage Measurement Uncertainty of the Test Tool equipment Voltage Measurement Uncertainty of the Test Tool Equipment for Voltages that are a Function of VCC Microampere or 10-6 A Microsecond or 10-6 s Ohm Alternating Current Analogue-Digital Conversion Application Protocol Data Unit Answer To Reset Block Guard Time Block Waiting Time Integer Block Waiting Time Command APDU Input Capacitance © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Abbreviation CLA CLK C-TPDU CWI CWT DAD DC DUT EDC Etu f fi GND ICC ICC ICLK ICS IIO IRST ID-1 IFD IFM IFS IFSC IFSD IFSI IIH IIL INF INS IUT I/O IOH IOL Definition Class Byte of the Command Message Clock Command TPDU Character Waiting Time Integer Character Waiting Time Destination Node Address Direct Current Device Under Test Error Detection Code Elementary Time Unit Frequency Average Frequency for the ith Monitoring Interval Ground Integrated Circuit card Current on the VCC contact Current on the CLK contact Implementation Conformance Statement Current on the I/O contact Current on the RST contact Identification Card Format Interface Device Interface Module Information Field Size Information Field Size for the ICC Information Field Size for the Terminal Information Field Size Integer High Level Input Current Low Level Input Current Information Field Instruction Byte of Command Message Implementation Under Test Input/Output High Level Output Current Low Level Output Current Page 5 / 66 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 6 / 66 Abbreviation ISO Lc Le Licc LEN Lr MΩ mA max. MHz min. mm LT N NAD NAK ns P1 P2 P3 PCB PCO pF R-APDU R-block RH RST R-TPDU S-block SI SUT SW1 SW2 Definition International Organization for Standardization Exact Length of Data Sent by the TAL in a Case 3 or 4 Command Maximum Length of Data Expected by the TAL in Response to a Case 2 or 4 Command Exact Length of Data Available in the ICC to be Returned in Response to the Case 2 or 4 Command Received by the ICC Length Length of Response Data Field Megohm or 106 Ω Milliampere or 10-3 A Maximum Megahertz or 106 Hz Minimum Millimeter or 10-3 m Lower tester Newton Node Address Negative Acknowledgment Nanosecond or 10-9 s Parameter 1 Parameter 2 Parameter 3 Protocol Control Byte Point of Control and Observation Picofarad or 10-12 F Response APDU Receive Ready Block Relative Humidity Reset Response TPDU Supervisory Block International System of Units Standard System Under Test Status Word 1 Status Word 2 © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 7 / 66 Abbreviation TB TCK tF TPDU tR TTL UT V VCC VCC VIH VIL VOH VOL Vpp WI WTX Test Bench Definition Check Character Fall Time Between 90% and 10% of Signal Amplitude Transport Protocol Data Unit Rise Time Between 10% and 90% of Signal Amplitude Terminal Transport Layer Upper Tester Volt Voltage Measured between VCC and GND Contacts Supply Voltage High Level Input Voltage Low Level Input Voltage High Level Output Voltage Low Level Output Voltage Volts Peak to Peak Waiting Time Integer Waiting Time Extension All units in this document follow the International System of Units (SI) standard. 1.7. Terminology and Conventions The following words are used often in this specification and have a specific meaning: Shall Defines a product or system capability which is mandatory. May Defines a product or system capability which is optional or a statement which is informative only and is out of scope for this specification. Should Defines a product or system capability which is recommended. 1.8. Support For support regarding EMV® Contact Terminal Level 1 Electrical testing, refer to www.emvco.com. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r 2. General requirements Page 8 / 66 2.1. Testing Strategy 2.1.1. Compliance Demonstration Objective Within EMVCo Level 1 type approval process, EMVCo compliance demonstration objectives are: 1. To ensure implementation of the EMV Contact Interface Requirements (see document [D06]); 2. To ensure that ICC and Terminal do not damage one another; 3. To ensure ICC / Terminal interoperability whatever the terminal customization performed by the vendor. 2.1.2. Device Under Test for Level 1 Approval The DUT is the Interface Module (IFM) as defined in the “Terminal Level 1 Type Approval Administrative Process” document (See document [D11]). 2.2. Test Tool Implementation Requirements 2.2.1. Physical compatibility requirements The physical compatibility shall be verified by using probes that are dimensionally calibrated. The first probe has minimum dimensions and the second has maximum dimensions. The «Minimum dimensions probe» shall have the following size: • Length = 85.47 mm -0 +80 µm • Width = 53.92 mm -0 +80 µm • Thickness = 680 µm -0 +40 µm for the card surface 680 µm -0 µm +60 µm for the contacting areas 680 µm ± 100 µm for the probe connectors zone located outside of the ISO card surface • Radius (card corners) = 3.18 mm ± 0.3 mm • Radius (card thickness) ≤ 0.15 mm • Specific dimensions (to be described in the Tool documentation): a, b and c. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r The layout (top view) of the minimum dimensions probe shall be as follows: R 3.18 ±0.3 85.47 -0 +0.08 Page 9 / 66 53.92 -0 +0.08 a b 680 -0 +40 680 -0 +60 minimum c (Top view) Dimensions in mm Figure 2-1 – Top view of the minimum dimensions probe The cross-section (side view) of the minimum dimensions probe shall be as follows: Contact pad I.C. Card (Side view) Dimensions in µm Figure 2-2 – Side view of the minimum dimensions probe The «Maximum dimensions probe» shall have the following size: • Length = 85.90 mm +0 -80 µm • Width = 54.18 mm +0 -80 µm • Thickness = 840 µm -40 +0 µm for the card surface 840 µm -60 + 0 µm for the contacting areas 1350 µm -80 +0 µm for the embossing areas (Card number area, name and address area) 840 µm ± 100 µm for the probe connectors zone located outside of the ISO card surface • Radius (card corners) = 3.18 mm ± 0.3 mm • Radius (card thickness) ≤ 0.15 mm • Specific dimensions (to be described in the Tool documentation): a, b and c. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r The layout (top view) of the maximum dimensions probe shall be as follows: 8.56 ±01 R 3.18 ±0.3 85.90 -0.08 +0 Page 10 / 66 19.14 -0 +0.2 24.03 -0.2 +0 a b 17.83 -0.2 +0 54.18 -0.08 +0 77.77 ±0.1 Card number area Name and address area minimum c 2.41 -0 +0.2 6.13 ±0.1 75.97 ±0.1 (Top view) Dimensions in mm Figure 2-3 – Top view of the maximum dimensions probe The cross-section (side view) of the maximum dimensions probe shall be as follows: Embossing Contact pad I.C. Card 840 -40 +0 1350 -80 +0 840 -60 +0 (Side view) Dimensions in µm Figure 2-4 – Side view of the maximum dimensions probe The contacts locations and dimensions for both probes shall be the minimum contact size that is allowed by ISO 7816-2. The test probes contact pads dimensional tolerance allowed is -0 +40 µm © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 11 / 66 in length or width, measured from the center of the pad and based on the ‘ISO minimal contacts’ definition, as shown below: Maximum probe 2.0 contact pad 0.04 1.7 Minimum ISO contact pad 0.04 0.04 0.04 Figure 2-5 – Top view of a contact pad for both probes 2.2.2. Contact forces requirements The contact forces shall be verified by using a probe that is calibrated for its dimensions as well as its capabilities to measure the forces that the DUT exerts on each individual contact. The «Contact forces measurement probe» shall have the following size: • Length = 85.72 mm ±40 µm • Width = 54.03 mm ±40 µm • Thickness = 760 µm -0 +40 µm • Radius (card corners) = 3.18 mm ± 0.3 mm • Radius (card thickness) ≤ 0.15 mm The ISO minimum window must be located completely inside the measurement window. The contact forces measurement probe shall be able to measure contact forces from 0.0 N to 1.0 N with a measurement uncertainty of ± 0.15 N for each contact. The influence of neighboring contact forces on any measurement shall be as minimized as possible. During contact force measurements, the contact force measuring device surface shall not move along the force axis by more than +20 -80 µm from its nominal surface position when sustaining IFM contact forces ranging from 0.0 N to 0.8 N. The probe used for the contact force measurement shall not apply more torque than a normal card. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 12 / 66 2.2.3. Electrical signal generation requirements The Test Bench shall be capable of generating the signals needed to conduct appropriately the Test Cases listed below. This means that the Test Bench shall be capable of driving the contacts listed below for the ranges specified, with the corresponding uncertainties (or better), as follows: Contact CLK ICLK Parameter I/O IIO Rise and fall times VOL VOH RST IRST VCC ICC ICC spikes Range or value -49 μA -10 μA +10 μA +49 μA Uncertainty ± 1 μA ± 1 μA ± 1 μA ± 1 μA -495 μA -5 μA +5 μA ≤ 100 ns 1075 ns 0.0 V DC 0.5 V DC 0.6 × VCC VCC ± 2.5 μA ± 1 μA ± 1 μA N/A ± 125 ns ± 30 mV ± 30 mV ± 30 mV (1) ± 30 mV (2) -49 μA -10 μA +10 μA +49 μA ± 1 μA ± 1 μA ± 1 μA ± 1 μA ≤ 0.2 mA N/A 1 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 25 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA See test case 1CB.018.0x, Table 4-17 and Table 4-18 for details Table 2-1 – Electrical signal generation requirements © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 13 / 66 All contacts except VCC shall present a capacitance less than or equal to 30 pF. 2.2.4. Electrical measurement requirements The Test Bench shall be capable of measuring the signals needed to perform appropriately the Test Cases listed below. This means that the Test Bench shall be capable of measuring the parameters of the contacts listed below for the ranges specified, with the corresponding uncertainties (or better), as follows: Contact CLK Parameter Duty cycle Frequency Rise and fall times Voltage to GND Voltage compared to VCC I/O IIO Rise and fall times RST Voltage to GND Voltage compared to VCC Rise and fall times VCC C6 Voltage to GND Voltage compared to VCC Voltage to GND Resistance to GND Voltage to GND Range Uncertainty 30% to 70% 0.1 MHz to 6.0 MHz 0 ns to 1000 ns 1000 ns to 2000 ns -1 V DC to 6 V DC -1 V DC to 6 V DC ± 1% ± 1% ± 5% ± 2ns ± 125 ns ± 15 mV ± 25 mV -20 mA to + 20 mA 0 ns to 1000 ns 1000 ns to 2000 ns -1 V DC to 6 V DC -1 V DC to 6 V DC ± 0.1 mA ± 50 ns ± 125 ns ± 15 mV ± 25 mV 0 ns to 1000 ns 1000 ns to 2000 ns -1 V DC to 6 V DC -1 V DC to 6 V DC ± 50 ns ± 125 ns ± 15 mV ± 25 mV -1 V DC to 6 V DC ± 15 mV 0.1 MΩ to 20 MΩ -1 V DC to 6 V DC ± 5% ± 15 mV Table 2-2 – Electrical signal measurement requirements (1) This uncertainty includes the related VCC measurement uncertainty. (2) This uncertainty includes the related VCC measurement uncertainty. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 14 / 66 All contacts shall be protected such as to withstand contact voltages ranging from -10 V DC to +25 V DC with a maximum input current of ± 20 mA without any damage for the Test Bench. 2.2.5. Environmental monitoring requirements The Testing Laboratory shall be capable of measuring the environmental conditions enforced around the IFM during the Test Cases, as listed below. This means that the Test Bench shall be capable of measuring the parameters listed below in the Testing Laboratory room and / or the climatic chamber for the ranges specified, with the corresponding uncertainties (or better), as follows: Parameter Temperature Relative Humidity Range 0°C to 50°C 5% RH to 95% RH Uncertainty ± 1°C ± 3% RH Table 2-3 – Environmental monitoring requirements 2.3. Test Conditions 2.3.1. Default environmental conditions With the exception of the Test Cases 1CB.001.0x and 1CB.002.0x, all Electrical and Card Session Type Approval tests shall be performed under the following environmental conditions: Condition Low temperature Normal temperature High temperature Temperature 6°C ± 1°C 23°C ± 3°C 39°C ± 1°C Relative humidity 50% RH ± 10% RH 50% RH ± 10% RH 50% RH ± 10% RH Table 2-4 – Type Approval Tests environmental conditions 2.3.2. Reference ATRs Unless specified otherwise in the Test Cases below, the following reference ATRs shall be used. Each Test sub-case refers to the required ATR using the code “ATR#1”, “ATR#2”, “ATR#3”, “ATR#4”, “ATR#5”, “ATR#6” or “ATR#7”, as indicated in the first column of Table 2-5 below. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r For details on the ATRs used, please refer to document [D06]. Page 15 / 66 ATR reference ATR#1 ATR#2 ATR#3 ATR#4 ATR#5 ATR#6 ATR#7 Protocol T=0 T=0 T=1 T=1 T=0 T=1 T=0 D factor D=1 D=4 D=1 D=4 D=2 D=2 D=1 ATR value 3B 60 00 00 3B F0 13 00 00 10 80 3B E0 00 FF 81 31 FE 00 51 3B F0 13 00 FF 91 81 31 FE 00 C3 3B F0 12 00 00 10 80 3B F0 12 00 00 91 81 31 FE 31 0C 3B E0 00 00 40 00 Table 2-5 – Reference ATRs 2.3.3. Loopback The transactions needed to perform the Test Cases described below rely on a specific application called “Loopback”. For a detailed description of this application, please refer to the document [D09]. 2.3.4. Test Transaction The Test Transaction is the set of commands and responses that are exchanged between the DUT and the Test Bench for each test sub-case execution. The Test Transaction contains only predictable exchanges, including in the loopback section, where a defined number of exchange loops (niter) is performed depending on the protocol and D parameter used. The Test Transaction is structured as follows: • It starts with a defined ATR sent by the Test Bench; • then it continues with the exchange of a transaction prologue, i.e., a first defined set commands and responses; • then it includes a loopback section, where a second set of commands and responses is repeated a defined number of times (niter); • then it ends with a transaction epilogue (termination command and response). © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 16 / 66 The number of iterations inside the loopback section of the Test Transaction (niter) is defined as follows: ATR reference niter value ATR#1 3 ATR#2 11 ATR#3 3 ATR#4 12 ATR#5 6 ATR#6 6 Table 2-6 – Number of iterations in the loopback section The detailed contents of the Test Transaction is described in Appendix A at the end of this document, both for T=0 and for T=1 protocols. 2.3.5. Testing of IFMs Powered by Batteries In the case where an IFM is powered by battery, two options may apply depending on the IFM hardware configuration. • When the batteries are sealed and the battery compartment is not accessible, the following requirements apply: - Test sub-cases 1CB.017.05 to 1CB.017.12 and 1CB.018.09 to 1CB.018.24 inclusive may be skipped. - Appropriate information shall be provided in the Type Approval Test Report: ▪ The verdict for the test sub-cases 1CB.017.05 to 12 and 1CB.018.09 to 24 inclusive shall be “Not Tested”, they may not be “Pass”. ▪ A reference to this Section shall be mentioned in the comments related to these test sub-cases (For instance, “As per IFM Mechanical and Electrical Test Cases, Section 2.3.5”). - The Testing Laboratory shall provide appropriate evidence (for example with pictures) demonstrating that the batteries of the IFM cannot be accessed. Examples of compartments that are sealed: those permanently glued to the housing, molded in one piece, or soldered in place, etc. • When the battery compartment is accessible, the following requirements apply: - The batteries shall be removed from the battery compartment. The IFM shall be connected to and powered by an external power supply controlled by the Laboratory. - All test cases, without any restriction, shall be performed. - The minimum and maximum power supply voltage values shall be defined according to the indications provided by the Vendor in Sections III.8.1.1.3 and III.8.1.1.4 of the ICS. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 17 / 66 - Moreover, the testing Laboratory shall verify prior to the Test Session that the minimum and maximum power supply voltage values mentioned in the ICS are in reasonable accordance with the actual specifications of the batteries, in order to avoid any electrical damage to the IFM during testing. Examples of compartments that are not sealed: those that may be opened using a screwdriver or similar simple hand-held tool, by sliding the battery out of the casing, by unlocking a lever, latch or lock, by pressing a release button, etc. 2.3.6. Test Case Naming Convention The Test Cases References are established as follows: 1Ct.nnn.cc where 1C stands contact terminal level 1 test case t is a letter indicating the category of test case nnn is the number of the test case cc is the number of the test sub-case, or 00 if there is no sub-case © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r 3. Mechanical Test Cases Page 18 / 66 3.1. 1CA.001.0x - Physical compatibility and contact location This test verifies that the physical characteristics of the DUT allow the acceptance of ICCs having a size between the standard minimum and the maximum dimensions, and that galvanic contact is established between the DUT and ICCs having minimal area contacts. Test Code 1CA.001.0x Revision v4.3d Reference This test refers to requirements in document [D06], section 5.4.1. Test Conditions Use Table 3-1 for the test conditions during verifications of the physical compatibility and contact location. Value of x Reference probe to be used 1 Minimum dimensions 2 Maximum dimensions Table 3-1 – Test conditions for 1CA.001.0x Procedure Follow this procedure to verify the physical compatibility and contact location: 1. Stabilize the DUT at normal temperature. 2. Insert the reference probe listed in the first line of Table 5 into the DUT. 3. Initiate cold reset. 4. Send the Reference ATR#4 and complete processing of the Test Transaction between the Test Bench and DUT. 5. Withdraw the reference probe from the DUT. 6. Using the reference probe listed in the second line of Table 5, repeat steps 3 to 5. Acceptance criteria The following acceptance criteria shall be met under all test conditions: 1. The reference probes may be inserted without mechanical interference into the DUT. 2. The contact activation sequence and the processing of the command sequence between the Test Bench and DUT are correctly performed. 3. The reference probes may be withdrawn from the DUT without mechanical interference. Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 19 / 66 3.2. 1CA.002.00 – IFM Contact Forces This test verifies that the force exerted by any one DUT contact over its corresponding ICC contact is within specifications. Test Code 1CA.002.00 Revision v4.3a Reference This test refers to requirements in document [D06], section 5.4.2. Test Conditions The DUT is not supplied any power. Procedure Follow this procedure to verify the IFM contact forces: 1. Stabilize the DUT at normal temperature. 2. Insert the contact force measuring probe into the DUT, up to its nominal seated position. Position the probe so as to avoid any perturbations during the measurement. 3. Measure the force on each existing contact pad at least three times with at least one second between measurements. 4. Withdraw the contact forces measuring probe from the DUT. Acceptance criteria The following acceptance criteria shall be met for each contact: 1. (0.2 N – εN) ≤ contact force ≤ (0.6 N + εN) The “contact force” mentioned in the Acceptance Criteria 1 above is the average of the three measurements performed on the concerned contact. Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r 4.Electrical Test Cases Page 20 / 66 4.1. Foreword This section describes the general conditions for all electrical and card session test cases. The indications below are applicable to all the test cases, unless otherwise is stated in the description of a specific test case. The acquisition of the signals shall start from the first time that VCC reaches its lowest stable limit, i.e., (4.6 V DC - εV) for Class A or (2.76 V - εV) for Class B, and may not stop before the end of the deactivation of VCC. Regarding signal voltages, a differentiated approach has been selected: • The “Signal voltage” series of test cases focus on the general DC shape of the signals. Shortest spikes, i.e., those lasting less than the “Trigger delay” value, are ignored. For these test cases: o All acceptance limits are set according to the requirements applicable to the IFM. o Appropriate trigger delays are applied. Spikes shorter than the concerned trigger delay are ignored. o To accommodate for the unavoidable internal resistance of the transmission lines, the outer voltage limits, i.e., the lower VIL limit and the upper VIH limit, are shifted by 50mV from their nominal specified value. • The “Signal perturbations” series of test cases focus on the high-frequency components of the signal, and on ensuring that the signals are appropriate for interpretation by the ICC. For these test cases: o No trigger delay is applied. A spike that is outside limits results in a failed test case, whatever its duration. o The outer limits, i.e., the lower VIL limit and the upper VIH limit, are verified against the “Signal perturbations” IFM specifications. o The inner limits, i.e., the lower VIH limit and the upper VIL limit, are verified against the ICC receiver specifications. o The correct signals transitions, i.e,. from low to high state and vice-versa, are verified. The ICC current specified in each test condition shall be driven by the Test Tool from the moment when VCC is powered up and stable until its deactivation. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 21 / 66 4.2. 1CB.001.0x - Short circuit resilience This test verifies that the DUT is not damaged by a short circuit between any pair or group of contacts. Test Code 1CB.001.0x Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.8. Test Conditions Use Table 4-1 for the test conditions during verifications of the short circuit resilience. Value of x Probe description 1 Shorts I/O, CLK and RST to GND with ≤ 2Ω each 2 Shorts I/O, CLK and RST to VCC with ≤ 2Ω each 3 Shorts VCC to GND with ≤ 2Ω 4 Fully metallic probe with ≤ 2Ω between any pair of contacts, or between any contact and any point of the surface of the probe. ICC (3) 2 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA Table 4-1 – Test conditions for 1CB.001.0x Procedure Follow 1. 2. 3. 4. 5. 6. 7. 8. 9. this procedure to verify the short circuit resilience: Stabilize the DUT at normal temperature. Insert the reference probe listed in the first line of Table 4-1 into the DUT. Keep the probe inserted for at least 10 seconds. Withdraw the reference probe. If required by the DUT operating instructions, perform a reset of the DUT. Insert the normal measurement probe and initiate cold reset. Send the Reference ATR#1 and complete processing of the Test Transaction between the Test Bench and DUT. During step 7, monitor the Vcc voltage between contacts C1 (VCC) and C5 (GND), the I/O voltage between contacts C7 (I/O) and C5 (GND) when the DUT is transmitting, the CLK voltage between contacts C3 (CLK) and C5 (GND) and the RST voltage between contacts C2 (RST) and C5 (GND). Use the reference probe listed in the next line of Table 4-1 and repeat steps 2 to 8. Repeat this step until the end of the table. Acceptance criteria The following acceptance criteria shall be met during the whole monitoring duration and under all test conditions: 1. Each sequence of commands and answers in step 7 of the procedure above is performed correctly. 2. (-0.25 V - εV) ≤ Low state I/O voltage ≤ ((0.15 × VCC) + εVV) 3. ((0.8 × VCC) - εVV) ≤ High state I/O voltage ≤ (VCC + 0.25 V + εVV) (3) This current applies to the transaction performed after each short (steps 6, 7 and 8), not during the shorts (steps 2 and 3). © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 22 / 66 4. (-0.25 V - εV) ≤ Low state CLK voltage ≤ ((0.15 × VCC) + εVV) 5. ((0.8 × VCC) - εVV) ≤ High state CLK voltage ≤ (VCC + 0.25 V + εVV) 6. (-0.25 V - εV) ≤ Low state RST voltage ≤ ((0.15 × VCC) + εVV) 7. ((0.8 × VCC) - εVV) ≤ High state RST voltage ≤ (VCC + 0.25 V + εVV) 8. (-0.25 V - εV) ≤ Vcc voltage (at any time) 9. For Class A: a. (-0.25 V - εV) ≤ Vcc voltage ≤ (5.40 V + εV) b. When CLK is active: (4.60 V - εV) ≤ Vcc voltage 10. For Class B: a. (-0.25 V - εV) ≤ Vcc voltage ≤ (3.24 V + εV) b. When CLK is active: (2.76 V - εV) ≤ Vcc voltage Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 23 / 66 4.3. 1CB.002.00 - C6 isolation This test verifies the isolation of the C6 contact for new IFM designs. This test case is applicable to all Class B DUTs and to Class A DUTs when their ICS mentions that the C6 contact is not connected. For other Class A DUTs, please perform the test case 1CB.003.0x instead. Test Code 1CB.002.00 Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.3. Test Conditions No specific test conditions are applicable to this test case. Procedure Follow this procedure to verify the isolation of the C6 contact for new IFM designs: 1. Stabilize the DUT at normal temperature. 2. Initiate cold reset. 3. Send the Reference ATR#3 and complete processing of the Test Transaction between the Test Bench and DUT. 4. During step 3, measure the DC resistance between contacts C6 and C5 (GND). The test voltage used shall not exceed 5 V DC between these contacts. Acceptance criteria The following acceptance criteria shall be met: 1. C6 isolation ≥ (10 MΩ - εΩ) Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 24 / 66 4.4. 1CB.003.0x - C6 voltage This test verifies the voltage on the C6 contact for existing Class A IFM designs. This test case is applicable only to existing Class A DUTs, when their ICS mentions that the C6 contact is connected. For all other DUTs, please perform the test case 1CB.002.00 instead. Test Code 1CB.003.0x Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.3. Test Conditions Use Table 4-2 for the test conditions during verifications of the voltage on the C6 contact for existing Class A IFM designs. Value of x 1 2 3 4 ATR ATR#1 ATR#4 ATR#2 ATR#3 ICC ≤ 0.2 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA Table 4-2 – Test conditions for 1CB.003.0x Procedure Follow 1. 2. 3. 4. 5. 6. 7. this procedure to verify the voltage on the C6 contact for existing Class A IFM designs: Stabilize the DUT at the appropriate environmental conditions. Set the test conditions as listed in the first line of Table 4-2. Initiate cold reset. Send the Reference ATR listed in the first line of Table 4-2 and complete processing of the Test Transaction between the Test Bench and DUT. During steps 3 and 4, monitor the voltage between contacts C6 and C5 (GND). Set the test conditions as listed in the next line of Table 4-2 and repeat steps 3 to 5, using the ATR specified in the “ATR” column. Repeat this step until the end of the table. Repeat steps 1 to 6 for all other environmental conditions. Acceptance criteria The following acceptance criteria shall be met during the whole monitoring duration and under all environmental and test conditions: 1. (-0.25 V - εV) ≤ C6 voltage ≤ ((1.05 × VCC) + 0.25 V DC + εVV) Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 25 / 66 4.5. 1CB.004.xx - I/O current This test verifies the current limitation on the I/O contact. Test Code 1CB.004.xx Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.2. Test Conditions Use Table 4-3 for the test conditions during verifications of the current limitation on the I/O contact. Value of xx 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 ATR ATR#1 ATR#1 ATR#1 ATR#1 ATR#2 ATR#2 ATR#2 ATR#2 ATR#3 ATR#3 ATR#3 ATR#3 ATR#4 ATR#4 ATR#4 ATR#4 ICC 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA Shorting ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to VCC ≤ 75Ω from I/O to GND ≤ 75Ω from I/O to GND Table 4-3 – Test conditions for 1CB.004.0x Procedure Follow 1. 2. 3. 4. 5. 6. this procedure to verify the current limitation on the I/O contact: Stabilize the DUT at the appropriate environmental conditions. Set the test conditions as listed in the “ICC” column of the first line of Table 4-3. Initiate cold reset. Send the Reference ATR listed in the “ATR” column of the first line of Table 4-3, without any short circuit. When the DUT sends data to the Test Bench, apply the short circuit specified in the “Shorting” column of the concerned line of Table 4-3 until the short collapses I/O and cause contact deactivation, or after one second. During step 5, monitor the I/O current on contact C7 (I/O) starting 100 ns after the application of the short circuit. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 26 / 66 7. Set the test conditions as listed in the next line of Table 4-3 and repeat steps 3 to 6 using the ATR specified in the “ATR” column. Repeat this step until the end of the table. 8. Repeat steps 1 to 7 for all other environmental conditions. Acceptance criteria The following acceptance criteria shall be met during the whole monitoring duration and under all environmental and test conditions: 1. (-15 mA - εA) ≤ I/O current ≤ (15 mA + εA) Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 27 / 66 4.6. 1CB.005.0x - I/O transmission voltage This test verifies the voltage trends on the I/O contact when the DUT is transmitting, i.e., when the DUT is controlling the level on the I/O contact. Test Code 1CB.005.0x Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.2.1, Table 10. Test Conditions Use Table 4-4 for the test conditions during verifications of the voltage trends on the I/O contact during transmission. Value of x 1 ATR ATR#1 2 ATR#4 3 ATR#2 4 ATR#3 ICC 2 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA IIO +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA Trigger delay 320 ns 320 ns 320 ns 320 ns Table 4-4 – Test conditions for 1CB.005.0x Procedure Follow 1. 2. 3. 4. 5. 6. 7. this procedure to verify the voltage trends on the I/O contact during transmission: Stabilize the DUT at the appropriate environmental conditions. Set the test conditions as listed in the first line of Table 4-4. Initiate cold reset. Send the Reference ATR listed in the first line of Table 4-4 and complete processing of the Test Transaction between the Test Bench and DUT. During step 4, monitor the I/O voltage between contacts C7 (I/O) and C5 (GND) when the DUT is transmitting. Set the test conditions as listed in the next line of Table 4-4 and repeat steps 3 to 5 using the ATR specified in the “ATR” column. Repeat this step until the end of the table. Repeat steps 1 to 6 for all other environmental conditions. Acceptance criteria The following acceptance criteria shall be met during the whole monitoring duration and under all environmental and test conditions: 1. (- 50 mV - εV) ≤ Low state I/O voltage ≤ ((0.15 × VCC) + εVV) 2. ((0.8 × VCC) - εVV) ≤ High state I/O voltage ≤ (VCC + 50 mV + εVV) To be recognized as a failed test, a non-compliance situation shall last at least for the trigger delay duration. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 28 / 66 Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 29 / 66 4.7. 1CB.006.0x - I/O transmission rise and fall time This test verifies the rise and fall times on the I/O contact when the DUT is transmitting, i.e., when the DUT is controlling the level on the I/O contact. Test Code 1CB.006.0x Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.2.1, Table 10. Test Conditions Use Table 4-5 for the test conditions during verifications of the rise and fall times on the I/O contact. Value of x 1 ATR ATR#1 ICC 2 mA ± 2% ± 0.1 mA IIO +5 μA ± 1 μA -5 μA ± 1 μA 2 ATR#4 2 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -5 μA ± 1 μA 3 ATR#1 54 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -5 μA ± 1 μA 4 ATR#4 54 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -5 μA ± 1 μA 5 ATR#2 2 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -495 μA ± 2.5 μA 6 ATR#3 2 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -495 μA ± 2.5 μA 7 ATR#2 54 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -495 μA ± 2.5 μA 8 ATR#3 54 mA ± 2% ± 0.1 mA +5 μA ± 1 μA -495 μA ± 2.5 μA Table 4-5 – Test conditions for 1CB.006.0x Procedure Follow 1. 2. 3. 4. 5. 6. 7. this procedure to verify the rise and fall times on the I/O contact: Stabilize the DUT at the appropriate environmental conditions. Set the test conditions as listed in the first line of Table 4-5. Initiate cold reset. Send the Reference ATR listed in the first line of Table 4-5 and complete processing of the Test Transaction between the Test Bench and DUT. During step 4, monitor the I/O rise time (10% to 90% of (0.2 × VCC) to (0.7 × VCC)) and the I/O fall time (90% to 10% of (0.7 × VCC) to (0.2 × VCC)) between contacts C7 (I/O) and C5 (GND). Set the test conditions as listed in the next line of Table 4-5 and repeat steps 3 to 5 using the ATR specified in the “ATR” column. Repeat this step until the end of the table. Repeat steps 1 to 6 for all other environmental conditions. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 30 / 66 Acceptance criteria The following acceptance criteria shall be met during the whole monitoring duration and under all environmental and test conditions: 1. I/O rise time ≤ (800 ns + εs) 2. I/O fall time ≤ (800 ns + εs) Expected Results Results are recorded with one of two statements: • Pass message • Fail message including a list of all failed conditions and reference details of the acceptance item(s) not met. © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 31 / 66 4.8. 1CB.007.xx - I/O transmission signal perturbations This test verifies the voltage perturbations on the I/O contact when the DUT is transmitting, i.e., when the DUT is controlling the level on the I/O contact. Test Code 1CB.007.0x Revision v4.3d Reference This test refers to requirements in document [D06], section 5.5.2.1, Table 10. Test Conditions Use Table 4-6 for the test conditions during verifications of the voltage perturbations on the I/O contact during transmission. Value of xx 1 ATR ATR#1 2 ATR#1 3 ATR#1 4 ATR#1 5 ATR#2 6 ATR#2 7 ATR#2 8 ATR#2 9 ATR#3 10 ATR#3 11 ATR#3 12 ATR#3 ICC 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA IIO +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA © 2014-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries. EMV® Contact Terminal Level 1 Type Approval IFM Mechanical and Electrical Test Cases v1.0a.r Page 32 / 66 Value of xx 13 ATR ATR#4 14 ATR#4 15 ATR#4 16 ATR#4 ICC 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA 2 mA ± 2% ± 0.1 mA 54 mA ± 2% ± 0.1 mA IIO +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -5 μA ± 1 μA +5 μA ± 1 μA -495 μA ± 2.5 μA +5 μA ± 1 μA -495 μA ± 2.5 μA Table 4-6 – Test conditions for 1CB.007.0x Procedure Follow 1. 2. 3. 4. 5. 6. 7. this procedure to verify the voltage perturbations on the I/O contact during transmission: Stabilize the DUT at the appropriate environmental conditions. Set the test conditions as listed in the first line of Table 4-6. Initiate cold reset. Send the Reference ATR listed in the first line of Table 4-6 and complete processing of the Test Transaction between the Test Bench and DUT. During step 4, monitor the I/O voltage between contacts C7 (I/O) and C5 (GND). Set the test conditions as listed in the next line of Table 4-6 and repeat steps 3 to 5 using the ATR specified in the “ATR” column. Repeat this step until the end of the table. Repeat steps 1 to 6 for all other environmental conditions. Acceptance criteria The following acceptance criteria shall be met during the whole monitoring duration and under all environmental and test conditions: 1. (-0.25 V - εV) ≤ I/O voltage ≤ (VCC + 0.25 V + εVV) 2. Each time that the I/O voltage increases over ((0.2 × VCC) + εVV), it reaches next ((0.7 × VCC) - εVV) or above before decreasing again under ((0.2 × VCC) + εVV). To avoid inappropriate detection of fail