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EMV® Mobile Product Level 1 Type Approval Mobile L1 Test Guidelines

v3.2b Test Cases & Test Environments
ContactlessMobile NFC Consumer Device

EMV® Mobile Product Level 1 Type Approval Mobile L1 Test Guidelines Version 3.2b January 2025

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Legal Notice

This document summarizes EMVCo’s present plans for evaluation services and related policies and is subject to change by EMVCo at any time. This document does not create any binding obligations upon EMVCo or any third party regarding the subject matter of this document, which obligations will exist, if at all, only to the extent set forth in separate written agreements executed by EMVCo or such third parties. In the absence of such a written agreement, no product provider, test laboratory or any other third party should rely on this document, and EMVCo shall not be liable for any such reliance. No product provider, test laboratory or other third party may refer to a product, service or facility as EMVCo approved, in form or in substance, nor otherwise state or imply that EMVCo (or any agent of EMVCo) has in whole or part approved a product provider, test laboratory or other third party or its products, services, or facilities, except to the extent and subject to the terms, conditions and restrictions expressly set forth in a written agreement with EMVCo, or in an approval letter, compliance certificate or similar document issued by EMVCo. All other references to EMVCo approval are strictly prohibited by EMVCo. Under no circumstances should EMVCo approvals, when granted, be construed to imply any endorsement or warranty regarding the security, functionality, quality, or performance of any particular product or service, and no party shall state or imply anything to the contrary. EMVCo specifically disclaims any and all representations and warranties with respect to products that have received evaluations or approvals, and to the evaluation process generally, including, without limitation, any implied warranties of merchantability, fitness for purpose or noninfringement. All warranties, rights and remedies relating to products and services that have undergone evaluation by EMVCo are provided solely by the parties selling or otherwise providing such products or services, and not by EMVCo, and EMVCo will have no liability whatsoever in connection with such products and services. This document is provided "AS IS" without warranties of any kind, and EMVCo neither assumes nor accepts any liability for any errors or omissions contained in this document. EMVCO DISCLAIMS ALL REPRESENTATIONS AND WARRANTIES, EXPRESS OR IMPLIED, INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, TITLE AND NONINFRINGEMENT, AS TO THIS DOCUMENT. EMVCo makes no representations or warranties with respect to intellectual property rights of any third parties in or in relation to this document. EMVCo undertakes no responsibility to determine whether any implementation of this document may violate, infringe, or otherwise exercise the patent, copyright, trademark, trade secret, know-how, or other intellectual property rights of third parties, and thus any person who implements any part of this document should consult an intellectual property attorney before any such implementation. Without limiting the foregoing, this document may provide for the use of public key encryption and other technology, which may be the subject matter of patents in several countries. Any party seeking to implement this document is solely responsible for determining whether its activities require a license to any such technology, including for patents on public key encryption technology. EMVCo shall not be liable under any theory for any party's infringement of any intellectual property rights in connection with this document.

Revision Log – Version 3.2b The following changes have been made to the document since the publication of Version 3.0b1. Some of the numbering and cross references in this version have been updated to reflect changes introduced by the published bulletins. The numbering of existing requirements did not change, unless explicitly stated otherwise. Changes based on Specification Updates: SB300 – PICC Presence Check Procedure:

  • Adding test case CC102 to the list in Annex A.1 Other changes (test coverage, editorial):
  • Editorial corrections Contents 1. 1. 1.2. 1. 2. 2. 2. 2. 2. 2. 2. 3. 3. 3. 3. 3. 4.1. 4.1. 4.1. 4. 4. 4.3. 4.3. A. A. A.2. A.2. A.2. B. Table 3-1 — Test Positions of Test CAB111. Table 4-2 — Digital configurations for Digital Testing with UICC. /29 1 About this document 1.1

Introduction

This document describes the testing guidelines applicable to a Mobile Product that can use a UICC, HCE, eSE or an eUICC as EE, using the EMVCo PICC Administrative documents and PICC Level 1 Tests Plans. These Guidelines aim at adapting the existing EMV CL PICC testing to Mobile Level 1 testing by:

  • selecting relevant test points,
  • identifying specific test configurations,
  • defining Mobile Level 1 specific dispositions (failure management processes, etc.) This document refers to EMVCo standard Type Approval documents focusing on Mobile testing specificities. The audience of this document is therefore expected to be familiar with EMV CL PICC Type Approval Process.

1.2 Reference Documents EMV documents are available on the EMVCo web site: https://www.emvco.com/ 1.2.1 Specification Documents Table 1-1 — Specification Documents Reference [L1Spec] [EMV CL PICC ANA TC] [EMV CL PICC DIG TC] [EMV ADMIN] Document Title Version EMV® Level 1 Specifications for Payment Systems – EMV Contactless Interface Specification 3.2 – July 2022 EMV® Specification Bulletin No 282: PPS0 and PPS1 First Edition, March RFU Value Handling 2023 EMV® Specification Bulletin No 283: PCD Carrier Phase Drift First Edition, March 2023 EMV® Specification Bulletin No 303: PCD Adding an Second Edition, Optional Suspend and a Mandatory Suspend in the May 2024 Polling Loop EMV® Specification Bulletin No 300: PICC Presence Check Procedure EMV® Contactless Card Level 1 Type Approval – PICC Analogue Test Bench and Test Case Requirements EMV® Contactless Card Level 1 Type Approval – PICC Digital Test Cases First Edition, June 2024 3.2b – January 2025 3.2b – January 2025 EMV® Mobile Product Level 1 Type Approval – Administrative Process 2.8 – January 2025 or latest version

/29 Reference [EMV Applet Reqs] [L1 MOBILE ICS] [Mobile L1 TRT] Document Title Version EMV® Mobile Level 1 Test Application Requirements EMV® Mobile Level 1 Implementation Conformance Statement EMV® Mobile L1 Report Template 2.0 – October 2022 or latest version v3.2b – latest version v3.2b – latest version 1.3 Acronyms and Abbreviations and Definitions The following abbreviations and notations are used in this document: Table 1-2 — Abbreviations Abbreviation AC APDU App Data ATQA AID AID route Technology route CID CID CLA DUT EE EEUT eSE ETSI eUICC FWI GPO GPS HCE HCI

Description

Application Cryptogram Application Protocol Data Unit Application Data

Answer

To reQuest, Type A Application IDentifier Mechanism that permits an NFC Controller to route APDUs to EE depending on the default route for APDUs or the last selected AID during the current session Identifies the EE that defines the Contactless parameters with highest priority (technology route may be different from AID route and default route for APDUs) Card IDentifier (when L1 context) Cryptogram Information Data (when L2 context) CLAss Device Under Test (Mobile Product) Execution Environment (where the contactless applet is executed e.g. UICC, eSE, eUICC, HCE …) Execution Environment Under Test Embedded Secure Element European Telecommunications Standards Institute Embedded UICC Frame Waiting time Integer Get Processing Options Global Positioning System Host Card Emulation Host Controller Interface

/29 Abbreviation ICS INS L1 L2 NAD NFC P2P PCD PICC PPSE PUPI R/W Mode SAK SFGI SFI SW UID UICC Variable Parameter WTX WUPA WUPB Description Implementation Conformance Statement INStruction Level 1 Level 2 Node ADdress Near Field Communication Peer 2 Peer Proximity Coupling Device proximity integrated circuit card Proximity Payment System Environment Pseudo-Unique PICC Identifier, Type B Reader/Writer Mode Select AcKnowledge, Type A Start-up Frame Guard time Integer Short File Identifier Status Word Unique IDentifier, Type A Universal Integrated Circuit Card Contactless Parameter which can be set by the EE according to ETSI 102 622 (HCI) Waiting Time eXtension Wake UP command, Type A Wake UP command, Type B

2 Generic guidelines

/29 2.1 Device Under Test (DUT) The Device Under Test (DUT) consists of a Mobile Product with a EEUT, to be evaluated. It can be a mobile phone, a tablet, a wearable product or any mobile device supporting mobile payment application. For Level 1 testing, the DUT must respect the following requirements:

  • The test applet in the EEUT shall be activated and selectable
  • The test applet AID shall be registered in the AID routing table and associated with the EEUT OR the default route for APDUs shall be the designated EEUT
  • The vendor shall indicate how to select all test profiles or Digital configurations (or provide samples for each of them)
  • There shall be only one activated contactless application using ISO/IEC 14443-4 Details of the test applet can be found in [EMV Applet Reqs].

2.2 Testing Conditions The DUT shall be tested in the following conditions:

  • The DUT shall not be plugged to a charger.
  • The DUT shall be turned on.
  • If the DUT has a display, the display shall always be on during testing.
  • If it is not possible to deactivate the display off timer, the laboratory may install an application that will maintain the display on.
  • If the DUT has a battery:
  • The DUT battery indicator shall show at least 50% during the whole test session (the display of the battery level can be made on the device screen or using command line provided by the Product Provider).
  • After the battery has been charged, the tests shall begin at least 15 minutes after the charger is unplugged.
  • If the DUT supports Bluetooth, GPS or WiFi, these technologies shall be turned off during testing, unless it is required for mobile payment operation.
  • All contactless functionalities of the DUT shall be enabled (e.g. Type A, Type B, NFCF, P2P, R/W Mode, etc.).
  • The default configuration of a slide, flip or swivel DUT shall be open as for normal mobile usage
  • There shall be only one activated contactless application using ISO/IEC 14443-4
  • If the DUT supports UICCs, when the EEUT is not a UICC, no SWP UICC shall be inserted in the DUT.
  • The DUT shall be provided with a Reference Mark representing the Antenna optimum performance point.

2.3 Forms The Mobile Provider must submit a completed [L1 MOBILE ICS] to the test laboratory.

/29 2.4 Test Profiles EMVCo has defined Test Profiles in [EMV Applet Reqs] that may be used during Mobile Level 1 Testing as indicated in this document. When the EEUT is a UICC, EMVCo provides UICC kits with 7 UICCs corresponding to the 7 Test Profiles defined in [EMV Applet Reqs]. The UICCs shall be used directly in the mobile product, with a physical adapter if necessary. The laboratory shall not use any tool between the UICC and the mobile product (e.g. spy etc…).

2.5 Applicable Test Plans The Mobile Level 1 Testing is based on the EMV CL PICC Level 1 Test Plans: [EMV CL PICC ANA TC] and [EMV CL PICC DIG TC], including the corresponding type approval communications (CTA Communications) unless stated otherwise. Some specific dispositions are described in this document:

  • “3. Analogue Guidelines”
  • “4. Digital guidelines” 2.6 Reference Transaction For Analogue Testing, the APDUs in the Frame Trails defined in [EMV CL PICC ANA TC] shall be replaced by the following APDUs: Table 2-1 — APDUs for Analogue Reference Transaction Step CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response SELECT App Command SELECT App Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) Comments Select PPSE (Test applet) Select AID (Test applet) /29 CUT  CUT ➔ GENERATE AC Command GENERATE AC Response 80 (CLA) + AE (INS) + 00 (P1) + 00 (P2) + 02 (Lc) + 11 22 + 00h (Le) 77 81 89 9F 27 01 40 9F 36 02 19 69 9F 4B 60 1D 38 D3 3F 51 5A BF 06 09 AD 85 94 64 89 7B F5 EE 5C C6 B2 F5 FE 00 B9 F0 25 83 BA 07 04 C6 AC 6E 63 74 C7 08 D9 44 01 1C 31 A9 E4 A3 F0 32 31 06 20 78 7C 10 F8 8B 37 AA 0C B6 1B AF 82 7B B2 D5 45 DF 1B A8 DA 49 0F 41 15 D8 17 67 43 82 EC 55 18 5A C7 86 35 9F FC 94 74 86 83 E4 6D 19 7B 9F 10 1A 22 10 90 40 03 04 00 01 00 00 00 00 10 46 97 99 FF FF 00 00 00 00 00 00 00 FF C6 96 70 5D E3 C4 01 42+ 9000h (SW) GENERATE AC For Digital Testing, the APDUs to be used are defined in “Annex A APDUs for Mobile L1 Type Approval”. In order to perform the Mobile Product L1 Analogue and Digital Testing, the laboratories shall use a test applet in line with [EMV Applet Reqs]. When the EEUT is a UICC, EMVCo provides UICC kits with an application in line with [EMV Applet Reqs].

2.7 DUT Positioning The Device Under Test positioning information are defined in [L1 MOBILE ICS]. In order to avoid DUT positioning inconsistencies between laboratories, the following rules must be followed:

  • The Presentation Plane of a DUT shall always be parallel to the Landing Plane of the EMV – TEST PCD.
  • The DUT must be presented to the EMV – TEST PCD on the side of the Reference Mark.
  • The DUT φc = 0 axis must be aligned with the EMV – TEST PCD (z,r,0) / (z,r,6) axis.
  • The Top of the DUT must be placed on the EMV – TEST PCD (z,r,6) position side as shown in below diagram: /29 3 Analogue Guidelines /29 The following analogue guidelines are applicable for the test of mobile products. All PICC Analogue Test Cases shall be performed according to [EMV CL PICC ANA TC] specification. The following modifications shall be applied to the test plan.

3.1 Test Profiles for Analogue Testing For Analogue Testing, the mobiles shall be tested with two different test profiles:

  • A1 profile for type A tests
  • B1 profile for type B tests If the configuration of the mobile product cannot be changed by the laboratory, or if the mobile “supports only specific protocol configurations” (see ICS), then it shall be tested with:
  • A configuration supporting Type A, if available, for type A tests (configuration may be a Type AB configuration).
  • A configuration supporting Type B, if available, for type B tests (configuration may be a Type AB configuration). It is possible that a mobile product with a EEUT does not permit to change its contactless configuration. In that case, it shall be tested with the only possible configuration available. For analogue testing:
  • If the mobile supports only Passive Load Modulation, it shall be tested with Passive Load Modulation.
  • If the mobile supports only Active Load Modulation, it shall be tested with Active Load Modulation.
  • If the mobile supports both Active Load Modulation and Passive Load Modulation, it shall be tested with Active Load Modulation only and with Passive Load Modulation only. For Analogue Timing test session, the mobile shall be tested with Passive Load Modulation or Active Load Modulation.

3.2 Analogue Test Transaction The Reference Transaction defined in [EMV CL PICC ANA TC] shall be replaced by the Reference Transaction defined in chapter 2.6 for the following test cases:

  • CA121.zrf
  • CA122.zrf
  • CA123.zrf
  • CA124.200
  • CA125.200
  • CA126.z00
  • CA127.z00
  • CA131.zrf
  • CA134.z00
  • CA132.200
  • CA144.200
  • CB121.zrf
  • CB122.zrf
  • CB123.zrf
  • CB124.200
  • CB125.200
  • CB126.z00
  • CB127.z00
  • CB131.zrf
  • CB134.200
  • CB145.200 /29 /29 3.3 CAB111 Test Case The Test procedure for CAB111 Test Case defined in [EMV CL PICC ANA TC] shall be replaced by the following procedure: Test Positions: Use Table 3-1 for the test positions during this test case: Table 3-1 — Test Positions of Test CAB111.z00 Value for z 0 1 2 Value for r 0 0 0 Value for f 0 0 0 Procedure: Follow this procedure to verify the PICC influence on the operating field under VS,OV,INFL value of field intensity. 1. Set-up the field transmitted by the EMV – TEST PCD with the procedure defined in section 8.3.2 of [EMV CL PICC ANA TC] with the value of field intensity VS,OV,INFL as defined in Table B.1 of Appendix B of [EMV CL PICC ANA TC]. 2. Set the Acquisition Device to capture between 10 μs and 200 µs of signal. 3. Optimize the Acquisition Device settings for accurate measurements of level. 4. Measure VSENSE,FREE AIR peak to peak voltage at output J4 of the EMV – TEST CMR. 5. Place the PICC under test in position first position defined in Table 3-1. 6. Measure VSENSE,PICC peak to peak voltage at output J4 of the EMV – TEST CMR. 7. Configure the EMV – TEST PICC 2 with the non-linear Load (NLZ) 8. Place the EMV – TEST PICC 2 in first position defined in Table 3-1 9. Measure VSENSE,TESTPICC2 peak to peak voltage at output J4 of the EMV – TEST CMR. 10. Calculate using the EMV – TEST CMR gain measured in Chapter 6 of [EMV CL PICC ANA TC]: ∆VSENSE,PICC = VSENSE,FREE AIR - VSENSE,PICC ∆VSENSE,TESTPICC2 = VSENSE,FREE AIR - VSENSE,TESTPICC2 ∆VSENSER =ΔVSENSE,PICC / ΔVSENSE,TESTPICC2 11. Repeat steps 5 to 10 for all positions defined in Table 3-1 /29 Acceptance Criteria: When placed in the Operating Volume of the EMV – TEST PCD, ∆VSENSER shall be equal or less to 1. Note: CAB111 Test Case shall be performed only once either in Type A or in Type B.

3.4 Performance Pre-Verification Test Cases The Performance Pre-Verification Test Cases CA151 and CB151 shall not be performed.

3.5 Analogue timing When a mobile product contains several EE that shall be tested, [EMV ADMIN] can indicate that an EE shall be tested for analogue timing only. In that case, the laboratory shall perform the following Test Cases:

  • CA144.200
  • CB145.200 These test cases shall be performed in the same conditions as the other analogue tests (i.e. as described in this document). When these tests are performed immediately after the test of another EE of the same mobile product), the laboratory may perform these tests with the same setup as with the other EE tested (i.e. the laboratory does not have to re-do the setup of the test bench). 4 Digital guidelines /29 The following digital guidelines are applicable for the test of mobile products. All PICC Digital Test Cases shall be performed according to [EMV CL PICC DIG TC]. The following modifications shall be applied to the test plan. Note that EMVCo expects no impact from the Load Modulation type on digital results so that laboratories may use ALM or PLM for digital testing.

4.1 Digital configurations to be tested When a mobile product with a single EE is submitted for testing, the Digital configurations described in section 4.1.1 and 4.1.2, shall be used to perform the testing, depending on the EEUT. When a mobile product with several EE is submitted for testing:

  • For the EE with the most Digital configurations, the Digital configurations described in section 4.1.1 and 4.1.2 shall be used to perform digital testing Note 1: If the UICC can have an impact on the Digital configurations of the Mobile product (see ICS), then it shall be considered as the EE with the most Digital configurations. Note 2: If the UICC cannot have an impact on the Digital configurations of the Mobile product, (see ICS), and an EE does not “support only specific configurations” (see ICS), this EE shall be considered as the EE with the most Digital configurations (e.g. if UICC does not “support only specific protocol configurations” (see ICS) it shall be considered as having the most Digital configurations). Note 3: If several EE have the most Digital configurations, then the laboratory shall consider that the EE with the most Digital configurations is in order of preference: the UICC slot 1, UICC slot 2, the eSE, the eUICC and HCE.
  • For the other EE:
  • Refer to section 4.1.3 to determine the Digital configurations that shall be used to perform complete digital test sessions Example: For a mobile product that:
  • supports UICC, eSE and HCE,
  • with UICC that has an impact on Digital configuration,
  • with eSE that does not “support specific protocol configurations” (see ICS) and that has an impact on Digital configuration and
  • with HCE that supports only 1 specific protocol configuration (see ICS). The laboratory shall perform:
  • Complete digital test sessions with profile A1, A2, A3, A4, B1, B2 and AB in the UICC
  • Complete digital test sessions with profile AB in the eSE
  • Complete digital test session with the specific protocol configuration of HCE /29 4.1.1 When the EEUT is a UICC 4.1.1.1 UICCs to use during digital testing with UICC as EE with the most Digital configurations When testing a mobile product with UICC as the EEUT, the laboratory shall perform complete Test Sessions with the Mobile Product and the UICCs with the Test Profiles as indicated in Table 4-1 — UICCs for Digital Testing with UICC. Table 4-1 — UICCs for Digital Testing with UICC Mobile Product SWP-UICC to be used A1 A2 A3 A4 B1 B2 AB X X X X X X X Note: Note: Note: Some Mobile Products may display a message “No SIM inserted”. The laboratory may ignore this message if it does not prevent the execution of the tests. The Mobile Product may not behave as requested by the UICC e.g. it is possible that a Mobile Product uses FWI=4 when the UICC requests FWI=0. If SWP-UICCs do not have impact on the Digital configuration (see ICS), the Mobile product shall still be tested with all the SWP-UICCs as defined in Table 4-1 — UICCs for Digital Testing with UICC. In case the Mobile Product does not answer to any WUPA and WUPB with a UICC, it shall be clearly reported the test report (table “Test Profiles/specific protocol configurations and RF parameters for EE with the most digital configurations”), but the laboratory shall not perform a digital test session with such a UICC.

4.1.1.2 Digital Configurations to use during digital testing with UICC as EE with the most Digital configurations When testing a mobile product with UICC as the EEUT, the laboratory shall perform complete Test Sessions with the following digital configurations for the product: Table 4-2 — Digital configurations for Digital Testing with UICC. Mobile Product A1 A2 A3 A4 B1 B2 AB UICC can have impact on Digital configuration Digital configuration as set by the UICC UICC cannot have impact X X X X X X X on Digital configuration and the mobile product does not “support only specific protocol configurations” (see ICS) UICC cannot have impact on Digital configuration and the mobile product supports only specific protocol configurations (see ICS) Use specific protocol configurations described in ICS

/29 4.1.2 When the EEUT is not a UICC When testing a mobile product with a EEUT that is not a UICC, the laboratory shall perform complete Test Sessions with the following digital configurations. Table 4-3 — Digital configurations for Digital Testing with EEUT that is not a UICC Mobile Product A1 A2 A3 A4 B1 B2 AB The mobile It supports X X X X X X X product does not EMV Type A “support only and Type B. specific protocol It supports X X X X configurations” only EMV (see ICS) Type A. It supports only EMV Type B. X X The mobile product “supports only specific protocol configurations” (see ICS) Use specific configurations described in ICS 4.1.3 Regression Digital Testing For Regression Digital Testing i.e. for the testing of a Mobile Product that is a derivative or a change from another Mobile Product or a Test on a EE that is not the EE with Most Digital configurations:

  • If the Mobile Product with the EEUT does not “support only specific protocol configurations” (see ICS), supports Type A and Type B, dynamic UID and random PUPI, then the laboratory shall perform a Complete Digital Test Session with the Test Profile AB.
  • Otherwise, the laboratory shall perform Complete Digital Test Sessions with any Type A configuration and any Type B configuration if supported by the mobile product (the laboratory can perform 1 Digital Test Session with a Type AB configuration).

4.2 DUT actual digital configuration and test tool configuration For each Digital configuration to be tested, the laboratory shall determine the actual digital configuration of the DUT (i.e. technologies and the Digital parameters) and report them in the Test Report. The laboratory shall configure the test tool based on the actual digital configuration of the DUT. The table hereunder indicates how the laboratory can retrieve the actual digital configuration. Table 4-4 — DUT actual digital configuration and test tool configuration Parameter Value Hint

/29 Type A support. ATQA value...UID size. UID value (random/or value if fixed). Last SAK value. ATS value...FSCI...Supported bit rates...SFGI...FWI...NAD support...CID support...Historical bytes Can PICC send MiFare NAK Type B support. ATQB (not extended)...PUPI value (random/or value if fixed)...Application Data...Supported bit rates...FSCI Yes/No xx xxh Single/double/triple “random” or xx xx xx xxh or xx xx xx xx xx xx xxh or xx xx xx xx xx xx xx xx xx xxh xxh xx xx xx xx xx …h xh xxh xh xh xb xb “empty” or xx … xxh Yes/No xx xx xx xx xx xx xx xx xx xx xx xxh “random” or xx xx xx xxh xx xx xx xxh xxh xh Perform CA001 and see if the mobile answers to the WUPA Perform CA001 and report the ATQA value ATQA, Byte 1, bits b7-b8:

  • 00b means single
  • 01b means double
  • 10b means triple Depending on UID size perform CA001, CA002 or CA003 to get UID value For CA001, check UID before and after the reset to determine if it is random or fixed. Depending on UID size perform CA001, CA002 or CA003 to get last SAK Depending on UID size perform CA001, CA002 or CA003 to get last SAK ATS, Byte 2 (T0), bits b1-b4 ATS, Byte 3 (TA(1)) ATS, Byte 4 (TB(1)), bits b1-b4 ATS, Byte 4 (TB(1)), bits b5-b8 ATS, Byte 5 (TC(1)), bit b1 ATS, Byte 5 (TC(1)), bit b2 ATS, after Byte 5 Depending on UID size perform CA216, CA217 or CA218 to determine if mobile supports MIFare NAK Perform CB001 and see if the mobile answers to the WUPB Perform CB001 and report the ATQB value ATQB, Byte 2-5 For CB001, check PUPI in ATQB before and after the reset to determine if it is random or fixed. ATQB, Byte 6-9 ATQB, Byte 10 (PI Byte 1) ATQB, Byte 11 (PI Byte 2), bits b5-b8 /29...FWI xh ATQB, Byte 12 (PI Byte 3), bits b5-b8...NAD support xb ATQB, Byte 12 (PI Byte 3), bits b1...CID support xb ATQB, Byte 12 (PI Byte 3), bits b2...Ext ATQB support (when performing CB015) Yes/No Perform CB015 and check ATQB length SFGI value xxh In CB015, ATQB, byte 13 (PI Byte 4), bits b5-b8 Note that in case of reference to the ICS in [EMV CL PICC DIG TC], the laboratory shall check either the “Test Profiles/specific protocol configurations and Digital parameters“ (e.g. for UIC size, support of MiFare NAK etc.) or [Mobile L1 TRT] (e.g. for legacy behaviours).

4.3 Test Cases to be performed 4.3.1 EEUT tested with EMV test profiles or test UICCs This section is dedicated to digital test sessions where the EEUT is:

  • a UICC that has impact on the Digital configuration of the mobile product (see ICS) or
  • an EE (UICC, eSE, eUICC or HCE) that “does not support only Specific Protocol Configurations” (see ICS). For each EEUT:
  • For Type A only Digital configurations to be tested:
  • If the mobile answers to Type A commands, then do all Type A test cases
  • If the mobile answers to Type B commands, then do CB001
  • For Type B only Digital configurations to be tested:
  • If the mobile answers to Type A commands, then do CA001, CA002 or CA003, depending on the UID size
  • If the mobile answers to Type B commands, then do all Type B test cases
  • For Type AB Digital configurations to be tested:
  • If the mobile answers to Type A commands, then do all Type A test cases
  • If the mobile answers to Type B commands, then do all Type B test cases Note 1: The test CC001 shall systematically be performed for all Digital configurations. Note 2: All Type A test cases means all CAxxx test cases (depending on UID size) and all CCxxx test cases in Type A Note 3: All Type B test cases means all CBxxx test cases and all CCxxx test cases in Type B /29 4.3.2 EEUT test with specific protocol configurations This section is dedicated to digital test sessions where the EEUT supports only specific protocol configurations.
  • If the DUT answers to Type A commands, all Type A Test Cases shall be performed, depending on the UID size of the DUT
  • If the DUT answers to Type B commands, all Type B Test Cases shall be performed /29 Annex A APDUs for Mobile L1 Type Approval This annex describes the APDUs that shall be exchanged in each EMV CL PICC Analogue and Digital Test Case during Mobile Product L1 Type Approval. These APDUs are based on the application in line with [EMV Applet Reqs]. A.1 L2 Scenarios for Mobile Product Testing Test Case CA001/CA002/CA003 CA010/CA011/CA012 CA116/CA117/CA118 CA120/CA121/CA122 CA126/CA127/CA128 CA130/CA131/CA132 CA204 CA206 CA207 CA208 CA216 CA217 CA218 CA226/CA227/CA228 CA230/CA231/CA232 CA233 CB001 CB010 CB015 CB021 CB025 CB116 CB126 CB130 Scenario to be used “Scenario 1: Complete combined testing” “Scenario 1: Complete combined testing” No APDUs “Scenario 1: Complete combined testing” until step 2 “Scenario 1: Complete combined testing” until step 2 “Scenario 1: Complete combined testing” until step 2 for x=3 No APDUs for x=0 to 2 and 4 to 5 No APDUs No APDUs No APDUs No APDUs No APDUs No APDUs No APDUs “Scenario 1: Complete combined testing” until step 2 “Scenario 1: Complete combined testing” until step 2 No APDUs “Scenario 1: Complete combined testing” “Scenario 1: Complete combined testing” “Scenario 1: Complete combined testing” until step 2 “Scenario 1: Complete combined testing” “Scenario 1: Complete combined testing” No APDUs “Scenario 1: Complete combined testing” until step 2 “Scenario 1: Complete combined testing” until step 2 for x=1 /29 No APDUs for x=0 CB150 “Scenario 1: Complete combined testing” until step 2 CB155 “Scenario 1: Complete combined testing” until step 2 CB204 “Scenario 1: Complete combined testing” until step 2 CB206 No APDUs CB226 No APDUs CB227 “Scenario 1: Complete combined testing” until step 2 CB228 No APDUs CB233 No APDUs CC001 No APDUs CC101 “Scenario 1: Complete combined testing” until step 4 CC102 “Scenario 1: Complete combined testing” until step 4 CC110 “Scenario 2: APDUs for CC110” CC120 “Scenario 1: Complete combined testing” CC203 “Scenario 1: Complete combined testing” CC206 “Scenario 1: Complete combined testing” until step 10 CC207 “Scenario 1: Complete combined testing” CC210 “Scenario 3: APDUs for CC210” CC233 “Scenario 1: Complete combined testing” until step 2 CC241 “Scenario 1: Complete combined testing” until step 4 CC245 “Scenario 1: Complete combined testing” until step 2 The table below indicates what L2 Scenarios shall be used for each TC. The scenarios are defined in “A.2 Definition of the L2 Scenarios”. A.2 Definition of the L2 Scenarios This section presents several L2 scenarios based on the EMVCo Mobile Test applet described and instantiated as in [EMV Applet Reqs]. A.2.1 Scenario 1: Complete combined testing In this scenario, the LT sends:
  • APDUs that do not systematically imply chaining, and that imply (WTX)
  • APDUs that imply chaining (size>253), and that imply (WTX)
  • APDUs that do not systematically imply chaining, and that do not systematically imply Waiting Time eXtensions (WTX)
  • APDUs that imply chaining (size>253), and that do not systematically imply (WTX) Step CUT  Commands SELECT App Command APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 Comments Select PPSE (Test applet) /29 CUT ➔ CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ SELECT App Response SELECT App Command SELECT App Response GPO Command GPO Response INS 4 Command INS 4 Response GPO Command GPO Response READ RECORD Command READ RECORD Response 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 80 (CLA) + A8 (INS) + 00 (P1) + 00 (P2) + 04 (Lc) + FF FE 00 64 + 00h (Le) 77 16 82 02 5B 80 94 10 08 01 01 00 10 01 01 01 18 01 02 00 20 01 02 00 + 9000h (SW) 00 (CLA) + 04 (INS) + 04 (P1) + 00 (P2) + FE (Lc) + 01 02 … FE + 00h (Le) FF FE … 02 01 + 9000h (SW) 80 (CLA) + A8 (INS) + 00 (P1) + 00 (P2) + 04 (Lc) + FF FE 00 00 + 00h (Le) 77 16 82 02 5B 80 94 10 08 01 01 00 10 01 01 01 18 01 02 00 20 01 02 00 + 9000h (SW) 00 (CLA) + B2 (INS) + 01 (P1) + 0C (P2) + absent (Lc) + absent + 00h (Le) 01 02 + 9000h (SW) Select AID (Test applet) All following responses will be sent with additional processing time (64h=100) short APDU from PICC sent after WTX long APDU to PICC (chaining) long APDU from PICC (chaining) sent after WTX All following responses will be sent with no additional processing time short APDU from PICC short APDU to PICC Record 01 of SFI 01 short APDU from PICC CUT  CUT ➔ INS 4 Command INS 4 Response 00 (CLA) + 04 (INS) + 00 (P1) + 00 (P2) + FE (Lc) + 01 02 … FE + 00h (Le) FF FE … 02 01 + 9000h (SW) /29 long APDU to PICC (chaining) long APDU from PICC (chaining) A.2.2 Scenario 2: APDUs for CC110 In this section, several scenarios are presented as for each subcase of CC110, a different set of APDUs shall be used. In these scenarios, the LT sends:
  • APDUs that imply that the LT will send 1 chained I-Block and 1 I-Block with a size equal to Max_Frame_Size (indicating chaining or not), and that do not systematically imply Waiting Time eXtensions (WTX)
  • APDUs that imply that the LT will send 1 chained I-Block and 1 I-Block with a size equal to Max_Frame_Size (indicating chaining or not), and that systematically imply Waiting Time eXtensions (WTX) A.2.2.1 For CC110.0 (Max_Frame_Size=32B) Step CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 17 (Lc) + 00 01 … 15 16 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) A.2.2.2 For CC110.1 (Max_Frame_Size=40B) Step CUT  Commands SELECT App Command APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) Comments Select PPSE (Test applet) /29 CUT ➔ CUT  CUT ➔ CUT  CUT ➔ SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 1F (Lc) + 00 01 … 1E + 00h (Le) 9000h (SW) A.2.2.3 For CC110.2 (Max_Frame_Size=48B) Step CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 27 (Lc) + 00 01 … 26 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) A.2.2.4 For CC110.3 (Max_Frame_Size=64B) Step CUT  Commands SELECT App Command CUT ➔ SELECT App Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 Comments Select PPSE (Test applet) /29 CUT  CUT ➔ CUT  CUT ➔ INS 3 Command INS 3 Response INS 3 Command INS 3 Response 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 37 (Lc) + 00 01 … 35 36 + 00h (Le) 9000h (SW) A.2.2.5 For CC110.4 (Max_Frame_Size=96B) Step CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 57 (Lc) + 00 01… 55 56 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) A.2.2.6 For CC110.5 (Max_Frame_Size=128B) Step CUT  Commands SELECT App Command CUT ➔ SELECT App Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) Comments Select PPSE (Test applet) /29 CUT  CUT ➔ CUT  CUT ➔ INS 3 Command INS 3 Response INS 3 Command INS 3 Response 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 77 (Lc) + 00 01 … 75 76 + 00h (Le) 9000h (SW) A.2.2.7 For CC110.6 (Max_Frame_Size=256B) (Max_Frame_Size≥512B) Step CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + F7 (Lc) + 00 01 … F5 F6 + 00h (Le) 9000h (SW) and CC110.7 Comments Select PPSE (Test applet) A.2.3 Scenario 3: APDUs for CC210 In this section, several scenarios are presented as for each subcase of CC210, a different set of APDUs shall be used. In these scenarios, the LT sends APDUs that are similar to the APDUs in the TC CC210, but with commands that are defined in the Test applet instead of the Loop-Back Command. A.2.3.1 For CC210.0x (Max_Frame_Size=32B) Step CUT  Commands SELECT App Command APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) Comments Select PPSE (Test applet) /29 CUT ➔ CUT  CUT ➔ SELECT App Response INS 3 Command INS 3 Response 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 56 (Lc) + 00 01 02 … 54 55 + 00h (Le) 9000h (SW) long APDU to PICC (chaining) A.2.3.2 For CC210.1x (Max_Frame_Size=40B) Step CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 6E (Lc) + 00 01 02 … 6C 6D + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) long APDU to PICC (chaining) A.2.3.3 For CC210.2x (Max_Frame_Size=48B) Step CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 86 (Lc) + 00 01 02 … 84 85 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) long APDU to PICC (chaining) /29 A.2.3.4 For CC210.3x (Max_Frame_Size=64B) Step CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + B6 (Lc) + 00 01 02 … B4 B5 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) long APDU to PICC (chaining) A.2.3.5 For CC210.4x (Max_Frame_Size=96B) Step CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 02 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 02 … F8 F9 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) long APDU to PICC (chaining) long APDU to PICC (chaining) A.2.3.6 For CC210.5x (Max_Frame_Size=128B) Step CUT  Commands SELECT App Command APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) Comments Select PPSE (Test applet) /29 CUT ➔ CUT  CUT ➔ CUT  CUT ➔ SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 02 … F8 F9 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 02 … F8 F9 + 00h (Le) 9000h (SW) long APDU to PICC (chaining) long APDU to PICC (chaining) A.2.3.7 For CC210.6x (Max_Frame_Size≥256B) Step CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ CUT  CUT ➔ Commands SELECT App Command SELECT App Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response INS 3 Command INS 3 Response APDU 00 (CLA) + A4 (INS) + 04 (P1) + 00 (P2) + 0E (Lc) + 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 (2PAY.SYS.DDF01) + 00h (Le) 6F 3A 84 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 A5 28 BF 0C 25 61 23 4F 0E 32 50 41 59 2E 53 59 53 2E 44 44 46 30 31 87 01 01 9F 12 0D 54 41 31 2E 30 31 2E 50 50 31 2E 30 30 + 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 02 … F8 F9 + 00h (Le) 9000 (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + 04 (Lc) + 00 01 02 03 + 00h (Le) 9000h (SW) 00 (CLA) + EE (INS) + 00 (P1) + 00 (P2) + FA (Lc) + 00 01 02 … F8 F9 + 00h (Le) 9000h (SW) Comments Select PPSE (Test applet) long APDU to PICC (chaining) long APDU to PICC (chaining) long APDU to PICC (chaining) /29 Annex B Mobile Level 1 Digital Acceptance Criteria This annex contains additional Acceptance Criteria that shall be implemented by the PICC Digital Test Tool when testing Mobile L1 Products. The verdict of each TC shall take into account these Acceptance Criteria when testing a Mobile Product. B.1 CA001, CA002, CA003 or CB001 The Laboratory shall check that there is at least a WTX exchange during the test. In case of FAIL to CA001, CA002, CA003 or CB001 because the mobile product does not send any WTX exchange, the laboratory shall clearly indicate as a rationale for the FAIL: “FAIL because the test applet is not correctly implemented (no WTX extension), vendor to correct the test applet”. The Laboratory shall check that there is at least a WTX exchange during the test. /29 *** END OF DOCUMENT *** © 2013-2025 EMVCo, LLC. All rights reserved. Reproduction, distribution and other use of this document is permitted only pursuant to the applicable agreement between the user and EMVCo found at www.emvco.com. EMV® is a registered trademark or trademark of EMVCo, LLC in the United States and other countries.